Capacitance–voltage profiling

Known as: C-V testing, CV profiling, C-V profiling 
Capacitance–voltage profiling (or C–V profiling, sometimes CV profiling) is a technique for characterizing semiconductor materials and devices. The… (More)
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Topic mentions per year

Topic mentions per year

1975-2017
024619752017

Papers overview

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2014
2014
Avalanche photodiodes (APD) are important components in short-wave and mid-wave infrared detection systems (imaging, laser radar… (More)
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2009
2009
The move from one technology node to the next, with the associated transistor geometries shrink, has significantly increased the… (More)
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2006
2006
Capacitance–Voltage Spectroscopy of Trapping States in GaN/AlGaN Heterostructure Field-Effect Transistors W. L. Liu1, Y. L. Chen2… (More)
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2005
2005
The evolution of the emitter sheet resistance upon phosphorus in-diffusion from a spray-on dopant has been studied in the… (More)
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2000
2000
The design of compound semiconductor based devices increasingly requires the integration of materials of differing band gaps… (More)
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1999
1999
It is shown that the geometrical interelectrode capacitance of a GaAs metal-semiconductor field-effect transistor (MESFET) must… (More)
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1998
1998
Different two-dimensional (2-D) carrier profiling tools, based on contact-mode atomic force microscopy (AFM), have been used to… (More)
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1983
1983
We report he first measurement of the conduction band iscontinuity, AE,, for an MBE-grown N-n Ino.52A~~.48As/In~.s3Gao,~~As… (More)
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1979
1979
 
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Review
1975
Review
1975
The CV profiling technique is reviewed and its validity and limitations are investigated, with special attention given to the… (More)
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