Skip to search formSkip to main contentSkip to account menu

Electron beam-induced current

Known as: Ebic, Electron beam induced current 
Electron-beam-induced current (EBIC) is a semiconductor analysis technique performed in a scanning electron microscope (SEM) or scanning transmission… 
Wikipedia (opens in a new tab)

Papers overview

Semantic Scholar uses AI to extract papers important to this topic.
2014
2014
High-dimensional data arises in many important scientific fields. The analysis of high-dimensional data poses great challenges to… 
2009
2009
The electron beam induced current (EBIC) collection efficiency η of a circular nano Schottky contact of radius rc perpendicular… 
2007
2007
EBIC investigations of light-emitting structures based on InGaN/GaN MQW with different numbers of wells have been carried out. A… 
1999
1999
In the present work, electron beam induced current (EBIC) has been applied to characterize several kinds of chemical vapor… 
Review
1997
Review
1997
The local current flow through biased solar cells can be monitored by measuring the local heating at the cell surface. Based on… 
1992
1992
2014 The dependence of the electron beam induced current (EBIC) collection efficiency ~CC on the electron beam voltage is… 
1984
1984
Electron-beam induced current (EBIC) measurements were performed on cleaved cross sections of HgCdTe heterojunction infrared… 
Highly Cited
1980
Highly Cited
1980
Limits on the magnitude of bandgap narrowing and Auger recombination in heavily phosphorus-diffused silicon layers ∼ 10<sup>20…