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Combinational logic
Known as:
Combinatorial circuit
, Combinational
, Combinatorial logic (electronics)
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In digital circuit theory, combinational logic (sometimes also referred to as time-independent logic) is a type of digital logic which is implemented…
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Related topics
Related topics
47 relations
Arithmetic logic unit
Asynchronous circuit
Binary decoder
Boolean algebra
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Broader (2)
Digital electronics
Logic in computer science
Papers overview
Semantic Scholar uses AI to extract papers important to this topic.
Highly Cited
2010
Highly Cited
2010
Design of AES S-box using combinational logic optimization
Nabihah Ahmad
,
Rezaul Hasan
,
W. M. Jubadi
IEEE Symposium on Industrial Electronics and…
2010
Corpus ID: 14073387
Advanced Encryption Standard (AES) is one of the most common symmetric encryption algorithms. The hardware complexity in AES is…
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Highly Cited
2002
Highly Cited
2002
An efficient test relaxation technique for combinational & full-scan sequential circuits
A. El-Maleh
,
Ali Al-Suwaiyan
Proceedings 20th IEEE VLSI Test Symposium (VTS )
2002
Corpus ID: 18691174
Reducing test data size is one of the major challenges in testing systems-on-a-chip. This problem can be solved by test…
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2000
2000
Ant Colony System for the Design of Combinational Logic Circuits
C. C. Coello
,
R. Gutierrez
,
B. M. García
,
A. H. Aguirre
International Conference on Evolvable Systems
2000
Corpus ID: 30291985
In this paper we propose an application of the Ant System (AS) to optimize combinational logic circuits at the gate level. We…
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Highly Cited
1999
Highly Cited
1999
A test vector ordering technique for switching activity reduction during test operation
P. Girard
,
L. Guiller
,
C. Landrault
,
S. Pravossoudovitch
Proceedings Ninth Great Lakes Symposium on VLSI
1999
Corpus ID: 31534073
This paper considers the problem of testing VLSI integrated circuits without exceeding their power ratings during test. The…
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Highly Cited
1999
Highly Cited
1999
Low Power BIST by Filtering Non-Detecting Vectors
S. Manich
,
A. Gabarró
,
+7 authors
Marcelino B. Santos
European Test Workshop (Cat. No.PR00390)
1999
Corpus ID: 17848007
In this paper, two techniques to reduce the energy and the average power consumption of the system are proposed. They are based…
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Highly Cited
1998
Highly Cited
1998
Using a single input to support multiple scan chains
Kuen-Jong Lee
,
Jih-Jeen Chen
,
Cheng-Hua Huang
International Conference on Computer Aided Design
1998
Corpus ID: 10563352
Single scan chain architectures suffer from long test application time, while multiple scan chain architectures require large pin…
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Highly Cited
1992
Highly Cited
1992
CRIS: A test cultivation program for sequential VLSI circuits
D. Saab
,
Y. Saab
,
J. Abraham
IEEE/ACM International Conference on Computer…
1992
Corpus ID: 10788365
An approach to cultivating a test for combinational and sequential VLSI circuits described hierarchically at the transistor, gate…
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Highly Cited
1992
Highly Cited
1992
E-PROOFS: A CMOS bridging fault simulator
G. S. Greenstein
,
J. Patel
IEEE/ACM International Conference on Computer…
1992
Corpus ID: 16461891
The problem of bridging fault simulation under the conventional voltage testing environment is considered. A method to provide…
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Highly Cited
1991
Highly Cited
1991
CAREL: Computer Aided Reliability Evaluator for Distributed Computing Networks
S. Soh
,
S. Rai
IEEE Trans. Parallel Distributed Syst.
1991
Corpus ID: 1132635
An efficient method to compute the terminal reliability (the probability of communication between a pair of nodes) of a…
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Highly Cited
1988
Highly Cited
1988
On the design of robust testable CMOS combinational logic circuits
S. Kundu
,
S. Reddy
[] The Eighteenth International Symposium on…
1988
Corpus ID: 29763411
The authors propose an integrated approach to the design of combinational logic circuits in which stuck-open faults and path…
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