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Transistor fault
Transistor Fault model is a Fault model used to describe faults for CMOS logic gates. At transistor level, a transistor may be stuck-short or stuck…
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Related topics
Related topics
4 relations
CMOS
Fault model
PMOS logic
Broader (1)
Digital electronics
Papers overview
Semantic Scholar uses AI to extract papers important to this topic.
2017
2017
Detection of single and multiple IGBTs open-circuit faults in a field-oriented controlled induction motor drive
P. Sobanski
,
T. Orłowska-Kowalska
2017
Corpus ID: 59570307
In this paper a transistor open-circuit fault diagnosis method in a rotor field oriented controlled induction motor drive, fed by…
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2016
2016
FAULT IDENTIFICATION AND MITIGATION IN H BRIDGE INVERTER PWM CONTROLLED SHUNT ACTIVE POWER FILTER
2016
Corpus ID: 45874425
National efforts to improve air quality in heavily populated urban communities-by reducing vehicular tailpipe emissions-have…
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2014
2014
Voltage inverter IGBT fault diagnosis in the sensorless induction motor drive with MRASCC speed estimator
P. Sobanski
,
T. Orłowska-Kowalska
2014
Corpus ID: 55866515
This article discusses the issue of a single IGBTs open-circuit fault diagnosis problem in voltage source inverters feeding…
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Review
2014
Review
2014
Transistor Fault Diagnosis and Fault-Tolerant Control of Five-Phase PM Motor Drive for Application in Electric Vehicles
M. Salehifar
,
Ramin Salehi Arashloo
,
M. Moreno-Eguilaz
,
V. Sala
,
L. Romeral
2014
Corpus ID: 36941876
to meet increasing demand for higher reliability in power electronics converters applicable in electric vehicles, fault detection…
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2002
2002
A self-checking cell logic block for fault tolerant FPGAs
S. Pontarelli
,
G. Cardarilli
,
A. Leandri
,
M. Ottavi
,
M. Re
,
A. Salsano
IEEE International Symposium on Circuits and…
2002
Corpus ID: 17296760
This paper proposes a self-checking Cell Logic Block (CLB) that can be used as building block for on-line testable FPGAs. The…
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1992
1992
Transistor Fault Coverage for Self-Testing CMOS Checkers
P. Lidén
,
P. Dahlgren
,
J. Torin
Proceedings International Test Conference
1992
Corpus ID: 27873837
Several realistic transistor fault models were applied to circuit-level simulation models of code checkers in order to…
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1990
1990
A single-state-transition fault model for sequential machines
K. Cheng
,
Jing-Yang Jou
IEEE International Conference on Computer-Aided…
1990
Corpus ID: 26329538
A fault model in the state transition level of finite state machines is studied. In this model, called a single-state-transition…
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Highly Cited
1985
Highly Cited
1985
Modeling and Test Generation Algorithms for MOS Circuits
Sunil K. Jain
,
V. Agrawal
IEEE transactions on computers
1985
Corpus ID: 3003981
An application of the D-algorithm in generating tests for MOS circuit faults is described. The MOS circuits considered are…
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