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Fault coverage

Known as: Test coverage, Test quality 
Fault coverage refers to the percentage of some type of fault that can be detected during the test of any engineered system. High fault coverage is… 
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Related topics

Related topics

13 relations
Byzantine fault toleranceCode coverageDebuggerDigital electronics

Broader (1)

Electronic engineering

Papers overview

Semantic Scholar uses AI to extract papers important to this topic.
Highly Cited
2012
Highly Cited
2012
Eine Werkzeuginfrastruktur zur agilen Entwicklung mit der UML-P
  • M. Schindler
  • Aachener Informatik-Berichte, Software…
  • 2012
  • Corpus ID: 36616059
One of the most promising approaches for handling the increasing complexity of software development projects is the abstraction… 
Highly Cited
2012
Highly Cited
2012
Testing concurrent programs to achieve high synchronization coverage
The effectiveness of software testing is often assessed by measuring coverage of some aspect of the software, such as its code… 
Highly Cited
2006
Highly Cited
2006
A framework and tool supports for generating test inputs of AspectJ programs
Aspect-oriented software development is gaining popularity with the wider adoption of languages such as AspectJ. To reduce the… 
Highly Cited
2002
Highly Cited
2002
An efficient test relaxation technique for combinational & full-scan sequential circuits
Reducing test data size is one of the major challenges in testing systems-on-a-chip. This problem can be solved by test… 
Highly Cited
1999
Highly Cited
1999
Low Power BIST by Filtering Non-Detecting Vectors
In this paper, two techniques to reduce the energy and the average power consumption of the system are proposed. They are based… 
Highly Cited
1999
Highly Cited
1999
An histogram based procedure for current testing of active defects
  • C. Thibeault
  • International Test Conference . Proceedings (IEEE…
  • 1999
  • Corpus ID: 7974819
The purpose of this paper is to propose a new histogram-based differential current testing procedure of active defects. This… 
Highly Cited
1995
Highly Cited
1995
Finding defects with fault models
A process is presented to validate fault models used in fault diagnosis. Known defects are inserted, using a focused ion beam… 
Highly Cited
1993
Highly Cited
1993
Delay Fault Coverage and Performance Tradeoffs
The main disadvantage of the path delay fault model is that to achieve 100% testability every path must be tested. Since the… 
1992
1992
A small test generator for large designs
We report an automatic test pattern generator that can handle designs with one million gates or more on medium size workstations… 
Highly Cited
1992
Highly Cited
1992
ALLIANCE: A complete Set of CAD Tools for teaching VLSI Design
a timing analyzer, an interactive generator debugger, full-custom generators, and a test coverage tool. Ongoing researches are… 
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