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Semiconductor characterization techniques

Known as: Semiconductor Device Characterization Techniques 
The purpose of this article is to summarize the methods used to experimentally characterize a semiconductor material or device (PN junction, Schottky… 
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Related topics

Related topics

8 relations
Deep-level transient spectroscopyElectron beam-induced currentIon beamList of semiconductor materials

Papers overview

Semantic Scholar uses AI to extract papers important to this topic.
2018
2018
Nanometer Scale Coating Using Atomic Layer Deposition Technique To Enhance Performance of Bio-Medical Devices
Nanofabrication is the meeting ground of engineering, biology, physics, medicine and chemistry. Most of these disciplines… 
2010
2010
A Direct Method for Charge Collection Probability Computation Using the Reciprocity Theorem
This paper presents a simple and direct method for computing the charge collection probability distribution by utilizing the… 
Review
2000
Review
2000
Semiconductor characterization and analytical technology
The utility of semiconductor characterization techniques continues to be measured by industry requirements for smaller device… 
1997
1997
Detection of Silicon Wafer Contamination by Lifetime Measurement Using Infrared Photothermal Radiometry
Introduction. Laser infrared photothermal radiometry (PTR) [1 to 3] is rapidly evolving into a sensitive remote non-contacting… 
1978
1978
Semiconductor characterization techniques : proceedings of the Topical Conference on Characterization Techniques for Semiconductor Materials and Devices
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