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Capacitance–voltage profiling

Known as: CV, C-V testing, CV profiling 
Capacitance–voltage profiling (or C–V profiling, sometimes CV profiling) is a technique for characterizing semiconductor materials and devices. The… 
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Papers overview

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Highly Cited
1995
Highly Cited
1995
Discoloration (as measured by CIE Lab L * values) was highly correlated with protein and polyphenol oxidase (PPO). In a cultivar… 
Highly Cited
1993
Highly Cited
1993
Callus was induced from Taxus baccata cv. Repandens Parsons ex Rehd., T. brevifolia Nutt., T. cuspidata Sieb. & Zucc., and T. x… 
1992
1992
The short-term stimulation of the net rate of carbon dioxide exchange of leaves by elevated concentrations of CO2 usually… 
Highly Cited
1991
Highly Cited
1991
SummaryThe effect of N and K nutrition on the salt tolerance of lettuce (Lactuca saliva L. cv. ‘Saunas’) and Chinese cabbage… 
Highly Cited
1988
Highly Cited
1988
Summary The transport protein of tobacco mosaic virus (TMV) (M r 30000, 30K non-structural protein) was detected on Western blots… 
Highly Cited
1975
Highly Cited
1975
The effects of series resistance on semiconductor doping profiles obtained by conventional CV analysis are discussed, and it is… 
Review
1975
Review
1975
The CV profiling technique is reviewed and its validity and limitations are investigated, with special attention given to the…