Skip to search formSkip to main contentSkip to account menu

Fault model

Known as: Fault models 
A fault model is an engineering model of something that could go wrong in the construction or operation of a piece of equipment. From the model, the… 
Wikipedia (opens in a new tab)

Related topics

Related topics

5 relations
Bridging faultFault coverageStuck-at faultTransistor fault

Broader (1)

Digital electronics

Papers overview

Semantic Scholar uses AI to extract papers important to this topic.
2010
2010
Verified Firewall Policy Transformations for Test Case Generation
We present an optimization technique for model-based generation of test cases for firewalls. Starting from a formal model for… 
2007
2007
Symbolic Model Based Testing for Component Oriented Systems
In a component oriented approach, components are designed, developed and validated in order to be widely used. However one cannot… 
2007
2007
Low-Density Parity Check Codes for Error Correction in Nanoscale Memory
The continued scaling of photolithographic fabrication techniques down to 32 nanometers and beyond faces enormous technology and… 
Highly Cited
1999
Highly Cited
1999
Low Power BIST by Filtering Non-Detecting Vectors
In this paper, two techniques to reduce the energy and the average power consumption of the system are proposed. They are based… 
1997
1997
Test generation for comprehensive testing of linear analog circuits using transient response sampling
The problem of testing analog components continues to be the bottleneck in reducing the time-to-market of mixed-signal ICs. We… 
Highly Cited
1995
Highly Cited
1995
Self-timed is self-checking
Self-checking circuits detect (at least some of) their own faults. We describe self-timed circuits, including combinational logic… 
1993
1993
The Case for No-Fault Medical Liability
1992
1992
Test Suite Generation from a FSM with a Given Type of Implementation Errors
1988
1988
Testing of Random Access Memories: Theory and Prac-tice
The invention relates to a process for optically brightening polyacrylonitrile fibres, which have been manufactured by the wet… 
Highly Cited
1984
Highly Cited
1984
Design and Application of Self-Testing Comparators Implemented with MOS PLA's
A high probability of detecting errors caused by hardware faults is an essential property of any fault-tolerant system. VLSI… 
By clicking accept or continuing to use the site, you agree to the terms outlined in our Privacy Policy (opens in a new tab), Terms of Service (opens in a new tab), and Dataset License (opens in a new tab)