Fault coverage

Known as: Test coverage, Test quality 
Fault coverage refers to the percentage of some type of fault that can be detected during the test of any engineered system. High fault coverage is… (More)
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Highly Cited
2005
Highly Cited
2005
To improve performance and reduce power, processor designers employ advances that shrink feature sizes, lower voltage levels… (More)
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Highly Cited
2002
Highly Cited
2002
“Software test-coverage measures” quantify the degree of thoroughness of testing. Tools are now available that measure test… (More)
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Highly Cited
2001
Highly Cited
2001
Delay fault test application via enhanced scan and skewed load techniques is shown to allow scan-based delay tests to be applied… (More)
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Highly Cited
2000
Highly Cited
2000
Smaller feature sizes, reduced voltage levels, higher transistor counts, and reduced noise margins make future generations of… (More)
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1999
1999
Real-time systems interact with their environment, through time constrained inputloutput events. The misbehavior of real-time… (More)
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Highly Cited
1999
Highly Cited
1999
The paper describes a systematic approach for automatically introducing data and code redundancy into an existing program written… (More)
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1993
1993
The main disadvantage of the path delay fault model is that to achieve 100% testability every path must be tested. Since the… (More)
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Highly Cited
1993
Highly Cited
1993
This paper addresses the problem of simulating and generating tests for transition faults in nonscan and partial scan synchronous… (More)
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Highly Cited
1988
Highly Cited
1988
Inductive fault analysis (IFA) is a systematic method for determining what faults are likely to occur in a VLSI circuit. It takes… (More)
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Highly Cited
1981
Highly Cited
1981
This correspondence presents a single equation relating the defect level of LSI chips to the yield and stuck-at-fault coverage… (More)
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