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Probe card

A probe card is an interface between an electronic test system and a semiconductor wafer. Typically the probe card is mechanically docked to a prober… Expand
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Papers overview

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Highly Cited
2015
Highly Cited
2015
Selectorless crossbar arrays of resistive randomaccess memory (RRAM), also known as memristors, conduct large sneak currents… Expand
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Highly Cited
2011
Highly Cited
2011
Through-Silicon Via (TSV)-based 3D stacked ICs (SICs) are becoming increasingly important in the semiconductor industry, yet pre… Expand
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2010
2010
  • T. Hauck, W. Muller
  • 11th International Thermal, Mechanical & Multi…
  • 2010
  • Corpus ID: 31180667
Higher pin count and reduced pitch along with increased wafer size set new demands to fine pitch wafer probe technology. Vertical… Expand
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2009
2009
The traditionally wired interfaces of many electronic systems are in many applications being replaced by wireless interfaces… Expand
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2006
2006
2005
2005
Transmission line pulse (TLP) systems are mainly classified by their impedance, such as a 50- or 500-/spl Omega/ current source… Expand
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2004
2004
  • J. Rivoir
  • IEEE/CPMT/SEMI 29th International Electronics…
  • 2004
  • Corpus ID: 42304736
Today's manufacturers of high-volume consumer devices are under tremendous cost pressure and consequently under extreme pressure… Expand
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2004
2004
A MEMS probe card consisting of micro-springs arranged in 250-/spl mu/m-pitch array has been presented. Three-dimensional 'S… Expand
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Highly Cited
2002
Highly Cited
2002
For large, complex ICs, engineers need efficient techniques for debugging first silicon. The system presented here consists of an… Expand
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1996
1996
An active substrate silicon probe card employs a polyimide membrane formed on a silicon substrate. The probe card combines… Expand
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