Skip to search form
Skip to main content
Skip to account menu
Semantic Scholar
Semantic Scholar's Logo
Search 228,374,048 papers from all fields of science
Search
Sign In
Create Free Account
Failure analysis
Known as:
FA
, Failure Analysis Engineer
Failure analysis is the process of collecting and analyzing data to determine the cause of a failure, often with the goal of determining corrective…
Expand
Wikipedia
(opens in a new tab)
Create Alert
Alert
Related topics
Related topics
36 relations
Accident analysis
Applied element method
CAD navigation
Charge-induced voltage alteration
Expand
Broader (2)
Failure
Reliability engineering
Papers overview
Semantic Scholar uses AI to extract papers important to this topic.
2007
2007
Characterization and modelling of ageing failures on power MOSFET devices
B. Khong
,
M. Legros
,
+5 authors
E. Scheid
Microelectronics and reliability
2007
Corpus ID: 206944868
Highly Cited
2006
Highly Cited
2006
Solder-joint reliability in electronics under shock and vibration using explicit finite-element sub-modeling
P. Lall
,
S. Gupte
,
P. Choudhary
,
J. Suhling
Electronic Components and Technology Conference
2006
Corpus ID: 21410467
In this paper, the modeling approaches for first-level solder interconnects in shock and drop of electronics assemblies have been…
Expand
Highly Cited
2005
Highly Cited
2005
Thermal Cycling Reliability and Delamination of Anisotropic Conductive Adhesives Flip Chip on Organic Substrates With Emphasis on the Thermal Deformation
W. Kwon
,
M. Yim
,
K. Paik
,
S. Ham
,
Soon-Bok Lee
2005
Corpus ID: 15021750
a Department of Materials Science and Engineering, Korea Advanced Institute of Science and Technology, Daejon 305-701, South…
Expand
2004
2004
The Role of Night Vision Equipment in Military Incidents and Accidents
Chris W. Johnson
Human Error, Safety and Systems Development
2004
Corpus ID: 52833794
Night vision devices provide enormous benefits. They enable personnel to carry out operations under conditions that would not…
Expand
Highly Cited
2002
Highly Cited
2002
Diagnosis of sequence-dependent chips
C. Li
,
E. McCluskey
Proceedings 20th IEEE VLSI Test Symposium (VTS )
2002
Corpus ID: 31910146
A technique capable of diagnosing single and multiple stuck-open and stuck-at faults is presented. Eleven sequence-dependent…
Expand
2001
2001
An image system for fast positioning and accuracy inspection of ball grid array boards
Chern-Sheng Lin
,
Li-Wen Lue
Microelectronics and reliability
2001
Corpus ID: 17085372
2000
2000
Extending the product family approach to support safe reuse
R. Lutz
Journal of Systems and Software
2000
Corpus ID: 14424166
Highly Cited
2000
Highly Cited
2000
A case-based reasoning system for identifying failure mechanisms
T. Liao
,
Z. Zhang
,
C. R. Mount
2000
Corpus ID: 62634810
1987
1987
Diagnostics of faulty states in complex physical systems using fuzzy relational equations
J. Kitowski
,
Monika Bargiel
1987
Corpus ID: 115622601
1978
1978
Endochronic model for nonlinear triaxial behavior of concrete
Z. Bažant
,
Ching-long Shieh
1978
Corpus ID: 50145711
By clicking accept or continuing to use the site, you agree to the terms outlined in our
Privacy Policy
(opens in a new tab)
,
Terms of Service
(opens in a new tab)
, and
Dataset License
(opens in a new tab)
ACCEPT & CONTINUE