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CAD navigation

CAD navigation refers to software tools which are used for the correlation of electronic semiconductor design data with a physical semiconductor… 
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Failure analysisIon beamNetlistSchematic

Papers overview

Semantic Scholar uses AI to extract papers important to this topic.
2016
2016
Fault isolation of die level crystal defect failure mechanism through OBIRCH analysis and micro-probing
Generally, crystal defect is able to induce photon emission event for detection by emission microscopy (EMMI) equipment. However… 
2014
2014
Failure Analysis Methodology on Resistive Open Defects
This paper describes the observation of photoemissions from saturated transistors along a connecting path with open defect in the… 
2010
2010
Ultra-fast CAD scan chain highlighting for failure analysis assistance
2008
2008
Tools and Products
  • Ed Zintel
  • IEEE Computer Graphics and Applications
  • 2008
  • Corpus ID: 39421916
Department editor Dave Kasik highlights some of the new computer graphics tools and products on the market. In this issue the… 
Review
2006
Review
2006
Failure Analysis System for Submicron Semiconductor Devices
OVERVIEW: Failure analysis of semiconductor device is becoming increasingly difficult as VLSI technology evolves toward smaller… 
2005
2005
CAD navigation and diagnostics by linking ATE and EDA
  • K. Nagano
  • IEEE Transactions on Instrumentation and…
  • 2005
  • Corpus ID: 1192394
This paper describes a specific methodology and software that links automated test equipment (ATE) and electronic design… 
2002
2002
CAD navigation system, for backside waveform probing of CMOS devices
1997
1997
Guided-probe diagnosis of macro-cell-designed LSI circuits
  • N. Kuji
  • Asian Test Symposium
  • 1997
  • Corpus ID: 8387552
A novel guided-probe diagnostic method for macro cells has been developed. Since macro cells have no netlist corresponding to… 
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