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Transistor fault
Transistor Fault model is a Fault model used to describe faults for CMOS logic gates. At transistor level, a transistor may be stuck-short or stuck…
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Related topics
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CMOS
Fault model
PMOS logic
Broader (1)
Digital electronics
Papers overview
Semantic Scholar uses AI to extract papers important to this topic.
2017
2017
Detection of single and multiple IGBTs open-circuit faults in a field-oriented controlled induction motor drive
P. Sobanski
,
T. Orłowska-Kowalska
2017
Corpus ID: 59570307
In this paper a transistor open-circuit fault diagnosis method in a rotor field oriented controlled induction motor drive, fed by…
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2017
2017
Fault tolerant sliding mode direct torque control of induction motor with inverter reconfiguration
G. Tarchała
,
P. Sobanski
,
T. Orłowska-Kowalska
International Symposium on Industrial Electronics
2017
Corpus ID: 6841076
This paper proposes novel and simple method of fault-tolerant control of induction motor supplied by a two-level voltage source…
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2016
2016
A stator-flux-based diagnostic method for IGBT open-circuit faults in an induction motor drive
P. Sobanski
,
T. Orłowska-Kowalska
Annual Conference of the IEEE Industrial…
2016
Corpus ID: 3539065
this paper addresses a single-switch IGBT open-circuit faults diagnosis of a two-level voltage source inverter in an induction…
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2016
2016
Fast open-transistor fault diagnosis based on calculated bridge arm pole-to-pole voltages in voltage-source inverters
Zhan Li
,
Z. Bai
,
Hao Ma
,
Yuxi Wang
SPEC Workshops
2016
Corpus ID: 12840719
A novel fast open-transistor diagnosis approach for voltage-source inverters (VSI) based on calculated bridge arm pole-to-pole…
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2016
2016
Output voltage modeling of cascaded H-bridge multilevel inverters under open-transistor fault
N. Raj
,
Anjali Anand
,
G. Jagadanand
,
S. George
IEEE Industrial Electronics and Applications…
2016
Corpus ID: 8434755
Multilevel inverters (MLIs) consist of increased number of power semiconductor devices for the generation of desired output…
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1996
1996
Defect-oriented vs schematic-level based fault simulation for mixed-signal ICs
T. Olbrich
,
Jordi Pérez
,
I. Grout
,
A. Richardson
,
C. Ferrer
Proceedings International Test Conference . Test…
1996
Corpus ID: 2129032
Escalating demand for mixed-signal Integrated Circuits has been accompanied by the need to develop efficient strategies to…
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1992
1992
Transistor Fault Coverage for Self-Testing CMOS Checkers
P. Lidén
,
P. Dahlgren
,
J. Torin
Proceedings International Test Conference
1992
Corpus ID: 27873837
Several realistic transistor fault models were applied to circuit-level simulation models of code checkers in order to…
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1990
1990
A single-state-transition fault model for sequential machines
K. Cheng
,
Jing-Yang Jou
IEEE International Conference on Computer-Aided…
1990
Corpus ID: 26329538
A fault model in the state transition level of finite state machines is studied. In this model, called a single-state-transition…
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1986
1986
Mixed-Level Fault Coverage Estimation
Hi-Keung Tony Ma
,
A. Sangiovanni-Vincentelli
23rd ACM/IEEE Design Automation Conference
1986
Corpus ID: 17381565
A Fault coverage estimation technique for mixed-level circuit is described. Observability formulae for combinational multiple…
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Highly Cited
1985
Highly Cited
1985
Modeling and Test Generation Algorithms for MOS Circuits
Sunil K. Jain
,
V. Agrawal
IEEE transactions on computers
1985
Corpus ID: 3003981
An application of the D-algorithm in generating tests for MOS circuit faults is described. The MOS circuits considered are…
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