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Capacitance–voltage profiling

Known as: CV, C-V testing, CV profiling 
Capacitance–voltage profiling (or C–V profiling, sometimes CV profiling) is a technique for characterizing semiconductor materials and devices. The… 
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Papers overview

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Highly Cited
2012
Highly Cited
2012
Hexagonal boron nitride (hBN) epilayers have been synthesized by metal organic chemical vapor deposition and their dielectric… 
Highly Cited
2007
Highly Cited
2007
The objective of this study was to determine if the growth of sweet orange (Citrus sinensis (L.) Osbeck cv. ‘Valencia… 
Highly Cited
2005
Highly Cited
2005
The effects of soil drought on photosynthesis and chlorophyll fluo- rescence in the leaves of three bean (Phaseolus vulgaris L… 
Highly Cited
2005
Highly Cited
2005
This paper describes 2 studies that evaluated a new instrument, the Perceived Ethnic Discrimination Questionnaire–Community… 
Highly Cited
1995
Highly Cited
1995
Discoloration (as measured by CIE Lab L * values) was highly correlated with protein and polyphenol oxidase (PPO). In a cultivar… 
1992
1992
The short-term stimulation of the net rate of carbon dioxide exchange of leaves by elevated concentrations of CO2 usually… 
Highly Cited
1988
Highly Cited
1988
Summary The transport protein of tobacco mosaic virus (TMV) (M r 30000, 30K non-structural protein) was detected on Western blots… 
Highly Cited
1975
Highly Cited
1975
The effects of series resistance on semiconductor doping profiles obtained by conventional CV analysis are discussed, and it is…