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Contact pad

Known as: Pad 
Contact pads are designated surface areas of a printed circuit board or die of an integrated circuit. Possibilities to contact to pads include… 
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Related topics

Related topics

14 relations
Die (integrated circuit)Flip chipFootprint (electronics)Integrated circuit

Broader (1)

Electronic engineering

Papers overview

Semantic Scholar uses AI to extract papers important to this topic.
2016
2016
Scalable Row/Column Addressing of Silicon Photonic MEMS Switches
In this letter, we demonstrate a scalable addressing scheme for silicon photonic MEMS switches. For a crossbar architecture… 
2009
2009
State dependent properties of rail pads
A rail pad is one of the main components in ballasted railway track systems. It is inserted between the rail and the sleeper to… 
2009
2009
EMC-aware design on a microcontroller for automotive applications
In modern digital ICs, the increasing demand for performance and throughput requires operating frequencies of hundreds of… 
2008
2008
Fabrication and testing of a novel all-diamond neural probe for chemical detection and electrical sensing applications
Fabrication and testing of all-diamond probes for neural applications is reported for the first time. Instead of commonly used… 
2006
2006
Isolation of MEMS devices from package stresses by use of compliant metal interposers
Many classes of MEMS devices, such as those with resonant structures, capacitive readouts, and diaphragm elements, are sensitive… 
2005
2005
Applications of laser peening to titanium alloys
Laser peening is a production process to produce compressive residual stresses in Titanium to increase fatigue and fretting… 
2005
2005
The contact conductance on a molecular wire
2005
2005
On the use of the Choquet integral with fuzzy numbers in Multiple Criteria Decision Aiding
This paper presents a multiple criteria decision aiding approach in order to build a ranking on a set of alternatives. The… 
Highly Cited
2004
Highly Cited
2004
Carbon nanotube transistor operation at 2.6 Ghz
We present the first demonstration of single-walled carbon nanotube transistor operation at microwave frequencies. To measure the… 
2003
2003
TLP systems with combined 50- and 500-/spl Omega/ impedance probes and Kelvin probes
Transmission line pulse (TLP) systems are mainly classified by their impedance, such as a 50- or 500-/spl Omega/ current source… 
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