Electromigration

Known as: Electron wind, Metal migration 
Electromigration is the transport of material caused by the gradual movement of the ions in a conductor due to the momentum transfer between… (More)
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Topic mentions per year

Topic mentions per year

1952-2017
05010015019522016

Papers overview

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2011
2011
Electromigration (EM) is a critical problem for interconnect reliability of modern IC design, especially as the feature size… (More)
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2006
2006
Electromigration is increasingly relevant to the physical design of electronic circuits. It is caused by excessive current… (More)
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2005
2005
It has been demonstrated that, in those instances where electromigration-induced mass transport is dominated by interfacial… (More)
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2005
2005
Electromigration in interconnects is a major reliability concern for integrated circuits, which leads to aggressive design rules… (More)
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Review
2003
Review
2003
Today, the price of building a factory to produce submicron size electronic devices on 300 mm Si wafers is over billions of… (More)
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Highly Cited
2002
Highly Cited
2002
For the first time we describe a positive application of electromigration, as an electrically programmable fuse device (eFUSE… (More)
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1999
1999
  • Simeon J. Krumbein
  • 1999
Metallic electromigration can be defined as the movement of metallic material, usually through or across a nonmetallic medium… (More)
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Highly Cited
1999
Highly Cited
1999
A simple yet highly reproducible method to fabricate metallic electrodes with nanometer separation is presented. The fabrication… (More)
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1987
1987
Analytical expressions are derived for estimating the temperature profile along a straight-line resistor test structure due to… (More)
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1987
1987
The reproducibility of median-time-to-failure (t<inf>50</inf>) measurements was determined in an interlaboratory experiment in… (More)
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