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Deep-level transient spectroscopy
Known as:
DLTS
, Deep Level Transient Spectroscopy
Deep-level transient spectroscopy (DLTS) is an experimental tool for studying electrically active defects (known as charge carrier traps) in…
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Related topics
Related topics
16 relations
Capacitance–voltage profiling
Depletion region
Doping (semiconductor)
Electron hole
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Papers overview
Semantic Scholar uses AI to extract papers important to this topic.
2006
2006
Scanning ion deep level transient spectroscopy: I. Theory
Jamie Stuart Laird
,
Chennupati Jagadish
,
David N. Jamieson
,
G. Legge
2006
Corpus ID: 56156836
Theoretical aspects of a new technique for the MeV ion microbeam are described in detail for the first time. The basis of the…
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2005
2005
Deep-level transient spectroscopy using low-frequency capacitance measurements
Y. Tokuda
,
W. Nakamura
,
K. Nakashima
13th International Conference on Semiconducting…
2005
Corpus ID: 30392754
The deep-level transient spectroscopy (DLTS) system is fabricated using low-frequency capacitance measurements and is applied to…
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2001
2001
Deep level transient spectroscopy characterization of InAs self-assembled quantum dots
V. Ilchenko
,
Sheng-Di Lin
,
C. P. Lee
,
O. Tretyak
2001
Corpus ID: 73693880
Deep level transient spectroscopy (DLTS) was used to obtain the energy level and the capture characteristics of InAs self…
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2000
2000
Deep-level transient spectroscopy of Pd-H complexes in silicon
J.-U. Sachse
,
J. Weber
,
H. Lemke
2000
Corpus ID: 55986840
The interaction of atomic hydrogen with substitutional palladium impurities is studied in nand p-type Si by deep-level transient…
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1999
1999
DLTS analysis of nickel–hydrogen complex defects in silicon
M. Shiraishi
,
J.-U. Sachse
,
H. Lemke
,
J. Weber
1999
Corpus ID: 55737527
1995
1995
NONCONTACT PHOTOTHERMAL INFRARED RADIOMETRIC DEEP-LEVEL TRANSIENT SPECTROSCOPY OF GAAS WAFERS
A. Mandelis
,
R. Budiman
,
M. Vargas
,
D. Wolff
1995
Corpus ID: 120389156
A novel infrared photothermal radiometric deep‐level transient spectroscopy (PTR‐DLTS) has been developed for semiconductor…
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1991
1991
Deep level transient spectroscopy on radioactive impurities: Demonstration for Si:111In*
M. Lang
,
G. Pensl
,
M. Gebhard
,
N. Achtziger
,
M. Uhrmacher
1991
Corpus ID: 73709572
A defect specific analysis technique is introduced that combines the high concentration sensitivity of deep level transient…
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1990
1990
Deep level transient spectroscopy measurements of p-type InP
K. Korona
,
K. Karpińska
,
A. Babiński
,
A. M. Hennel
1990
Corpus ID: 125953940
Determination des parametres des six pieges a trous de l'echantillon dope au Fe et avec diffusion de Ni. Proposition d'un niveau…
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Highly Cited
1990
Highly Cited
1990
A new type of high efficiency with a low‐cost solar cell having the structure of a μc‐SiC/polycrystalline silicon heterojunction
Y. Matsumoto
,
G. Hirata
,
H. Takakura
,
H. Okamoto
,
Y. Hamakawa
1990
Corpus ID: 55037600
A new type of high‐efficiency solar cell has been developed by a simple production process only with electron cyclotron resonance…
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1986
1986
A microcomputer-based deep-level transient spectroscopy (DLTS) system
B. A. Bumgarner
,
W. D. Brown
IEEE Transactions on Instrumentation and…
1986
Corpus ID: 46482028
A totally automated, microcomputer-based deep-level transient spectroscopy (DLTS) system developed at the University of Arkansas…
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