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Iddq testing

Known as: Iddq 
Iddq testing is a method for testing CMOS integrated circuits for the presence of manufacturing faults. It relies on measuring the supply current… 
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Related topics

Related topics

9 relations
CMOSDesign for testingLogic gateLogic redundancy

Papers overview

Semantic Scholar uses AI to extract papers important to this topic.
2003
2003
Replacing IDDQ Testing: With Variance Reduction
This work is part of our effort to find an alternative to IDDQ testing. Specifically, this paper presents our variance reduction… 
2003
2003
Testable design and testing of micro-electro-fluidic arrays
The testable design and testing of a fully software-controllable lab-on-a-chip, including a fluidic array of FlowFETs, control… 
Highly Cited
2000
Highly Cited
2000
Delta Iddq for testing reliability
Point defects, which cause small current increases and potentially early failures, can be masked by increased chip background… 
1998
1998
Diagnosis method based on /spl Delta/Iddq probabilistic signatures: experimental results
The purpose of this paper is to present experimental results validating a diagnosis method based on differential Iddq… 
Highly Cited
1996
Highly Cited
1996
Iddq testing for high performance CMOS-the next ten years
CMOS scaling affects the subthreshold current per IC, and it directly impacts the utility of Iddq testing for CMOS devices… 
1995
1995
Microprocessor IDDQ Testing: A Case Study
The author describe their incorporation of I/sub DDQ/ testing into the design of the PA-7100LC PA-RISC microprocessor. They also… 
1995
1995
Reducing the CMOS RAM test complexity withIDDQ and voltage testing
In this article, we outline a RAM test methodology taking into accountIDDQ and voltage based March tests. RAM test cost forms a… 
1995
1995
Defect-oriented test methodology for complex mixed-signal circuits
Testing of analog blocks in digital circuits is emerging as a critical factor in the success of mixed-signal ICs. The present… 
Highly Cited
1992
Highly Cited
1992
Diagnosis of leakage faults with IDDQ
Recently there has been renewed interest in fault detection in static CMOS circuits through IDDQ monitoring. This work shows that… 
1991
1991
IDDq benefits (digital CMOS testing)
  • Steven D. McEuen
  • Digest of Papers VLSI Test Symposium 'Chip-to…
  • 1991
  • Corpus ID: 44931218
The author discusses many different aspects of IDDq, quality, reliability, and test being the major three. A description of IDDq… 
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