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Probe card
A probe card is an interface between an electronic test system and a semiconductor wafer. Typically the probe card is mechanically docked to a prober…
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Related topics
Related topics
9 relations
Contact pad
Dynamic random-access memory
Flash memory
Microelectromechanical systems
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Broader (1)
Semiconductor device fabrication
Papers overview
Semantic Scholar uses AI to extract papers important to this topic.
2018
2018
Automatic Generation of In-Circuit Tests for Board Assembly Defects
Harm van Schaaijk
,
M. Spierings
,
E. Marinissen
International Test Conference in Asia
2018
Corpus ID: 52290874
The components and the solder joints that are made during assembly to hold components to their printed circuit board can suffer…
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2014
2014
Conversion card for testing probe card
Di Zhan
2014
Corpus ID: 196162936
Provided is a conversion card for testing a probe card. The conversion card comprises a plate body, and a plurality of first…
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2013
2013
Integrated microfluidic probe card, the system and method of use
Yi-Shao Liu
,
Fei-Long Lai
,
Chuang-Peng Zheng
,
Jun-Wen Zheng
2013
Corpus ID: 139422852
The present invention provides a biological field effect transistor (BioFET) test apparatus and processing method, system and…
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2009
2009
Reliability modeling of MEMS probe card with vertical guide
Bonghwan Kim
,
Sewan Park
,
K. Jung
,
Kyounghwan Na
,
E. Yoon
2009
Corpus ID: 110646067
In this paper, a reliability modeling of vertically guided cantilever type MEMS probe card is proposed. A reliability issues are…
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2007
2007
Probe assembly for probe card
대철 강
,
병희 전
2007
Corpus ID: 140236336
A probe assembly for the probe card is provided to conveniently and accurately assemble the probes using the slots of support…
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2006
2006
THE FISCAL AND ECONOMIC OUTLOOK
K. Henry
2006
Corpus ID: 155016577
2004
2004
EXPERIMENTER EFFECTS AND PSI PERFORMANCE USING A DIGITAL AUTOGANZFELD SYSTEM
M. Smith
,
L. Savva
2004
Corpus ID: 56293631
2002
2002
Device and method for cleaning of probe needles of a test probe device
S. Byun
,
I. Hwang
,
Joonhwan Ji
,
Byoung-Joo Kim
,
Hyung-Koo Kim
,
Hoyoul Lee
2002
Corpus ID: 140291762
Apparatus for cleaning a probe needle of a test probe device for an integrated circuit, comprising: a substantially flat hard…
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2001
2001
Ultra Low Current DC Characterization at the Wafer Level Application Note 4070-1 Agilent 4072 A Semiconductor Parametric Test System
2001
Corpus ID: 52885772
1998
1998
Probe (Probe) card (Card)
영희 이
1998
Corpus ID: 140778736
본 발명은 반도체 디바이스(DEVICE)의 회로 완성도를 웨이퍼(WAFER) 상태에서 전기적으로 양품 혹은 불량품으로 분류하기 위한 테스트(TEST) 과정에서 요구되는 각종 전기적인 신호를 자동테스트장비(ATE: Automatic…
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