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Deep-level trap
Known as:
Deep-level defect
, Trap
Deep-level traps or deep-level defects are a generally undesirable type of electronic defect in semiconductors. They are "deep" in the sense that the…
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Related topics
Related topics
6 relations
Copper interconnect
Doping (semiconductor)
Electron hole
Phosphor
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Papers overview
Semantic Scholar uses AI to extract papers important to this topic.
2016
2016
Effects of Localized Back-Surface Defects on Bulk and Front-Channel Conduction of Amorphous InGaZnO TFTs
Chih-Chieh Hsu
,
He-Ping Chen
,
Siang-Yu Wang
IEEE Transactions on Electron Devices
2016
Corpus ID: 19415783
This paper investigated physical mechanisms underlying the effects of localized back-surface defects (D<sub>loc</sub>) on the…
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2016
2016
A Simulation Study of Carrier Transport Affected by Local Defects in Amorphous InGaZnO Thin-Film Transistors
Chih-Chieh Hsu
,
Yu-Ting Chen
IEEE Transactions on Electron Devices
2016
Corpus ID: 43821587
This paper investigates effects of local defects on performances of amorphous-InGaZnO (a-IGZO) thin-film transistors (TFTs) by…
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2014
2014
First-principles study on the effects of the intrinsic defects in GaAs saturable absorber
Xiaoyang Ma
,
Dechun Li
,
Shengzhi Zhao
,
Wen Cong
,
Gui-qiu Li
,
Kejian Yang
Other Conferences
2014
Corpus ID: 136859810
First-principles calculations are performed for the effects of the intrinsic defects in GaAs saturable absorber, using the state…
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2014
2014
Properties of deep-level defect in Cu(In, Ga)Se 2 thin films
X. Hu
,
T. Sakurai
,
A. Yamada
,
S. Ishizuka
,
S. Niki
,
K. Akimoto
2014
Corpus ID: 73603922
The properties of the deep-level defect which locates at around 0.8 eV above the valence band in Cu(In, Ga)Se2 thin films with…
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2014
2014
Electric field assisted annealing and formation of prominent deep-level defect in ion-implanted n-type 4 HSi C
J. Wong-Leung
,
B. Svensson
2014
Corpus ID: 55042271
2013
2013
Spin-dependent electronic processes and long-lived spin coherence of deep-level trap sites in CdS nanocrystals
K. V. Schooten
,
Jing Huang
,
D. Talapin
,
C. Boehme
,
J. Lupton
2013
Corpus ID: 28178897
Carrier trapping in colloidal nanocrystals represents a major energy loss mechanism for excitonic states crucial to devices…
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2011
2011
Wpływ zawartości płytkich domieszek na właściwości i koncentrację głębokich centrów defektowych w monokryształach SiC. Praca doktorska = Effect shallow impurities on the properties and concentrations…
K. Michał
2011
Corpus ID: 137059146
2006
2006
Degradation induced by 2-MeV alpha particles on AlGaN/GaN high electron mobility transistors
F. Danesin
,
F. Zanon
,
+4 authors
A. Paccagnella
Microelectronics and reliability
2006
Corpus ID: 40235041
2004
2004
A control on the photoluminescence properties in P-passivated nanocrystalline ZnO films
Shijian Chen
,
Yichun Liu
,
+4 authors
Xiwu Fan
2004
Corpus ID: 55610772
1998
1998
Effect of a deep-level trap on hole transport in InAlAs/InGaAs metal-semiconductor-metal photodetectors
K.J. Lee
,
F. Johnson
,
Junghwan Kim
,
W. Johnson
,
C. Lee
Technical Digest. Summaries of Papers Presented…
1998
Corpus ID: 80860749
Summary form only given. InGaAs metal-semiconductor-metal (MSM) photodetectors with interdigital electrodes are promising for…
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