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Fault model

Known as: Fault models 
A fault model is an engineering model of something that could go wrong in the construction or operation of a piece of equipment. From the model, the… 
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Related topics

Related topics

5 relations
Bridging faultFault coverageStuck-at faultTransistor fault

Broader (1)

Digital electronics

Papers overview

Semantic Scholar uses AI to extract papers important to this topic.
2012
2012
Differential fault analysis on block cipher SEED
Review
2010
Review
2010
Design Automation and Test Solutions for Digital Microfluidic Biochips
Microfluidics-based biochips are revolutionizing high-throughput sequencing, parallel immunoassays, blood chemistry for clinical… 
2009
2009
A Fast and Flexible Platform for Fault Injection and Evaluation in Verilog-Based Simulations
This paper presents a complete framework for Verilog-based fault injection and evaluation. In contrast to existing approaches… 
2007
2007
Symbolic Model Based Testing for Component Oriented Systems
In a component oriented approach, components are designed, developed and validated in order to be widely used. However one cannot… 
Highly Cited
2006
Highly Cited
2006
Hidden Markov Models as a Support for Diagnosis: Formalization of the Problem and Synthesis of the Solution
In modern information infrastructures, diagnosis must be able to assess the status or the extent of the damage of individual… 
Highly Cited
2004
Highly Cited
2004
Towards the Systematic Testing of Aspect-Oriented Programs
The instant invention relates to the production of composite glass articles involving the bringing together of two or more… 
Highly Cited
1999
Highly Cited
1999
Low Power BIST by Filtering Non-Detecting Vectors
In this paper, two techniques to reduce the energy and the average power consumption of the system are proposed. They are based… 
1997
1997
Test generation for comprehensive testing of linear analog circuits using transient response sampling
The problem of testing analog components continues to be the bottleneck in reducing the time-to-market of mixed-signal ICs. We… 
1992
1992
Test Suite Generation from a FSM with a Given Type of Implementation Errors
Highly Cited
1984
Highly Cited
1984
Design and Application of Self-Testing Comparators Implemented with MOS PLA's
A high probability of detecting errors caused by hardware faults is an essential property of any fault-tolerant system. VLSI… 
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