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Reliability engineering
Known as:
Experimental reliability
, Parallel-forms Reliability
, Inter-method variation
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Reliability engineering is engineering that emphasizes dependability in the lifecycle management of a product. Dependability, or reliability…
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Related topics
Related topics
50 relations
Bathtub curve
Built-in self-test
Censoring (statistics)
Cleanroom software engineering
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Broader (2)
Failure
Systems engineering
Papers overview
Semantic Scholar uses AI to extract papers important to this topic.
Highly Cited
2006
Highly Cited
2006
A fuzzy queuing location model with a genetic algorithm for congested systems
H. Shavandi
,
H. Mahlooji
Applied Mathematics and Computation
2006
Corpus ID: 1430677
Highly Cited
2003
Highly Cited
2003
Enhancing Base Station Security in Wireless Sensor Networks
Jing Deng
,
Richard O. Han
,
Shivakant Mishra
2003
Corpus ID: 7816195
Wireless sensor networks that are deployed in applications such as battlefield monitoring and home sentry systems face acute…
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Highly Cited
2002
Highly Cited
2002
Personality and Memory in Old Age
B. Meier
,
P. Perrig-Chiello
,
W. Perrig
2002
Corpus ID: 49581507
We examined the impact of personality on episodic memory performance in a sample of 287 healthy adults aged 68-95 years…
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Highly Cited
1998
Highly Cited
1998
Dynamic leakage cut-off scheme for low-voltage SRAM's
Hiroshi Kawaguchi
,
Yasuhito Itaka
,
Takayasu Sakurai
Symposium on VLSI Circuits. Digest of Technical…
1998
Corpus ID: 61967011
The operation voltage of VLSIs is ever decreasing due to the strong needs for low-power consumption. In order to achieve low…
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Review
1996
Review
1996
Software reliability and system reliability
J. Laprie
,
K. Kanoun
1996
Corpus ID: 52210988
This chapter is mainly aimed at showing that, by using deliberately simple mathematics, the classical reliability theory can be…
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Highly Cited
1995
Highly Cited
1995
The Codesign of Embedded Systems: A Unified Hardware/Software Representation
Sanjaya Kumar
,
J. Aylor
,
Barry W. Johnson
,
W. Wulf
Springer US
1995
Corpus ID: 43052766
Current practice dictates the separation of the hardware and software development paths early in the design cycle. These paths…
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Highly Cited
1993
Highly Cited
1993
New trends in system reliability evaluation
K. Misra
1993
Corpus ID: 60570572
Highly Cited
1989
Highly Cited
1989
A distributed time-slot assignment protocol for mobile multi-hop broadcast packet radio networks
L. C. Pond
,
V.O.K. Li
IEEE Military Communications Conference…
1989
Corpus ID: 61604828
A distributed time-slot-assignment protocol for a mobile multihop broadcast packet radio network, using time division multiple…
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Highly Cited
1984
Highly Cited
1984
Structure-enhanced MOSFET degradation due to hot-electron injection
F. Hsu
,
H. Grinolds
IEEE Electron Device Letters
1984
Corpus ID: 44995269
Device degradation due to channel hot-electron injection in several nonconventional MOSFET structures including minimum-overlap…
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Highly Cited
1975
Highly Cited
1975
EBES: A practical electron lithographic system
D. Herriott
,
R. J. Collier
,
D. Alles
,
J. W. Stafford
IEEE Transactions on Electron Devices
1975
Corpus ID: 45648247
An electron beam exposure system (EBES) has proven to be practical and economic for generating high-quality fine-featured…
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