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Negative-bias temperature instability

Known as: NBTI, Negative bias temperature instability 
Negative-bias temperature instability (NBTI) is a key reliability issue in MOSFETs. NBTI manifests as an increase in the threshold voltage and… Expand
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Highly Cited
2010
Highly Cited
2010
  • Vincent Huard
  • IEEE International Reliability Physics Symposium
  • 2010
  • Corpus ID: 22130813
Based on vast experimental dataset obtained from different technologies (pure or nitrided SiO2 and HK), we suggest that Negative… Expand
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Highly Cited
2010
Highly Cited
2010
We introduce a new method to analyze the statistical properties of the defects responsible for the ubiquitous recovery behavior… Expand
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Highly Cited
2009
Highly Cited
2009
Based on the established properties of the most commonly observed defect in amorphous oxides, the E′ center, we suggest a coupled… Expand
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Highly Cited
2007
Highly Cited
2007
One of the major reliability concerns in nanoscale very large-scale integration design is the time-dependent negative- bias… Expand
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Highly Cited
2007
Highly Cited
2007
Recent advances in experimental techniques (on-the- fly and ultrafast techniques) allow measurement of threshold voltage… Expand
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Highly Cited
2006
Highly Cited
2006
Negative bias temperature instability (NBTI) in PMOS transistors has become a significant reliability concern in present day… Expand
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Highly Cited
2004
Highly Cited
2004
A quantitative model is developed for the first time, that comprehends all the unique characteristics of NBTI degradation… Expand
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Highly Cited
2004
Highly Cited
2004
A systematic test methodology is presented that comprehends the impact of negative bias temperature instability on product… Expand
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Highly Cited
2003
Highly Cited
2003
PMOSFETs experiencing negative bias temperature instability (NBTI) recover after stress is removed. We show for the first time… Expand
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Highly Cited
1999
Highly Cited
1999
This paper presents a new reliability scaling scenario for CMOS devices with direct-tunneling ultra-thin gate oxide. Device… Expand
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