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High-temperature operating life
Known as:
HTOL
, High temperature operating life
High-temperature operating life (HTOL) is a reliability test applied to integrated circuits (ICs) to determine their intrinsic reliability. This test…
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Related topics
Related topics
15 relations
Boundary scan
Built-in self-test
Charge pump
Duty cycle
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Broader (1)
Reliability engineering
Papers overview
Semantic Scholar uses AI to extract papers important to this topic.
2017
2017
RRAM technology and its embedded potential on IoT applications
C. Ho
International Symposium on VLSI Design…
2017
Corpus ID: 35905418
A highly reliable, substrate independent, and cost-effective (2 extra-masks) HfO 2 -based Resistive-Random-Access-Memory (RRAM…
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Review
2017
Review
2017
Performance enhancement of a modular test system for power semiconductors for HTOL testing by use of an embedded system
R. Sleik
,
M. Glavanovics
,
Yevhen Nikitin
,
Marco Di Bernardo
,
A. Muetze
,
K. Krischan
EPE
2017
Corpus ID: 31112247
Today, performing life tests on power semiconductor devices is of major importance in industrial and automotive power…
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Review
2016
Review
2016
BTI induced dispersion: Challenges and opportunities for SRAM bit cell optimization
F. Cacho
,
A. Cros
,
X. Federspiel
,
V. Huard
,
C. Roma
IEEE International Reliability Physics Symposium
2016
Corpus ID: 32921471
One of major CMOS reliability concern for advanced nodes is the Bias Temperature Instability mechanism. In addition to the native…
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2015
2015
Reliability Prediction for Aerospace Electronics
J. Bernstein
2015
Corpus ID: 32708844
Abstract : This project presents a method for predicting the failure rate, and thus the reliability of an electronic system by…
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2014
2014
Advances in reliability and operation space of high-voltage GaN power devices on Si substrates
Y. Wu
,
J. Guerrero
,
J. McKay
,
K. Smith
IEEE Workshop on Wide Bandgap Power Devices and…
2014
Corpus ID: 6885464
GaN-on-Si power devices have advantages in both performance and the potential for low cost and high volume production. Advances…
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2006
2006
Effects of pre-bump probing and bumping processes on eutectic solder bump electromigration
K. Chen
,
J. D. Wu
,
K. Chiang
Microelectronics and reliability
2006
Corpus ID: 34912862
2006
2006
GaN-On-Si Reliability: A Comparative Study Between Process Platforms
S. Singhal
,
A. Chaudhari
,
+9 authors
K. Linthicum
[Reliability of Compound Semiconductors] ROCS…
2006
Corpus ID: 7592027
GaN-on-Si transistors are put through an extensive suite of reliability tests in order to accurately assess the drift…
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2001
2001
Exceeding 60-Year Life Expectancy from an Electronic Energy Meter
Natasha Wan
,
K. Manning
2001
Corpus ID: 110630771
2001
2001
Conversion of the under bump metallurgy into intermetallics: the impact on flip chip reliability
F. Stepniak
Microelectronics and reliability
2001
Corpus ID: 44740112
2000
2000
New Methods for Building-In and Improvement of Integrated Circuit Reliability : Application to High Volume Semiconductor Manufacturing
J. A. Pol
,
V. Der
2000
Corpus ID: 98630602
Over the past 30 years the reliability of semiconductor products has improved by a factor of 100 while at the same time the…
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