Skip to search form
Skip to main content
Skip to account menu
Semantic Scholar
Semantic Scholar's Logo
Search 237,159,874 papers from all fields of science
Search
Sign In
Create Free Account
Built-in self-test
Known as:
Bit (disambiguation)
, Built-in
, Bist
Expand
A built-in self-test (BIST) or built-in test (BIT) is a mechanism that permits a machine to test itself. Engineers design BISTs to meet requirements…
Expand
Wikipedia
(opens in a new tab)
Create Alert
Alert
Related topics
Related topics
32 relations
Avionics
BIOS
Built-in test equipment
Combinational logic
Expand
Papers overview
Semantic Scholar uses AI to extract papers important to this topic.
2004
2004
Mems built-in-self-test using MLS
A. Dhayni
,
S. Mir
,
L. Rufer
Proceedings. Ninth IEEE European Test Symposium…
2004
Corpus ID: 2065267
This paper presents a Built-In-Self-Test (BIST) implementation of pseudo-random testing for Micro Electro-Mechanical Systems…
Expand
2001
2001
Built-in self-testable data path synthesis
Laurence Tianruo Yangt
,
Jon Muxio
Proceedings IEEE Computer Society Workshop on…
2001
Corpus ID: 61649968
In this paper, we describe a high-level data path allocation algorithm to facilitate built-in self test. It generates self…
Expand
Highly Cited
1999
Highly Cited
1999
On calculating efficient LFSR seeds for built-in self test
C. Fagot
,
O. Gascuel
,
P. Girard
,
C. Landrault
European Test Workshop (Cat. No.PR00390)
1999
Corpus ID: 15409833
Linear Feedback Shift Registers (LFSRs) are commonly used as pseudo-random test pattern generators (TPGs) in BIST schemes. This…
Expand
1996
1996
Arithmetic pattern generators for built-in self-test
A. P. Stroele
Proceedings International Conference on Computer…
1996
Corpus ID: 28074985
Adders, subtracters, ALUs, and multipliers, which are available in many data paths, can be utilized to generate test patterns for…
Expand
1996
1996
A novel built-in current sensor for I/sub DDQ/ testing of deep submicron CMOS ICs
S. Athan
,
D. Landis
,
S. Al-Arian
Proceedings of 14th VLSI Test Symposium
1996
Corpus ID: 37866547
Today's built-in current sensor (BICS) techniques provide I/sub DDQ/ current sensitivity which is adequate for testing and…
Expand
Highly Cited
1992
Highly Cited
1992
CIRCUIT DESIGN FOR BUILT-IN CURRENT TESTING
Y. Miura
,
K. Kinoshita
Proceedings International Test Conference
1992
Corpus ID: 6841059
In current testing, the number of test vectors is usually A testing circuit for built-in current testing is proposed and a test…
Expand
1989
1989
A self-testing ALU using built-in current sensing
P. Nigh
,
Wojciech Maly
Proceedings of the IEEE Custom Integrated…
1989
Corpus ID: 61500871
A CMOS ALU (arithmetic logic unit) chip containing built-in current (BIC) sensors, which perform self-testing of the ALU, is…
Expand
1989
1989
Built in self test of the Macrolan chip
R. Illman
,
S. Clarke
Proceedings. 'Meeting the Tests of Time…
1989
Corpus ID: 46031317
The authors describe the experience of implementing self-test in the medium access controller (MAC) chip for the Macrolan…
Expand
1988
1988
A unified built-in-test scheme: UBIST
M. Nicolaidis
[] The Eighteenth International Symposium on…
1988
Corpus ID: 10259610
An original BIST (built-in self-test) scheme is proposed to cover some shortcomings of self-checking circuits and to ensure all…
Expand
1985
1985
Built-In Self-Test Trends in Motorola Microprocessors
R. Daniels
,
W. C. Bruce
IEEE Design & Test of Computers
1985
Corpus ID: 22719798
The first built-in self-test feature in a Motorola sidered a ¿wart¿ until a RAM test application recast it as a ¿ feature…
Expand