Skip to search formSkip to main contentSkip to account menu

Drive-level capacitance profiling

Known as: Drive Level Capacitance Profiling 
Drive-level capacitance profiling (DLCP) is a type of capacitance–voltage-profiling characterization technique developed specifically for amorphous… 
Wikipedia (opens in a new tab)

Papers overview

Semantic Scholar uses AI to extract papers important to this topic.
2017
2017
A simulation is presented for drive-level capacitance profiling (DLCP) of Schottky diodes that allows a continuous distribution… 
2015
2015
Cu(In,Ga)(Se,S)2 (CIGSS) films are formed on flexible 430 stainless steel foils through reacting Cu-In-Ga metal precursors in H2… 
2014
2014
We report on drive-level capacitance profiling (DLCP) measurements made on Cu(In,Ga)Se2 solar cells. We observe that the deep… 
2013
2013
Cu seems to be necessary to achieve best efficiencies, however it is strongly connected with performance degradation due to its… 
2013
2013
The application of copper in the CdTe back contact is believed to be crucial to form an ohmic contact with CdTe. On the other… 
2012
2012
We present results on the characterization of a highly efficient CZTSSe solar cell fabricated using a solution-based process… 
2006
2006
The effects of reverse bias stressing have been studied on CuInGaSe2 thin-film solar cell devices. Finished cells were subjected… 
2006
2006
We have used electronic and optical techniques to characterize alloys of the Cu(ln,Ga)(S,Se)2 material system. The alloys were… 
2005
2005
  • D. Jensen
  • 2005
  • Corpus ID: 12743797
The performance of copper indium gallium diselenide (CIGS) solar cells varies widely among the various laboratories and…