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Fault coverage
Known as:
Test coverage
, Test quality
Fault coverage refers to the percentage of some type of fault that can be detected during the test of any engineered system. High fault coverage is…
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Related topics
Related topics
13 relations
Byzantine fault tolerance
Code coverage
Debugger
Digital electronics
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Broader (1)
Electronic engineering
Papers overview
Semantic Scholar uses AI to extract papers important to this topic.
Highly Cited
2012
Highly Cited
2012
Eine Werkzeuginfrastruktur zur agilen Entwicklung mit der UML-P
M. Schindler
Aachener Informatik-Berichte, Software…
2012
Corpus ID: 36616059
One of the most promising approaches for handling the increasing complexity of software development projects is the abstraction…
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2010
2010
A Dependence Representation for Coverage Testing of Object-Oriented Programs
E. S. F. Najumudheen
,
R. Mall
,
D. Samanta
Journal of Object Technology
2010
Corpus ID: 15577661
We propose a dependence-based representation for object-or- iented programs, named Call-based Object-Oriented System Dependence…
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2008
2008
Online Network-on-Chip Switch Fault Detection and Diagnosis Using Functional Switch Faults
Naghmeh Karimi
,
Armin Alaghi
,
Mahshid Sedghi
,
Z. Navabi
Journal of universal computer science (Online)
2008
Corpus ID: 16102566
This paper presents efficient methods for online fault detection and diagnosis of Network-on-Chip (NoC) switches. The fault model…
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2005
2005
Experiences in coverage testing of a Java middleware
M. Kessis
,
Y. Ledru
,
G. Vandome
Joint Conference on Lexical and Computational…
2005
Corpus ID: 8514981
This paper addresses the issues of test coverage analysis of J2EE [22] servers. These middleware are nowadays at the core of the…
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2004
2004
Mems built-in-self-test using MLS
A. Dhayni
,
S. Mir
,
L. Rufer
Proceedings. Ninth IEEE European Test Symposium…
2004
Corpus ID: 2065267
This paper presents a Built-In-Self-Test (BIST) implementation of pseudo-random testing for Micro Electro-Mechanical Systems…
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2003
2003
Care bit density and test cube clusters: multi-level compression opportunities
Bernd Könemann
Proceedings 21st International Conference on…
2003
Corpus ID: 17000628
Most of the recently discussed and commercially introduced test stimulus data compression techniques are based on low care bit…
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1996
1996
Automatic Test Generation for EFSM-based Systems
Chourouk Bourhfir
,
R. Dssouli
,
E. Aboulhamid
1996
Corpus ID: 18153773
The present work addresses the problem of conformance testing for EFSM-based systems and especially, the problem of automatically…
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1992
1992
A small test generator for large designs
S. Kundu
,
L. Huisman
,
I. Nair
,
V. Ivenaar
,
L. Reddy
Proceedings International Test Conference
1992
Corpus ID: 10390999
We report an automatic test pattern generator that can handle designs with one million gates or more on medium size workstations…
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1992
1992
ScanBist A Multi-frequency Scan-Based BIST Method
B. Nadeau-Dostie
,
D. Burek
,
A. Hassan
Proceedings International Test Conference
1992
Corpus ID: 13061949
This paper presents a BIST technique that allows the synchronization of multiple scan chains clocked at different frequencies…
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1988
1988
An experience in estimating fault coverage of a protocol test
A. Dahbura
,
Krishan K. Sabnani
IEEE INFOCOM '88,Seventh Annual Joint Conference…
1988
Corpus ID: 61723399
A description is given of an experience in estimating fault coverage of a test sequence designed to test the control portion of a…
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