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Electromigration

Known as: Electron wind, EM, Migration 
Electromigration is the transport of material caused by the gradual movement of the ions in a conductor due to the momentum transfer between… Expand
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Papers overview

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2017
2017
Abstract Nanofiltration performance as a function of feed temperature is relevant to several industrial settings including… Expand
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2016
2016
Electromigration (EM) in very large scale integration (VLSI) interconnects has become one of the major reliability issues for… Expand
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2015
2015
Electromigration (EM) has become a major power grid reliability problem in VLSI. In this paper, we first demonstrate that EM… Expand
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Highly Cited
2014
Highly Cited
2014
This paper presents a novel approach and techniques for physics-based electromigration (EM) assessment in power delivery networks… Expand
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Highly Cited
2013
Highly Cited
2013
Electromigration (EM) is one of the key concerns going forward for interconnect reliability in integrated circuit (IC) design… Expand
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2013
2013
Electromigration early failure void nucleation and growth phenomena were studied using large-scale, statistical analysis methods… Expand
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2013
2013
Reliability of solder joints under Electromigration (EM) and Thermomigration (TM) has drawn increasing attention in recent years… Expand
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Highly Cited
2010
Highly Cited
2010
Abstract The first reported work on electromigration (EM) was presented in 1959, and since then extensive studies on the EM are… Expand
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Highly Cited
2010
Highly Cited
2010
Pb-free solders have replaced Pb-containing SnPb solders in the electronic packaging industry due to environmental concerns. Both… Expand
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Highly Cited
1969
Highly Cited
1969
Two wear-out type failure modes involving aluminum metallization for semiconductor devices are described. Both modes involve mass… Expand
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