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Built-in test equipment
Known as:
Bit (disambiguation)
, BITE
, Bite (disambiguation)
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BITE is an acronym for built-in test equipment.The BITE is characterized primarily as a passive fault management and diagnosis built into airborne…
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Related topics
Related topics
5 relations
Broader (1)
Avionics
Built-in self-test
Fly-by-wire
Logic built-in self-test
Software fault tolerance
Papers overview
Semantic Scholar uses AI to extract papers important to this topic.
2005
2005
Error vector-based measurement method for radiofrequency digital transmitter troubleshooting
L. Angrisani
,
M. D’Arco
,
M. Vadursi
IEEE Transactions on Instrumentation and…
2005
Corpus ID: 24805613
The rapid growth of modern telecommunications systems has created the need to get new test equipment and measurement techniques…
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2001
2001
On-Chip Test for Mixed-Signal ASICs using Two-Mode Comparators with Bias-Programmable Reference Voltages
D. Venuto
,
M. Ohletz
Journal of electronic testing
2001
Corpus ID: 8520853
A design-for-testability implementation for analogue functional blocks of mixed-signal ASICs is presented. For the analogue…
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Highly Cited
1997
Highly Cited
1997
A two-path bandpass /spl Sigma//spl Delta/ modulator for digital IF extraction at 20 MHz
A. Ong
,
B. Wooley
IEEE International Solids-State Circuits…
1997
Corpus ID: 12776471
There is expanding interest in the possibility of moving the intermediate frequency (IF) signal processing in radio receivers and…
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Highly Cited
1997
Highly Cited
1997
An efficient method for compressing test data
Takahiro J. Yamaguchi
,
M. Ishida
,
M. Tilgner
,
D. Ha
Proceedings International Test Conference
1997
Corpus ID: 16959896
The overall throughput of automatic test equipment (ATE) is sensitive to the download time of test data. An effective approach to…
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1997
1997
An integrated CMOS time interval measurement system with subnanosecond resolution for the WA-98 calorimeter
M. L. Simpson
,
C. Britton
,
A. Wintenberg
,
G. Young
IEEE J. Solid State Circuits
1997
Corpus ID: 62685443
The time interval measurement system of the WA-98 calorimeter is presented. This system consists of a constant fraction…
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1993
1993
Design of a self-testing and self-repairing structure for highly hierarchical ultra-large capacity memory chips
Tom Chen
,
G. Sunada
IEEE Transactions on Very Large Scale Integration…
1993
Corpus ID: 35948898
A memory architecture with the capability of self-testing and self-repairing is presented. The contributions of this memory…
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Highly Cited
1986
Highly Cited
1986
The FIS Electronics Troubleshooting System
F. Pipitone
Computer
1986
Corpus ID: 8090845
n recent years, escalating maintenance costs for electronic equipment and the increasing power of artificial intelligence methods…
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1981
1981
A fault-tolerant 30 ns/375 mW 16Kx1 NMOS static RAM
K. Hardee
,
R. Sud
IEEE Journal of Solid-State Circuits
1981
Corpus ID: 45968263
A fault-tolerant 30950 mil/SUP 2/ (19.9 mm/SUP 2/) 16K/spl times/1 static MOS RAM has been fabricated with a single polysilicon E…
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1976
1976
Techniques for testing the microcomputer family
William Barraclough
,
Albert
,
L. Chiang
,
Wayne Sohl
Proceedings of the IEEE
1976
Corpus ID: 27861825
This paper defines the microcomputer family in terms of random-access memories (RAM's) and the microprocessor unit (MPU…
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1975
1975
An experimental multiplier circuit based on superconducting Josephson devices
D. Herrell
IEEE Journal of Solid-State Circuits
1975
Corpus ID: 46041093
This paper describes the design, testing, and operation of a 4-bit multiplier circuit based on Josephson tunneling logic (JTL…
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