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Built-in self-test

Known as: Bit (disambiguation), Built-in, Bist 
A built-in self-test (BIST) or built-in test (BIT) is a mechanism that permits a machine to test itself. Engineers design BISTs to meet requirements… 
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Papers overview

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2004
2004
This paper presents a Built-In-Self-Test (BIST) implementation of pseudo-random testing for Micro Electro-Mechanical Systems… 
1997
1997
  • O. PetlinS. Furber
  • 1997
  • Corpus ID: 12992582
An asynchronous ARM6 microprocessor (AMULET1), designed at the University of Manchester using a two-phase signalling protocol… 
1997
1997
We present a method for designing test generator circuits (TGCs) that incorporate a precomputed test set to in the patterns they… 
Review
1993
Review
1993
For pt.1 see ibid., vol.10, no.1, p.73-82 (1993). The hardware structures and tools used to implement built-in self-test (BIST… 
1992
1992
  • LaNae J. Avra
  • 1992
  • Corpus ID: 19904007
The author introduces a new way to organize memory elements into scan chains for built-in self-testable data path logic. The goal… 
1991
1991
The authors present a novel approach to the test of multi-port RAMs. A novel fault model that takes into account complex… 
1989
1989
The authors present the specification and design of a self-test mechanism for static random-access memories (RAMs). The test… 
Highly Cited
1989
Highly Cited
1989
  • S. AkersW. Jansz
  • 1989
  • Corpus ID: 26431414
The authors describe a built-in self-test (BIST) technique where the on-chip test pattern generator is a binary counter with… 
Highly Cited
1987
Highly Cited
1987
The article investigates the design of a built-in self-testing RAM as an economical way, in terms of silicon area overhead, to… 
1985
1985
The first built-in self-test feature in a Motorola sidered a ¿wart¿ until a RAM test application recast it as a ¿ feature…