Hot-carrier injection

Known as: Hot carrier, Hot carriers injection, Hot-carrier cell 
Hot carrier injection (HCI) is a phenomenon in solid-state electronic devices where an electron or a “hole” gains sufficient kinetic energy to… (More)
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Papers overview

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2013
2013
Achieving high reliability across environmental variations and over aging in physical unclonable functions (PUFs) remains a… (More)
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2011
2011
In IIRW 2010, we presented new reliability stress methods (a.k.a. one ROW fast access) for dynamic random access memory (DRAM… (More)
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2009
2009
This paper discusses how hot carrier injection (HCI) can be exploited to create a trojan that will cause hardware failures. The… (More)
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2008
2008
Since the invention of NAND Flash memory in the 1980’s, non-volatile memory (NVM) has touched all aspects of our daily life… (More)
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2008
2008
In this letter, on-resistance (<i>R</i> <sub>on</sub>) degradation induced by hot-carrier injection in n-type lateral DMOS… (More)
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2004
2004
In this paper, hot-carrier effect in step-drift RF LDMOSFET is investigated. Due to the lower electric field close to the channel… (More)
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1986
1986
Short-channel length n-MOSFETs encapsulated by various passivation layers have been investigated from viewpoint of mechanical… (More)
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1985
1985
The high drain-effect transistor characteristic observed after hot-carrier injection and trapping in the oxide has been found to… (More)
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Highly Cited
1984
Highly Cited
1984
The lucky-electron concept is successfully applied to the modeling of channel hot-electron injection in n-channel MOSFET's… (More)
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Highly Cited
1983
Highly Cited
1983
An empirical model for device degradation due to hot-carrier injection in submicron n-channel MOSFET's is presented… (More)
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