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Electron beam-induced current
Known as:
Ebic
, Electron beam induced current
Electron-beam-induced current (EBIC) is a semiconductor analysis technique performed in a scanning electron microscope (SEM) or scanning transmission…
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Related topics
Related topics
7 relations
CMOS
Depletion region
Failure analysis
Semiconductor
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Broader (1)
Semiconductor device fabrication
Papers overview
Semantic Scholar uses AI to extract papers important to this topic.
2014
2014
The EBIC and a sequential procedure for feature selection in interactive linear models with high-dimensional data
Yawei He
,
Zehua Chen
Annals of the Institute of Statistical…
2014
Corpus ID: 122234040
High-dimensional data arises in many important scientific fields. The analysis of high-dimensional data poses great challenges to…
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2012
2012
Gate leakage current in GaN-based mesa- and planar-type heterostructure field-effect transistors
J. Kováč
,
A. Šatka
,
A. Chvála
,
D. Donoval
,
P. Kordos
,
S. Delage
Microelectronics and reliability
2012
Corpus ID: 5170606
2009
2009
Electron beam induced current at a Schottky nanocontact
M. Ledra
,
N. Tabet
2009
Corpus ID: 96444618
The electron beam induced current (EBIC) collection efficiency η of a circular nano Schottky contact of radius rc perpendicular…
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2009
2009
Physical phenomena affecting performance and reliability of 4H-SiC bipolar junction transistors
P. Muzykov
,
R. Kennedy
,
+4 authors
T. Sudarshan
Microelectronics and reliability
2009
Corpus ID: 31644266
2007
2007
EBIC characterization of light-emitting structures based on GaN
N. Shmidt
,
P. S. Vergeles
,
E. Yakimov
2007
Corpus ID: 20012195
EBIC investigations of light-emitting structures based on InGaN/GaN MQW with different numbers of wells have been carried out. A…
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1999
1999
Electron beam induced current and remote electron beam induced current assessment of chemical vapor deposited diamond films
A. Cremades
,
J. Piqueras
1999
Corpus ID: 53407252
In the present work, electron beam induced current (EBIC) has been applied to characterize several kinds of chemical vapor…
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Review
1997
Review
1997
Evaluation of Local Electrical Parameters of Solar Cells by Dynamic (Lock-In) Thermography
O. Breitenstein
,
K. Iwig
,
I. Konovalov
1997
Corpus ID: 55864860
The local current flow through biased solar cells can be monitored by measuring the local heating at the cell surface. Based on…
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1992
1992
Microscale characterisation of epitaxial semiconducting homolayers. - II. Electron beam induced current
F. Cléton
,
B. Sieber
,
Jean Luc Loffiaux
1992
Corpus ID: 56093024
2014 The dependence of the electron beam induced current (EBIC) collection efficiency ~CC on the electron beam voltage is…
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1984
1984
Electron-beam induced current measurement of HgCdTe heterojunction infrared detectors
Stephen L. Price
International Electron Devices Meeting
1984
Corpus ID: 11032154
Electron-beam induced current (EBIC) measurements were performed on cleaved cross sections of HgCdTe heterojunction infrared…
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Highly Cited
1980
Highly Cited
1980
Measurement of heavy doping parameters in silicon by electron-beam-induced current
G. Possin
,
M. Adler
,
B. Baliga
IEEE Transactions on Electron Devices
1980
Corpus ID: 40221657
Limits on the magnitude of bandgap narrowing and Auger recombination in heavily phosphorus-diffused silicon layers ∼ 10<sup>20…
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