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Failure analysis

Known as: FA, Failure Analysis Engineer 
Failure analysis is the process of collecting and analyzing data to determine the cause of a failure, often with the goal of determining corrective… 
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Related topics

Related topics

36 relations
Accident analysisApplied element methodCAD navigationCharge-induced voltage alteration

Broader (2)

FailureReliability engineering

Papers overview

Semantic Scholar uses AI to extract papers important to this topic.
Highly Cited
2006
Highly Cited
2006
Solder-joint reliability in electronics under shock and vibration using explicit finite-element sub-modeling
In this paper, the modeling approaches for first-level solder interconnects in shock and drop of electronics assemblies have been… 
Highly Cited
2005
Highly Cited
2005
Thermal Cycling Reliability and Delamination of Anisotropic Conductive Adhesives Flip Chip on Organic Substrates With Emphasis on the Thermal Deformation
a Department of Materials Science and Engineering, Korea Advanced Institute of Science and Technology, Daejon 305-701, South… 
Highly Cited
2002
Highly Cited
2002
Diagnosis of sequence-dependent chips
  • C. LiE. McCluskey
  • Proceedings 20th IEEE VLSI Test Symposium (VTS )
  • 2002
  • Corpus ID: 31910146
A technique capable of diagnosing single and multiple stuck-open and stuck-at faults is presented. Eleven sequence-dependent… 
Highly Cited
2001
Highly Cited
2001
New photon detector for device analysis: Superconducting single-photon detector based on a hot electron effect
A novel superconducting single-photon detector (SSPD), intrinsically capable of high quantum efficiency (up to 20%) over a wide… 
Highly Cited
2000
Highly Cited
2000
A case-based reasoning system for identifying failure mechanisms
2000
2000
A Simple Question Answering System
We describe our simple question answering system written in perl that uses the CMU Link parser (Sleator and Temperley 1991… 
2000
2000
Extending the product family approach to support safe reuse
Highly Cited
1999
Highly Cited
1999
Single-quantum well InGaN green light emitting diode degradation under high electrical stress
1998
1998
Probabilistic mixed-model fault diagnosis
Previously-proposed strategies for VLSI fault diagnosis have suffered from a variety of self-imposed limitations. Some techniques… 
1978
1978
Endochronic model for nonlinear triaxial behavior of concrete
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