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Stuck-at fault
Known as:
SSL
, Single stuck line
A stuck-at fault is a particular fault model used by fault simulators and automatic test pattern generation (ATPG) tools to mimic a manufacturing…
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Related topics
Related topics
10 relations
CMOS
Fault coverage
Fault model
Iddq testing
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Broader (2)
Digital electronics
Electronic design automation
Papers overview
Semantic Scholar uses AI to extract papers important to this topic.
2001
2001
Fault tolerance in systems design in VLSI using data compression under constraints of failure probabilities
Sunil R. Das
,
C. Ramamoorthy
,
M. Assaf
,
E. Petriu
,
W. Jone
IEEE Transactions on Instrumentation and…
2001
Corpus ID: 16215822
The design of space-efficient support hardware for built-in self-testing (BIST) is of critical importance in the design and…
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Highly Cited
1999
Highly Cited
1999
Low Power BIST by Filtering Non-Detecting Vectors
S. Manich
,
A. Gabarró
,
+7 authors
Marcelino B. Santos
European Test Workshop (Cat. No.PR00390)
1999
Corpus ID: 17848007
In this paper, two techniques to reduce the energy and the average power consumption of the system are proposed. They are based…
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1998
1998
Locating bridging faults using dynamically computed stuck-at fault dictionaries
Yiming Gong
,
S. Chakravarty
IEEE Trans. Comput. Aided Des. Integr. Circuits…
1998
Corpus ID: 40438554
Novel algorithms for locating bridging faults, based on the voting and wired models, in combinational circuits are presented. The…
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1998
1998
Stuck-at fault: a fault model for the next millennium
J. Patel
Proceedings International Test Conference (IEEE…
1998
Corpus ID: 37997195
One of the common misconceptions about a stuck-at fault model is that it does not model a physical defect accurately and…
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1992
1992
Improved techniques for multiple stuck-at fault analysis using single stuck-at fault test sets
P. Camurati
,
P. Prinetto
,
M. Rebaudengo
,
M. Reorda
[Proceedings] IEEE International Symposium on…
1992
Corpus ID: 58990256
Previous studies have suggested that many multiple stuck-at faults are detected by the test patterns generated to detect single…
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1992
1992
ScanBist A Multi-frequency Scan-Based BIST Method
B. Nadeau-Dostie
,
D. Burek
,
A. Hassan
Proceedings International Test Conference
1992
Corpus ID: 13061949
This paper presents a BIST technique that allows the synchronization of multiple scan chains clocked at different frequencies…
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Highly Cited
1988
Highly Cited
1988
Detecting bridging faults with stuck-at test sets
S. Millman
,
E. McCluskey
International Test Conference Proceeding@m_New…
1988
Corpus ID: 27506929
A method is described that provides high detection of bridging faults without requiring extensive fault simulation. Bridging…
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1984
1984
Spectral Fault Signatures for Single Stuck-At Faults in Combinational Networks
D. M. Miller
,
J. Muzio
IEEE transactions on computers
1984
Corpus ID: 9399941
A method is described for the derivation of fault signatures for the detection of stuck-at faults in single-output combinational…
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1984
1984
An Analysis of the Multiple Fault Detection Capabilities of Single Stuck-at Fault Test Sets
J. L. A. Hughes
,
E. McCluskey
International Test Conference
1984
Corpus ID: 3134869
Multiple fault detection using single stuck-at fault test sets is considered. The 74LS181 4-bit ALU is analyzed using 10 test…
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1980
1980
Undetectability of Bridging Faults and Validity of Stuck-At Fault Test Sets
K. Kodandapani
,
D. Pradhan
IEEE transactions on computers
1980
Corpus ID: 34818
The study of bridging faults (or short circuits that occur between conducting paths) has become increasingly important with the…
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