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Reliability engineering

Known as: Experimental reliability, Parallel-forms Reliability, Inter-method variation 
Reliability engineering is engineering that emphasizes dependability in the lifecycle management of a product. Dependability, or reliability… 
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Related topics

Related topics

50 relations
Bathtub curveBuilt-in self-testCensoring (statistics)Cleanroom software engineering

Broader (2)

FailureSystems engineering

Papers overview

Semantic Scholar uses AI to extract papers important to this topic.
Highly Cited
2006
Highly Cited
2006
A fuzzy queuing location model with a genetic algorithm for congested systems
Highly Cited
2006
Highly Cited
2006
Hazard rate ordering of order statistics and systems
Let X = (X 1, X 2, …, X n ) be an exchangeable random vector, and write X (1:i) = min{X 1, X 2, …, X i }, 1 ≤ i ≤ n. In this… 
Highly Cited
2003
Highly Cited
2003
Enhancing Base Station Security in Wireless Sensor Networks
Wireless sensor networks that are deployed in applications such as battlefield monitoring and home sentry systems face acute… 
Highly Cited
2002
Highly Cited
2002
Personality and Memory in Old Age
We examined the impact of personality on episodic memory performance in a sample of 287 healthy adults aged 68-95 years… 
Review
1996
Review
1996
Software reliability and system reliability
This chapter is mainly aimed at showing that, by using deliberately simple mathematics, the classical reliability theory can be… 
Highly Cited
1995
Highly Cited
1995
The Codesign of Embedded Systems: A Unified Hardware/Software Representation
Current practice dictates the separation of the hardware and software development paths early in the design cycle. These paths… 
Highly Cited
1993
Highly Cited
1993
New trends in system reliability evaluation
Highly Cited
1989
Highly Cited
1989
A distributed time-slot assignment protocol for mobile multi-hop broadcast packet radio networks
A distributed time-slot-assignment protocol for a mobile multihop broadcast packet radio network, using time division multiple… 
Highly Cited
1984
Highly Cited
1984
Structure-enhanced MOSFET degradation due to hot-electron injection
Device degradation due to channel hot-electron injection in several nonconventional MOSFET structures including minimum-overlap… 
Highly Cited
1975
Highly Cited
1975
EBES: A practical electron lithographic system
An electron beam exposure system (EBES) has proven to be practical and economic for generating high-quality fine-featured… 
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