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Fault model

Known as: Fault models 
A fault model is an engineering model of something that could go wrong in the construction or operation of a piece of equipment. From the model, the… 
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Related topics

Related topics

5 relations
Bridging faultFault coverageStuck-at faultTransistor fault

Broader (1)

Digital electronics

Papers overview

Semantic Scholar uses AI to extract papers important to this topic.
2014
2014
Wireless channel loss analysis - a case study using WiFi-Direct
WiFi-Direct, a Wi-Fi standard, enables devices to connect easily with each other without requiring a wireless access point and… 
2013
2013
A Comparison of Mutation Analysis Tools for Java
Mutation analysis allows software developers to evaluate the quality of a test suite. The quality is measured as the ability of… 
2013
2013
On the Functional Test of the Register Forwarding and Pipeline Interlocking Unit in Pipelined Processors
When the result of a previous instruction is needed in the pipeline before it is available, a “data hazard” occurs. Register… 
2010
2010
Verified Firewall Policy Transformations for Test Case Generation
We present an optimization technique for model-based generation of test cases for firewalls. Starting from a formal model for… 
Highly Cited
1999
Highly Cited
1999
Low Power BIST by Filtering Non-Detecting Vectors
In this paper, two techniques to reduce the energy and the average power consumption of the system are proposed. They are based… 
1998
1998
Logic Testing of Bridging Faults in CMOS Integrated Circuits
We describe a system for simulating and generating accurate tests for bridging faults in CMOS ICs. After introducing the… 
1997
1997
Test generation for comprehensive testing of linear analog circuits using transient response sampling
The problem of testing analog components continues to be the bottleneck in reducing the time-to-market of mixed-signal ICs. We… 
1993
1993
The Case for No-Fault Medical Liability
1992
1992
Test Suite Generation from a FSM with a Given Type of Implementation Errors
Highly Cited
1984
Highly Cited
1984
Design and Application of Self-Testing Comparators Implemented with MOS PLA's
A high probability of detecting errors caused by hardware faults is an essential property of any fault-tolerant system. VLSI… 
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