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Electron beam-induced current

Known as: Ebic, Electron beam induced current 
Electron-beam-induced current (EBIC) is a semiconductor analysis technique performed in a scanning electron microscope (SEM) or scanning transmission… 
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Related topics

Related topics

7 relations
CMOSDepletion regionFailure analysisSemiconductor

Broader (1)

Semiconductor device fabrication

Papers overview

Semantic Scholar uses AI to extract papers important to this topic.
2014
2014
The EBIC and a sequential procedure for feature selection in interactive linear models with high-dimensional data
High-dimensional data arises in many important scientific fields. The analysis of high-dimensional data poses great challenges to… 
2012
2012
Gate leakage current in GaN-based mesa- and planar-type heterostructure field-effect transistors
2009
2009
Electron beam induced current at a Schottky nanocontact
The electron beam induced current (EBIC) collection efficiency η of a circular nano Schottky contact of radius rc perpendicular… 
2009
2009
Physical phenomena affecting performance and reliability of 4H-SiC bipolar junction transistors
2007
2007
EBIC characterization of light-emitting structures based on GaN
EBIC investigations of light-emitting structures based on InGaN/GaN MQW with different numbers of wells have been carried out. A… 
1999
1999
Electron beam induced current and remote electron beam induced current assessment of chemical vapor deposited diamond films
In the present work, electron beam induced current (EBIC) has been applied to characterize several kinds of chemical vapor… 
Review
1997
Review
1997
Evaluation of Local Electrical Parameters of Solar Cells by Dynamic (Lock-In) Thermography
The local current flow through biased solar cells can be monitored by measuring the local heating at the cell surface. Based on… 
1992
1992
Microscale characterisation of epitaxial semiconducting homolayers. - II. Electron beam induced current
2014 The dependence of the electron beam induced current (EBIC) collection efficiency ~CC on the electron beam voltage is… 
1984
1984
Electron-beam induced current measurement of HgCdTe heterojunction infrared detectors
Electron-beam induced current (EBIC) measurements were performed on cleaved cross sections of HgCdTe heterojunction infrared… 
Highly Cited
1980
Highly Cited
1980
Measurement of heavy doping parameters in silicon by electron-beam-induced current
Limits on the magnitude of bandgap narrowing and Auger recombination in heavily phosphorus-diffused silicon layers ∼ 10<sup>20… 
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