Built-in self-test

Known as: Bit (disambiguation), Built-in, Bist 
A built-in self-test (BIST) or built-in test (BIT) is a mechanism that permits a machine to test itself. Engineers design BISTs to meet requirements… (More)
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Papers overview

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2009
2009
1 On Built-In Self-Test for Adders Mary D. Pulukuri and Charles E. Stroud Dept. of Electrical and Computer Engineering, Auburn… (More)
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2007
2007
In this paper, we propose a new programmable deterministic built-in self-Test (BIST) method that requires significantly lower… (More)
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2006
2006
A built-in self-test technique that is applicable to symmetric microsystems is described. A combination of existing layout… (More)
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2004
2004
This paper presents a Built-In-Self-Test (BIST) implementation of pseudo-random testing for Micro ElectroMechanical Systems (MEMS… (More)
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2001
2001
  • Crossing VHthrCrossing VLmax Crossing VLthr Crossing VHmin
  • 2001
Unacceptable loss of signal integrity may harm the functionality of SoCs permanently or intermittently. We propose a systematic… (More)
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Highly Cited
1998
Highly Cited
1998
We introduce the first BIST approach for testing the programmable routing network in FPGAs. Our method detects opens in, and… (More)
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Highly Cited
1997
Highly Cited
1997
In undergoing this life, many people always try to do and get the best. New knowledge, experience, lesson, and everything that… (More)
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1992
1992
The author introduces a new way to organize memory elements into scan chains for built-in self-testable data path logic. The goal… (More)
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1989
1989
The authors propose a way to merge boundary scan with the built-in self-test (BIST) of printed circuit boards. Their boundary… (More)
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1984
1984
A built-in self-test technique utilizing on-chip pseudorandom-pattern generation, on-chip signature analysis, a ``boundary scan… (More)
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