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Deep-level transient spectroscopy

Known as: DLTS, Deep Level Transient Spectroscopy 
Deep-level transient spectroscopy (DLTS) is an experimental tool for studying electrically active defects (known as charge carrier traps) in… 
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Related topics

Related topics

16 relations
Capacitance–voltage profilingDepletion regionDoping (semiconductor)Electron hole

Papers overview

Semantic Scholar uses AI to extract papers important to this topic.
2018
2018
Defect identification based on first-principles calculations for deep level transient spectroscopy
Deep level transient spectroscopy (DLTS) is used extensively to study defects in semiconductors. We demonstrate that great care… 
2006
2006
Scanning ion deep level transient spectroscopy: I. Theory
Theoretical aspects of a new technique for the MeV ion microbeam are described in detail for the first time. The basis of the… 
Highly Cited
2005
Highly Cited
2005
Traps in AlGaN/GaN/SiC heterostructures studied by deep level transient spectroscopy
AlGaN∕GaN∕SiC Schottky barrier diodes (SBDs), with and without Si3N4 passivation, have been characterized by temperature… 
Review
2004
Review
2004
Laplace-transform deep-level spectroscopy: the technique and its applications to the study of point defects in semiconductors
We present a comprehensive review of implementation and application of Laplace deep-leve1 transient spectroscopy (LDLTS). The… 
2001
2001
Deep level transient spectroscopy characterization of InAs self-assembled quantum dots
Deep level transient spectroscopy (DLTS) was used to obtain the energy level and the capture characteristics of InAs self… 
2000
2000
Deep-level transient spectroscopy of Pd-H complexes in silicon
The interaction of atomic hydrogen with substitutional palladium impurities is studied in nand p-type Si by deep-level transient… 
1999
1999
Deep Level Transient Spectroscopy
The sections in this article are 1 Principle of The DLTS Technique: Rate Window Concept 2 Detection of Trapped Charges… 
1991
1991
Deep level transient spectroscopy on radioactive impurities: Demonstration for Si:111In*
A defect specific analysis technique is introduced that combines the high concentration sensitivity of deep level transient… 
1986
1986
A microcomputer-based deep-level transient spectroscopy (DLTS) system
A totally automated, microcomputer-based deep-level transient spectroscopy (DLTS) system developed at the University of Arkansas… 
1979
1979
Deep Level Transient Spectroscopy of High-Purity Germanium Diodes/Detectors
Deep Level Transient Spectroscopy (DLTS) has been applied for the first time to high-purity germanium p-i-n diodes. Using the… 
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