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Combinational logic

Known as: Combinatorial circuit, Combinational, Combinatorial logic (electronics) 
In digital circuit theory, combinational logic (sometimes also referred to as time-independent logic) is a type of digital logic which is implemented… 
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Related topics

Related topics

47 relations
Arithmetic logic unitAsynchronous circuitBinary decoderBoolean algebra

Broader (2)

Digital electronicsLogic in computer science

Papers overview

Semantic Scholar uses AI to extract papers important to this topic.
2000
2000
Simultaneous gate sizing and placement
This paper presents an iterative optimization technique for improving delay in integrated circuits. The basic idea is to perform… 
Highly Cited
1999
Highly Cited
1999
A test vector ordering technique for switching activity reduction during test operation
This paper considers the problem of testing VLSI integrated circuits without exceeding their power ratings during test. The… 
Highly Cited
1999
Highly Cited
1999
Low Power BIST by Filtering Non-Detecting Vectors
In this paper, two techniques to reduce the energy and the average power consumption of the system are proposed. They are based… 
Highly Cited
1999
Highly Cited
1999
Low-energy BIST design: impact of the LFSR TPG parameters on the weighted switching activity
Low-power design looks for low-energy BIST. This paper considers the problem of minimizing the energy required to test a BISTed… 
Highly Cited
1999
Highly Cited
1999
On calculating efficient LFSR seeds for built-in self test
Linear Feedback Shift Registers (LFSRs) are commonly used as pseudo-random test pattern generators (TPGs) in BIST schemes. This… 
1991
1991
A test-pattern-generation algorithm for sequential circuits
A deterministic test-pattern-generation algorithm for synchronous sequential circuits is presented. The algorithm, called… 
Highly Cited
1991
Highly Cited
1991
Performance trade-offs in a parallel test generation/fault simulation environment
Heuristics are proposed to partition faults for parallel test generation with minimization of both the overall run time and test… 
Highly Cited
1988
Highly Cited
1988
CONTEST: a concurrent test generator for sequential circuits
The application of a concurrent fault simulator to automatic test vector generation is described. As faults are simulated in the… 
Highly Cited
1981
Highly Cited
1981
Multiple Fault Testing of Large Circuits by Single Fault Test Sets
A general theory is presented in this paper to quantitatively predict the multiple fault coverage capability of single fault… 
1974
1974
Diagnosis of Short-Circuit Faults in Combinational Circuits
Most work on diagnosis of digital circuits has concentrated on the model of stuck-type faults. Although these faults are probably…