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Negative-bias temperature instability

Known as: NBTI, Negative bias temperature instability 
Negative-bias temperature instability (NBTI) is a key reliability issue in MOSFETs. NBTI manifests as an increase in the threshold voltage and… 
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Related topics

Related topics

6 relations
ElectromigrationGate oxideHigh-temperature operating lifeTypes of physical unclonable function

Broader (2)

Electronic engineeringSemiconductor device fabrication

Papers overview

Semantic Scholar uses AI to extract papers important to this topic.
2013
2013
Insight into the multicomponent nature of negative bias temperature instability
A novel measurement technique is used to extract two physically distinct “permanent” (long lived on our experimental time scale… 
2012
2012
Correlation Between Oxide Trap Generation and Negative-Bias Temperature Instability
Evidence shows that substantial interface degradation under negative-bias temperature (NBT) stressing does not result in any… 
2010
2010
“Non-Hydrogen-Transport” Characteristics of Dynamic Negative-Bias Temperature Instability
It has been proposed that negative-bias temperature instability (NBTI) is driven by interface-state generation, rate limited by… 
2010
2010
Improvement of Negative Bias Temperature Instability by Stress Proximity Technique
The stress proximity technique (SPT) is found to improve negative bias temperature instability (NBTI) in p-channel metal-oxide… 
2008
2008
Toward Engineering Modeling of Negative Bias Temperature Instability
CONTENTS 14. 
2008
2008
Negative bias temperature instability on Si-passivated Ge-interface
Germanium pMOSFETs with silicon-passivated interface (Ge/Si/SiO<sub>2</sub>/HfO<sub>2</sub>) are investigated for negative bias… 
2007
2007
A Rigorous Study of Measurement Techniques for Negative Bias Temperature Instability
The active research conducted in the last couple of years demonstrates that negative bias temperature instability is one of the… 
2006
2006
TCAD Modeling of Negative Bias Temperature Instability
At elevated temperatures, pMOS transistors show a considerable drift in fundamental device parameters such as the threshold… 
2006
2006
Models of Source/Drain Bias on Negative Bias Temperature Instability
  • Z. GanC. Liao Y. Wong
  • 8th International Conference on Solid-State and…
  • 2006
  • Corpus ID: 13891390
This paper discusses the influence of source/drain (S/D) bias on negative bias temperature instability (NBTI) in pMOS devices. It… 
2005
2005
Impact of substrate bias on p-MOSFET negative bias temperature instability
The negative bias temperature instability (NBTI) of p-MOSFETs is an important reliability issue for digital as well as analog… 
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