Negative-bias temperature instability

Known as: Negative bias temperature instability 
Negative-bias temperature instability (NBTI) is a key reliability issue in MOSFETs. NBTI manifests as an increase in the threshold voltage and… (More)
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Topic mentions per year

Topic mentions per year

1999-2017
05019992017

Papers overview

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2016
2016
We present a detailed study of the threshold voltage (V<sub>t</sub>) instability of GaN n-MOSFETs under negative gate stress. We… (More)
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2012
2012
A negative-bias-temperature-instability (NBTI) monitor subcircuit is presented and implemented in 65-nm CMOS technology. The… (More)
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Highly Cited
2010
Highly Cited
2010
Based on vast experimental dataset obtained from different technologies (pure or nitrided SiO<inf>2</inf> and HK), we suggest… (More)
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Highly Cited
2009
Highly Cited
2009
Based on the established properties of the most commonly observed defect in amorphous oxides, the E&#x2032; center, we suggest a… (More)
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2008
2008
Negative bias temperature instability (NBTI) is a major degradation mechanism of PMOSFET devices. When the p-channel field effect… (More)
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Highly Cited
2006
Highly Cited
2006
Negative Bias Temperature Instability (NBTI) in PMOS transistors has become a significant reliability concern in present day… (More)
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2006
2006
At elevated temperatures, pMOS transistors show a considerable drift in fundamental device parameters such as the threshold… (More)
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Highly Cited
2004
Highly Cited
2004
A quantitative model is developed for the first time, that comprehends all the unique characteristics of NBTI degradation… (More)
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Highly Cited
2004
Highly Cited
2004
A systematic test methodology is presented that comprehends the impact of negative bias temperature instability on product… (More)
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Highly Cited
2003
Highly Cited
2003
PMOSFETs experiencing negative bias temperature instability (NBTI) recover after stress is removed. We show for the first time… (More)
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