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Analogue electronics
Known as:
Analog
, Analog electronics
, Analog circuit
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Analogue electronics (also spelled analog electronics) are electronic systems with a continuously variable signal, in contrast to digital electronics…
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Related topics
Related topics
50 relations
ASTAP
Analog computer
Analog signal
Analog signal processing
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Papers overview
Semantic Scholar uses AI to extract papers important to this topic.
2006
2006
Compact Modeling and Applications of CNTFETs for Analog and Digital Circuit Design
F. Prégaldiny
,
J. Kammerer
,
C. Lallement
13th IEEE International Conference on Electronics…
2006
Corpus ID: 19894371
This paper presents some case-studies of an emerging nano-device, the carbon nanotube field-effect transistor (CNT-FET). First…
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Highly Cited
2004
Highly Cited
2004
A dual-band 5.15-5.35-GHz, 2.4-2.5-GHz 0.18-/spl mu/m CMOS transceiver for 802.11a/b/g wireless LAN
K. Vavelidis
,
I. Vassiliou
,
+11 authors
N. Haralabidis
IEEE Journal of Solid-State Circuits
2004
Corpus ID: 370218
A single-chip dual-band 5.15-5.35-GHz and 2.4-2.5-GHz zero-IF transceiver for IEEE 802.11a/b/g WLAN systems is fabricated on a 0…
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Highly Cited
2001
Highly Cited
2001
A neuron adaptive detecting approach of harmonic current for APF and its realization of analog circuit
Qun Wang
,
N. Wu
,
Zhaoan Wang
IEEE Transactions on Instrumentation and…
2001
Corpus ID: 24856708
There have been a number of harmonic current detecting methods for the active power filter (APF), including the filtration…
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1999
1999
Using artificial neural networks or Lagrange interpolation to characterize the faults in an analog circuit: an experimental study
Y. Maiden
,
B. Jervis
,
P. Fouillat
,
S. Lesage
IEEE Transactions on Instrumentation and…
1999
Corpus ID: 7026848
A technique for diagnosing multiple faults in analog circuits from their impulse response function using a fault dictionary was…
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1996
1996
A novel test generation approach for parametric faults in linear analog circuits
H. Zheng
,
A. Balivada
,
J. Abraham
Proceedings of 14th VLSI Test Symposium
1996
Corpus ID: 3194376
While analog test generation tools are still in their infancy, the corresponding tools in the digital domain have reached a fair…
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Highly Cited
1993
Highly Cited
1993
Concurrent error detection and fault-tolerance in linear analog circuits using continuous checksums
A. Chatterjee
IEEE Transactions on Very Large Scale Integration…
1993
Corpus ID: 32756165
The problem of concurrent error detection and fault tolerance is studied. These checksums of time-varying functions are possible…
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1993
1993
Characterization of transistor mismatch for statistical CAD of submicron CMOS analog circuits
C. Abel
,
C. Michael
,
M. Ismail
,
C. Teng
,
R. Lahrio
IEEE International Symposium on Circuits and…
1993
Corpus ID: 37217408
The use of a four-parameter MOS model to characterize drain current mismatch is discussed. Guidelines for the accurate and…
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Highly Cited
1991
Highly Cited
1991
Interactive AC modeling and characterization of analog circuits via symbolic analysis
F. Fernández
,
Á. Rodríguez-Vázquez
,
J. L. Huertas
1991
Corpus ID: 62726572
An advanced symbolic analyzer, called ASAP, has been developed for the automatic ac modeling of analog integrated circuits. ASAP…
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Highly Cited
1981
Highly Cited
1981
Multiple-fault location of analog circuits
R. Biernacki
,
J. Bandler
1981
Corpus ID: 61662218
This paper deals with multiple-fault detection for linear analog circuits. The method proposed is based on measurements of…
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Highly Cited
1977
Highly Cited
1977
Symbolic analysis of analog and digital circuits
K. Singhal
,
J. Vlach
1977
Corpus ID: 110431228
An efficient computer method for symbolic analysis of linear analog and digital circuits is described. The tableau formulation is…
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