Logic built-in self-test

Known as: LBIST 
Logic built-in self-test (or LBIST) is a form of built-in self-test (BIST) in which hardware and/or software is built into integrated circuits… (More)
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Topic mentions per year

Topic mentions per year

1996-2016
0102019962016

Papers overview

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2015
2015
A rapid growth of Machine-to-Machine (M2M) communications is expected in the coming years. M2M applications create new challenges… (More)
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2013
2013
This research article proposed a logic BIST using linear feedback shift register (LFSR) to generate low power test patterns; It… (More)
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2012
2012
With the increase of device complexity and test-data volume required to guarantee adequate defect coverage, external testing is… (More)
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2009
2009
The claim for new functionalities regarding the improvement of dependability of electronic systems and also the need for managing… (More)
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2009
2009
At-speed Logic BIST(Built-In Self-Test) has been embedded to the latest Cisco ASICs (Application Specific Integrated Circuit) and… (More)
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2006
2006
The core-based design style of integrated circuits (ICs) helps to manage the development challenges brought by the ever… (More)
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Highly Cited
2001
Highly Cited
2001
At-speed testing of gigahertz processors using external testers may not be technically and economically feasible. Hence, there is… (More)
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Highly Cited
2000
Highly Cited
2000
A common approach for large industrial designs is to use logic built-in self-test (LBIST) followed by test data from an external… (More)
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Highly Cited
1999
Highly Cited
1999
This paper discusses practical issues involved in applying logic built-in self-test (BIST) to four large industrial designs… (More)
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1996
1996
The trend of cramming more functionality onto a single chip poses alarming problems for testing and diagnosis. Complex chips such… (More)
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