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Integrated circuit
Known as:
.25 process
, Chip technology
, IC chips
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Basically fam an integrated circuit or monolithic integrated circuit (also referred to as an IC, a chip, or a microchip) is a set of electronic…
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Related topics
Related topics
50 relations
555 timer IC
Analog multiplier
Apollo Guidance Computer
Computational geometry
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Papers overview
Semantic Scholar uses AI to extract papers important to this topic.
Highly Cited
2004
Highly Cited
2004
Nonvolatile memory based on solid electrolytes
M. Kozicki
,
C. Gopalan
,
Muralikrishnan Balakrishnan
,
Mira Park
,
M. Mitkova
Proceedings. IEEE Computational Systems…
2004
Corpus ID: 2884270
Programmable metallization cell (PMC) memory utilizes electrochemical control of nanoscale quantities of metal in thin films of…
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Review
2003
Review
2003
Electronics Below 10 nm
K. Likharev
2003
Corpus ID: 15153748
Highly Cited
1999
Highly Cited
1999
Printing Process Suitable for Reel-to-Reel Production of High-Performance Organic Transistors and Circuits
J. Rogers
,
Zhenan Bao
,
A. Makhija
,
P. Braun
Advances in Materials
1999
Corpus ID: 17100558
cause appropriate compounds now exist for many types of devices, research has expanded to include patterning methods that can…
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Highly Cited
1998
Highly Cited
1998
Transistor records of excitable neurons from rat brain
S. Vassanelli
,
P. Fromherz
1998
Corpus ID: 18401265
Field effect transistors form electrical junctions with excitable nerve cells from rat brain which are cultured on oxidized…
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Highly Cited
1997
Highly Cited
1997
The future of CMOS wireless transceivers
A. Abidi
,
A. Rofougaran
,
+4 authors
P. Chang
IEEE International Solids-State Circuits…
1997
Corpus ID: 24218210
Building blocks alone do not account for the current interest in CMOS for RF applications. The more compelling reason is the…
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Highly Cited
1993
Highly Cited
1993
Analog circuit testing based on sensitivity computation and new circuit modeling
Naim Ben-Hamida
,
B. Kaminska
International Test Conference
1993
Corpus ID: 206677470
Analog circuit testing is considered to be a very difficult task, due mainly to the lack of fault models and accessibility to…
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Highly Cited
1993
Highly Cited
1993
Concurrent error detection and fault-tolerance in linear analog circuits using continuous checksums
A. Chatterjee
IEEE Transactions on Very Large Scale Integration…
1993
Corpus ID: 32756165
The problem of concurrent error detection and fault tolerance is studied. These checksums of time-varying functions are possible…
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Review
1983
Review
1983
CEDAR: a large scale multiprocessor
D. Gajski
,
D. Kuck
,
D. Lawrie
,
A. Sameh
CARN
1983
Corpus ID: 2361679
This paper presents an overview of Cedar, a large scale multiprocessor being designed at the University of Illinois. This machine…
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Highly Cited
1982
Highly Cited
1982
The thin-film module as a high-performance semiconductor package
C. Ho
,
D. Chance
,
C. Bajorek
,
R. Acosta
1982
Corpus ID: 62213650
This paper discusses a multichip module for future VLSI computer packages on which an array of silicon chips is directly attached…
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Review
1980
Review
1980
Refractory Silicides of Titanium and Tantalum for Low-Resistivity Gates and Interconnects
S. Murarka
,
D. Fraser
,
A. K. Sinha
,
H. Levinstein
IEEE Journal of Solid-State Circuits
1980
Corpus ID: 47390358
A study of the refractory-gate metallization schemes had been undertaken to provide a low-resistivity metallization for LSI and…
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