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Logic built-in self-test

Known as: LBIST 
Logic built-in self-test (or LBIST) is a form of built-in self-test (BIST) in which hardware and/or software is built into integrated circuits… Expand
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Papers overview

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2011
2011
The last two chapters represented two DFT methods. Scan testing in Chap. 7 focused on testing inside a core (or the logic part… Expand
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2010
2010
The invention discloses a logic built-in self-test system. The system comprises a test vector generating system and a testing… Expand
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2009
2009
A system-on-a-chip (SoC) built with embedded intellectual property (IP) cores offers attractive methodology design reuse… Expand
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2007
2007
Excessive dynamic voltage drop in the power supply rails during test mode is known to result in false failures and impact yield… Expand
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2006
2006
The core-based design style of integrated circuits (ICs) helps to manage the development challenges brought by the ever… Expand
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Highly Cited
2001
Highly Cited
2001
  • Li Chen, Sujit Dey
  • IEEE Trans. on CAD of Integrated Circuits and…
  • 2001
  • Corpus ID: 603394
At-speed testing of gigahertz processors using external testers may not be technically and economically feasible. Hence, there is… Expand
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Highly Cited
2001
Highly Cited
2001
Originally developed decades ago, logic built-in self-test (BIST) evolved and is now increasingly being adopted to cope with… Expand
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1999
1999
An increase in chip densities has led to a significant increase in test generation and fault simulation times. Analysis of… Expand
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1998
1998
The paper presents a new modular logic BIST architecture for intellectual property (IF) cores and block-oriented design… Expand
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1996
1996
The trend of cramming more functionality onto a single chip poses alarming problems for testing and diagnosis. Complex chips such… Expand
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