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Built-in test equipment

Known as: Bit (disambiguation), BITE, Bite (disambiguation) 
BITE is an acronym for built-in test equipment.The BITE is characterized primarily as a passive fault management and diagnosis built into airborne… 
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Related topics

Related topics

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Broader (1)

Avionics
Built-in self-testFly-by-wireLogic built-in self-testSoftware fault tolerance

Papers overview

Semantic Scholar uses AI to extract papers important to this topic.
Highly Cited
2009
Highly Cited
2009
On the standardization of thermal characterization of LEDs
Nowadays the demand for thermal standards for power LEDs is increasing. On the one hand metrics for fair comparison of competing… 
Highly Cited
2006
Highly Cited
2006
Challenges in thermal interface material testing
Characterization of thermal properties of thermal interface materials (TIMs) has gained increasing importance as the relative… 
Highly Cited
2004
Highly Cited
2004
SUITABILITY OF USING CALIFORNIA BEARING RATIO TEST TO PREDICT RESILIENT MODULUS
Resilient modulus (Mr) of subgrade is a very important factor in airport and highway pavement design and evaluation process… 
Highly Cited
2004
Highly Cited
2004
Proposed IEEE inertial systems terminology standard and other inertial sensor standards
A new inertial systems terminology standard is being developed by the IEEE/AESS Gyro and Accelerometer Panel for consideration by… 
Highly Cited
2001
Highly Cited
2001
Minimum expected cost-oriented optimal maintenance planning for deteriorating structures: application to concrete bridge decks
2000
2000
Digital serial communication device testing and its implications on automatic test equipment architecture
The rapid deployment of Gigabit differential signal I/O buffers in ASICs and other ICs for systems such as SONET, Firewire… 
Highly Cited
1997
Highly Cited
1997
A two-path bandpass /spl Sigma//spl Delta/ modulator for digital IF extraction at 20 MHz
  • A. OngB. Wooley
  • IEEE International Solids-State Circuits…
  • 1997
  • Corpus ID: 12776471
There is expanding interest in the possibility of moving the intermediate frequency (IF) signal processing in radio receivers and… 
1997
1997
An integrated CMOS time interval measurement system with subnanosecond resolution for the WA-98 calorimeter
The time interval measurement system of the WA-98 calorimeter is presented. This system consists of a constant fraction… 
1993
1993
Design of a self-testing and self-repairing structure for highly hierarchical ultra-large capacity memory chips
  • Tom ChenG. Sunada
  • IEEE Transactions on Very Large Scale Integration…
  • 1993
  • Corpus ID: 35948898
A memory architecture with the capability of self-testing and self-repairing is presented. The contributions of this memory… 
Review
1981
Review
1981
LSI logic testing — An overview
The development of large scale integration (LSI) testing is reviewed. The paper concentrates on the testing of logic components… 
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