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Built-in self-test
Known as:
Bit (disambiguation)
, Built-in
, Bist
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A built-in self-test (BIST) or built-in test (BIT) is a mechanism that permits a machine to test itself. Engineers design BISTs to meet requirements…
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Related topics
Related topics
32 relations
Avionics
BIOS
Built-in test equipment
Combinational logic
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Papers overview
Semantic Scholar uses AI to extract papers important to this topic.
2004
2004
Mems built-in-self-test using MLS
A. Dhayni
,
S. Mir
,
L. Rufer
Proceedings. Ninth IEEE European Test Symposium…
2004
Corpus ID: 2065267
This paper presents a Built-In-Self-Test (BIST) implementation of pseudo-random testing for Micro Electro-Mechanical Systems…
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1997
1997
Built-in self-testing of micropipelines
O. Petlin
,
S. Furber
Proceedings Third International Symposium on…
1997
Corpus ID: 12992582
An asynchronous ARM6 microprocessor (AMULET1), designed at the University of Manchester using a two-phase signalling protocol…
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1997
1997
Test width compression for built-in self testing
K. Chakrabarty
,
Jian Liu
,
Minyao Zhu
,
B. Murray
Proceedings International Test Conference
1997
Corpus ID: 11465823
We present a method for designing test generator circuits (TGCs) that incorporate a precomputed test set to in the patterns they…
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1996
1996
Arithmetic pattern generators for built-in self-test
A. P. Stroele
Proceedings International Conference on Computer…
1996
Corpus ID: 28074985
Adders, subtracters, ALUs, and multipliers, which are available in many data paths, can be utilized to generate test patterns for…
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1992
1992
Orthogonal built-in self-test
LaNae J. Avra
Digest of Papers COMPCON Spring
1992
Corpus ID: 19904007
The author introduces a new way to organize memory elements into scan chains for built-in self-testable data path logic. The goal…
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1991
1991
Built-in self-test in multi-port RAMs
V. Alves
,
M. Nicolaidis
,
P. Lestrat
,
B. Courtois
IEEE International Conference on Computer-Aided…
1991
Corpus ID: 42794845
The authors present a novel approach to the test of multi-port RAMs. A novel fault model that takes into account complex…
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1989
1989
Realistic built-in self-test for static RAMs
R. Dekker
,
F. Beenker
,
L. Thijssen
IEEE Design & Test of Computers
1989
Corpus ID: 43615311
The authors present the specification and design of a self-test mechanism for static random-access memories (RAMs). The test…
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Highly Cited
1989
Highly Cited
1989
Test set embedding in a built-in self-test environment
S. Akers
,
W. Jansz
Proceedings. 'Meeting the Tests of Time…
1989
Corpus ID: 26431414
The authors describe a built-in self-test (BIST) technique where the on-chip test pattern generator is a binary counter with…
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Highly Cited
1987
Highly Cited
1987
Built-In Self-Testing RAM: A Practical Alternative
K. Saluja
,
S. Sng
,
K. Kinoshita
IEEE Design & Test of Computers
1987
Corpus ID: 39195564
The article investigates the design of a built-in self-testing RAM as an economical way, in terms of silicon area overhead, to…
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1985
1985
Built-In Self-Test Trends in Motorola Microprocessors
R. Gary Daniels
,
William C. Bruce
IEEE Design & Test of Computers
1985
Corpus ID: 22719798
The first built-in self-test feature in a Motorola sidered a ¿wart¿ until a RAM test application recast it as a ¿ feature…
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