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Failure analysis
Known as:
FA
, Failure Analysis Engineer
Failure analysis is the process of collecting and analyzing data to determine the cause of a failure, often with the goal of determining corrective…
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Related topics
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36 relations
Accident analysis
Applied element method
CAD navigation
Charge-induced voltage alteration
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Broader (2)
Failure
Reliability engineering
Papers overview
Semantic Scholar uses AI to extract papers important to this topic.
2015
2015
Impact of IP layer routing policy on multilayer design
E. Palkopoulou
,
O. Gerstel
,
I. Stiakogiannakis
,
T. Telkamp
,
V. López
,
Ioannis Tomkos
IEEE\/OSA Journal of Optical Communications and…
2015
Corpus ID: 18314993
In this work we, first, investigate multilayer network planning approaches with different levels of integration by extending a…
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2015
2015
REROUTING FAILURE FLOWS USING LOGIC BLOCKS IN FUNCTIONAL MODELS FOR IMPROVED SYSTEM ROBUSTNESS: FAILURE FLOW DECISION FUNCTIONS
A. Short
,
Douglas L. Van Bossuyt
2015
Corpus ID: 59448947
Functional modelling methods used in the early conceptual phases of complex system design allow system designers to better…
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2014
2014
User characteristics and behaviour in operating annoying electronic products
Chajoong Kim
2014
Corpus ID: 5013665
The consumer electronic market is in a rapid evolution phase, and manufacturers are under tremendous competitive pressure to be…
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2010
2010
A Fuzzy Cost-based FMEA Model
Ali Jamshidi
,
R. Kazemzadeh
2010
Corpus ID: 5415478
Nowadays, improving and upgrading quality of products and services is one the main reason for outgoing the competitors and…
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Review
2008
Review
2008
MECHANICAL FAILURE IN MICROELECTRONIC PACKAGING
A. Pirondi
2008
Corpus ID: 56337143
in this paper an overview of microelectronic devices, namely the so-called electronic packagings, their mechanical failure…
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Review
2006
Review
2006
Hall effect sensors integrated in standard technology and optimized with on-chip circuitry
Jean-Baptiste Kammerer
,
L. Hébrard
,
V. Frick
,
P. Poure
,
F. Braun
2006
Corpus ID: 73536575
While silicon is not the best semi-conductor material to design Hall effect sensors, it is widely used because Hall devices are…
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2002
2002
Cognition and the Web: Moving from Theory to Web Design
M. Czerwinski
,
K. Larson
2002
Corpus ID: 64388664
The links from basic cognitive theory to applied web design practice are not as strong as we would like to see. This chapter…
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2002
2002
Application of Markov processes to predict aircraft operational reliability
E. Hugues
,
Eads Ccr
,
E. Charpentier
,
A. Cabarbaye
2002
Corpus ID: 110707500
A generic failure and maintenance scenario model has been identified to predict early in the aircraft design phase the number of…
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1999
1999
How To Justify Machinery Improvements Using Reliability Engineering Principles
H. Barringer
,
Todd R. Monroe
1999
Corpus ID: 110922664
For the typical machinery engineer, the difficulties encountered with making reliability improvements lie not with the "mechanics…
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Highly Cited
1993
Highly Cited
1993
Failure analysis of high-density CMOS SRAMs: using realistic defect modeling and I/sub DDQ/ testing
Samir B. Naik
,
F. Agricola
,
Wojciech Maly
IEEE Design & Test of Computers
1993
Corpus ID: 3061722
A rapid failure analysis method for high-density CMOS static RAMs (SRAMs) that uses realistic defect modeling and the results of…
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