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Iddq testing

Known as: Iddq 
Iddq testing is a method for testing CMOS integrated circuits for the presence of manufacturing faults. It relies on measuring the supply current… 
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Related topics

Related topics

9 relations
CMOSDesign for testingLogic gateLogic redundancy

Papers overview

Semantic Scholar uses AI to extract papers important to this topic.
2003
2003
Testable design and testing of micro-electro-fluidic arrays
The testable design and testing of a fully software-controllable lab-on-a-chip, including a fluidic array of FlowFETs, control… 
2003
2003
Replacing IDDQ Testing: With Variance Reduction
This work is part of our effort to find an alternative to IDDQ testing. Specifically, this paper presents our variance reduction… 
Highly Cited
2000
Highly Cited
2000
Delta Iddq for testing reliability
Point defects, which cause small current increases and potentially early failures, can be masked by increased chip background… 
1999
1999
On the Comparison of IDDQ and IDDQ Testing
The purpose of this paper is to compare differential Iddq to Iddq itself, in their capabilities of detecting active current… 
1998
1998
IDDT Testing versus IDDQ Testing
IDDQ testing has progressed to become a worldwide accepted test method to detect CMOS IC defects. However, it is noticed that… 
1998
1998
Experimental results for IDDQ and VLV testing
An experimental test chip was designed and manufactured to evaluate different test techniques. Based on the results presented in… 
1998
1998
Diagnosis method based on /spl Delta/Iddq probabilistic signatures: experimental results
The purpose of this paper is to present experimental results validating a diagnosis method based on differential Iddq… 
1995
1995
Reducing the CMOS RAM test complexity withIDDQ and voltage testing
In this article, we outline a RAM test methodology taking into accountIDDQ and voltage based March tests. RAM test cost forms a… 
1992
1992
Detection of undetectable faults using IDDQ testing
A new fault model (weak-0 and weak-1 faults) is presented to represent defects in CMOS circuits which may cause degradation of… 
1991
1991
IDDq benefits (digital CMOS testing)
  • Steven D. McEuen
  • Digest of Papers VLSI Test Symposium 'Chip-to…
  • 1991
  • Corpus ID: 44931218
The author discusses many different aspects of IDDq, quality, reliability, and test being the major three. A description of IDDq… 
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