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CAD navigation
CAD navigation refers to software tools which are used for the correlation of electronic semiconductor design data with a physical semiconductor…
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Related topics
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Failure analysis
Ion beam
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Papers overview
Semantic Scholar uses AI to extract papers important to this topic.
2016
2016
Fault isolation of die level crystal defect failure mechanism through OBIRCH analysis and micro-probing
N. S. Lee
,
F. K. Yong
International Symposium on the Physical and…
2016
Corpus ID: 5827528
Generally, crystal defect is able to induce photon emission event for detection by emission microscopy (EMMI) equipment. However…
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2014
2014
Failure Analysis Methodology on Resistive Open Defects
A. Quah
,
G. Ang
,
+5 authors
Z. Mai
2014
Corpus ID: 10599158
This paper describes the observation of photoemissions from saturated transistors along a connecting path with open defect in the…
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2010
2010
Ultra-fast CAD scan chain highlighting for failure analysis assistance
M. Grützner
,
C. Burmer
,
C. Brillert
Microelectronics and reliability
2010
Corpus ID: 39870575
2008
2008
Tools and Products
Ed Zintel
IEEE Computer Graphics and Applications
2008
Corpus ID: 39421916
Department editor Dave Kasik highlights some of the new computer graphics tools and products on the market. In this issue the…
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Review
2006
Review
2006
Failure Analysis System for Submicron Semiconductor Devices
M. Fukui
,
Y. Mitsui
,
D. Ph.
,
Yasuhiko Nara
,
F. Yano
,
T. Furukawa
2006
Corpus ID: 14365527
OVERVIEW: Failure analysis of semiconductor device is becoming increasingly difficult as VLSI technology evolves toward smaller…
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2005
2005
CAD navigation and diagnostics by linking ATE and EDA
K. Nagano
IEEE Transactions on Instrumentation and…
2005
Corpus ID: 1192394
This paper describes a specific methodology and software that links automated test equipment (ATE) and electronic design…
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2002
2002
CAD navigation system, for backside waveform probing of CMOS devices
K. Miura
,
K. Nakamae
,
H. Fujioka
Microelectronics and reliability
2002
Corpus ID: 11833953
1997
1997
Guided-probe diagnosis of macro-cell-designed LSI circuits
N. Kuji
Asian Test Symposium
1997
Corpus ID: 8387552
A novel guided-probe diagnostic method for macro cells has been developed. Since macro cells have no netlist corresponding to…
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