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Failure analysis

Known as: FA, Failure Analysis Engineer 
Failure analysis is the process of collecting and analyzing data to determine the cause of a failure, often with the goal of determining corrective… 
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Related topics

Related topics

36 relations
Accident analysisApplied element methodCAD navigationCharge-induced voltage alteration

Broader (2)

FailureReliability engineering

Papers overview

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2015
2015
Impact of IP layer routing policy on multilayer design
In this work we, first, investigate multilayer network planning approaches with different levels of integration by extending a… 
Review
2006
Review
2006
Hall effect sensors integrated in standard technology and optimized with on-chip circuitry
While silicon is not the best semi-conductor material to design Hall effect sensors, it is widely used because Hall devices are… 
2005
2005
Comparison of a Cu UBM versus a Co UBM for Sn Flip-Chip Bumps
In this paper, pure Sn bumps are considered as Pb-free solder alternative. The thermal-cycling reliability of Sn is investigated… 
2004
2004
Sensing temperature in CMOS circuits for thermal testing
Temperature is a physical magnitude that can be used as an observable quantity for IC testing purposes. The authors discuss in… 
2002
2002
Cognition and the Web: Moving from Theory to Web Design
The links from basic cognitive theory to applied web design practice are not as strong as we would like to see. This chapter… 
2002
2002
Silicon symptoms to solutions: applying design for debug techniques
Quick and accurate silicon debug is essential for short time to market schedules. This paper describes several actual silicon… 
2002
2002
Application of Markov processes to predict aircraft operational reliability
A generic failure and maintenance scenario model has been identified to predict early in the aircraft design phase the number of… 
2000
2000
A Simple Question Answering System
We describe our simple question answering system written in perl that uses the CMU Link parser (Sleator and Temperley 1991… 
1998
1998
Probabilistic mixed-model fault diagnosis
Previously-proposed strategies for VLSI fault diagnosis have suffered from a variety of self-imposed limitations. Some techniques… 
1991
1991
Test Pattern Development and Evaluation for DRAMs with Fault Simulator RAMSIM
A fault simulator for DRAMS has been devel- oped to determine the fault coverage of test patterns . The realistic fault models…