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Doping (semiconductor)
Known as:
Doping
, Chemical doping
, Semiconductor doping
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In semiconductor production, doping intentionally introduces impurities into an extremely pure intrinsic semiconductor for the purpose of modulating…
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Related topics
Related topics
50 relations
Acceptor (semiconductors)
Arrayed waveguide grating
Band bending
Bismuth selenide
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Broader (1)
Semiconductor device fabrication
Papers overview
Semantic Scholar uses AI to extract papers important to this topic.
Highly Cited
2009
Highly Cited
2009
Phosphine-Oxide-Containing Bipolar Host Material for Blue Electrophosphorescent Devices
Fang-Ming Hsu
,
Chen‐Han Chien
,
Ping-I Shih
,
C. Shu
2009
Corpus ID: 55661542
We report highly efficient blue electrophosphorescent organic light-emitting diodes (OLEDs) incorporating a bipolar host, 2,7-bis…
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Highly Cited
2004
Highly Cited
2004
Monolithic Integration of Carbon Nanotube Devices with Silicon MOS Technology
Yu-Chih Tseng
,
Peiqi Xuan
,
+4 authors
H. Dai
2004
Corpus ID: 1560670
An integrated circuit combining single-walled carbon nanotube (SWNT) devices with n-channel metal oxide semiconductor (NMOS…
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Highly Cited
1998
Highly Cited
1998
Dynamic spectral power equalization using micro-opto-mechanics
J. Ford
,
J. A. Walker
IEEE Photonics Technology Letters
1998
Corpus ID: 8376023
We present a voltage-controlled spectral attenuator for gain shaping and power equalization in wavelength division multiplexed…
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Highly Cited
1986
Highly Cited
1986
Enhancement- and depletion-mode p-channel GexSi1-xmodulation-doped FET's
T. Pearsall
,
J. Bean
IEEE Electron Device Letters
1986
Corpus ID: 9376786
We report enhancement- and depletion-mode p-channel modulation-doped field-effect transistors (FET's) in Si. Si/GexSi1…
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Highly Cited
1986
Highly Cited
1986
Physics, technology, and modeling of polysilicon emitter contacts for VLSI bipolar transistors
G. Patton
,
J. Bravman
,
J. Plummer
IEEE Transactions on Electron Devices
1986
Corpus ID: 42026047
The physics of minority-carrier injection into polysilicon-contacted emitters has been studied through a series of experiments…
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Highly Cited
1985
Highly Cited
1985
Polymer Films on Electrodes XVI . In Situ Ellipsometric Measurements of Polybipyrazine, Polyaniline, and Polyvinylferrocene Films
C. Carlin
,
L. J. Kepley
,
A. Bard
1985
Corpus ID: 43147230
Ellipsometry was used to study the electrodeposition of polymer films formed by oxidation of bipyrazine, polyvinylferrocene, and…
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Highly Cited
1981
Highly Cited
1981
Lattice Defects in Semiconducting Hg1 − x Cd x Te Alloys I . Defect Structure of Undoped and Copper Doped
H. Vydyanath
1981
Corpus ID: 93735386
Undoped crystals were subjected to high temperature equilibration at temperatures ranging from 400° to 655°C in various Hg…
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Highly Cited
1979
Highly Cited
1979
Bipolar transistor design for optimized power-delay logic circuits
D. Tang
,
P. Solomon
1979
Corpus ID: 62239089
This design optimization scheme provides a procedure for tailoring the impurity doping profile of the transistor so that the…
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Review
1975
Review
1975
Device physics of integrated injection logic
F. Klaassen
IEEE Transactions on Electron Devices
1975
Corpus ID: 32892426
After a brief review of relevant device parameters, characterizing the inversely operating multicollector n-p-n transistor and…
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Highly Cited
1970
Highly Cited
1970
Microwave properties of Schottky-barrier field-effect transistors
P. Wolf
1970
Corpus ID: 62219570
The microwave properties of silicon Schottky-barrier field-effect transistor(MESFET'S) with a gate-length of one micrometer are…
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