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Logic built-in self-test

Known as: LBIST 
Logic built-in self-test (or LBIST) is a form of built-in self-test (BIST) in which hardware and/or software is built into integrated circuits… 
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Related topics

Related topics

12 relations
Analogue electronicsArray data structureBuilt-in self-testBuilt-in test equipment

Papers overview

Semantic Scholar uses AI to extract papers important to this topic.
2015
2015
Remotely Managed Logic Built-In Self-Test for Secure M2M Communications
A rapid growth of Machine-to-Machine (M2M) communications is expected in the coming years. M2M applications create new challenges… 
2012
2012
Techniques for Seed Computation and Testability Enhancement for Logic Built-In Self Test
With the increase of device complexity and test-data volume required to guarantee adequate defect coverage, external testing is… 
2011
2011
Logic Built-in Self-test
The last two chapters represented two DFT methods. Scan testing in Chap. 7 focused on testing inside a core (or the logic part… 
2010
2010
Logic built-in self-test system
The invention discloses a logic built-in self-test system. The system comprises a test vector generating system and a testing… 
2008
2008
Logic Built-In Self-Test for Core-Based Designs on System-on-a-Chip
System-on-a-chip (SoC) built with embedded IP cores offers attractive methodology design reuse, reconfigurability, and… 
2006
2006
Scalable deterministic logic built-in self test
The core-based design style of integrated circuits (ICs) helps to manage the development challenges brought by the ever… 
2006
2006
Testing embedded sequential cores in parallel using spectrum-based BIST
We present a new BIST (built-in-self-test) architecture for system-on-a-chip (SOC), which can test a cluster of embedded… 
1999
1999
Design and implementation of a parallel weighted random pattern and logic built in self test algorithm
An increase in chip densities has led to a significant increase in test generation and fault simulation times. Analysis of… 
1999
1999
Scaling deeper to submicron: on-line testing to the rescue
Summary form only given. Progress in technological scaling allows the integration into a single chip of hundreds of millions of… 
1998
1998
Modular logic built-in self-test for IP cores
  • J. RajskiJ. Tyszer
  • Proceedings International Test Conference (IEEE…
  • 1998
  • Corpus ID: 22838696
The paper presents a new modular logic BIST architecture for intellectual property (IF) cores and block-oriented design… 
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