Iddq testing

Known as: Iddq 
Iddq testing is a method for testing CMOS integrated circuits for the presence of manufacturing faults. It relies on measuring the supply current… (More)
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Topic mentions per year

Topic mentions per year

1989-2017
010203019892017

Papers overview

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2006
2006
This paper addresses the efficiency of IDDQ and more specifically Delta- IDDQ testing when using a realistic short defect model… (More)
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2003
2003
In this paper an embedded IDDQ testing architecture is presented that targets to overcome the excessive hardware overhead… (More)
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Highly Cited
2000
Highly Cited
2000
It is little more than 15-years since the idea of Iddq testing was first proposed. Many semiconductor companies now consider Iddq… (More)
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Highly Cited
2000
Highly Cited
2000
The use of a single pass/fail threshold for IDDQ testing is unworkable as chip background currents increase to the point where… (More)
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2000
2000
This paper describes the requirements that quiescent current (IDDQ) testing must meet in order to continue being useful in the… (More)
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1998
1998
IDDQ Testing is a well accepted testing approach based on the observation of the quiescent current consumption. Its growing… (More)
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Highly Cited
1996
Highly Cited
1996
While technology is changing the face of the world, it itself is changing by leaps and bounds; there is a continuing trend to put… (More)
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1995
1995
IDDQ testing is known to be very effective in detecting shorts in CMOS circuits. It has also been reported that open defects that… (More)
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1993
1993
Quiescent power supply current (IDDQ) testing of CMOS integrated circuits is a technique for production quality and reliability… (More)
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1991
1991
Detecting CMOS bridging faults (BFs) using IDDQ testing, or the current supply monitoring method (CSM), has recently received… (More)
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