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Iddq testing
Known as:
Iddq
Iddq testing is a method for testing CMOS integrated circuits for the presence of manufacturing faults. It relies on measuring the supply current…
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Related topics
Related topics
9 relations
CMOS
Design for testing
Logic gate
Logic redundancy
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Papers overview
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2006
2006
The Power of Exhaustive Bridge Diagnosis using IDDQ Speed, Confidence, and Resolution
D. Heaberlin
IEEE International Test Conference
2006
Corpus ID: 12051191
A method is presented for high-speed diagnosis of all two-node bridging defects in a logic circuit using IDDQ. The method is…
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2003
2003
Testable design and testing of micro-electro-fluidic arrays
H. Kerkhoff
,
M. Acar
Proceedings. 21st VLSI Test Symposium, .
2003
Corpus ID: 52988
The testable design and testing of a fully software-controllable lab-on-a-chip, including a fluidic array of FlowFETs, control…
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2002
2002
Extending the viability of I/sub DDQ/ testing in the deep submicron era
Y. Tsiatouhas
,
T. Haniotakis
,
D. Nikolos
,
A. Arapoyanni
Proceedings International Symposium on Quality…
2002
Corpus ID: 206992933
I/sub DDQ/ testing has become a widely accepted defect detection technique in CMOS ICs. However, its effectiveness in deep…
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Highly Cited
2000
Highly Cited
2000
Delta Iddq for testing reliability
T. Powell
,
J. R. Pair
,
M. John
,
D. Counce
Proceedings of the ... IEEE VLSI Test Symposium
2000
Corpus ID: 28063977
Point defects, which cause small current increases and potentially early failures, can be masked by increased chip background…
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2000
2000
Detectability conditions for interconnection open defects
V. Champac
,
A. Zenteno
Proceedings of the ... IEEE VLSI Test Symposium
2000
Corpus ID: 20556563
The detectability of interconnection opens by logic and I/sub DDQ/ testing is investigated. Opens in interconnection paths…
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Review
1998
Review
1998
ATE features for Iddq testing
M. G. Faust
Asian Test Symposium
1998
Corpus ID: 37114194
This paper briefly reviews the value of Iddq testing and the challenges it presents traditional ATE hardware and software. It…
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1997
1997
Application and analysis of IDDQ diagnostic software
P. Nigh
,
D. Forlenza
,
F. Motika
Proceedings International Test Conference
1997
Corpus ID: 19503757
A current disadvantage of IDDq testing is lack of software-based diagnostic tools that enable IC vendors to create a large…
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1996
1996
IDDQ testability of flip-flop structures
Hiroshi Yamazaki
,
Y. Miura
Digest of Papers IEEE International Workshop on…
1996
Corpus ID: 6196773
We describe IDDQ testability for bridging faults in a variety of flip-flops. The flip-flop is a basic element of the sequential…
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Highly Cited
1996
Highly Cited
1996
Iddq testing for high performance CMOS-the next ten years
T. Williams
,
R. Kapur
,
M. R. Mercer
,
R. Dennard
,
Wojciech Maly
Proceedings ED&TC European Design and Test…
1996
Corpus ID: 17324986
CMOS scaling affects the subthreshold current per IC, and it directly impacts the utility of Iddq testing for CMOS devices…
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1991
1991
IDDq benefits (digital CMOS testing)
Steven D. McEuen
Digest of Papers VLSI Test Symposium 'Chip-to…
1991
Corpus ID: 44931218
The author discusses many different aspects of IDDq, quality, reliability, and test being the major three. A description of IDDq…
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