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Wafer testing

Known as: Wafer prober, Wafer sort 
Wafer testing is a step performed during semiconductor device fabrication. During this step, performed before a wafer is sent to die preparation, all… Expand
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Papers overview

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2018
2018
In semiconductor manufacturing, a wafer bin map (WBM) represents the results of wafer testing for dies using a binary pass or… Expand
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2018
2018
Semiconductor manufacturing is a complicated flexible job-shop scheduling problem (FJSP) of combinatorial complexity. Because of… Expand
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2011
2011
Wafer defect inspection is an important process that is performed before die packaging. Conventional wafer inspections are… Expand
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2010
2010
This paper presents a 120-GHz-band 10-Gbit/s quadrature phase-shift-keying (QPSK) modulator and demodulator. To reduce system… Expand
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2009
2009
This paper discusses a sophisticated backend capacitor mismatch characterization technique based on direct capacitance… Expand
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Highly Cited
2006
Highly Cited
2006
Foreword 2 Executive Summary 3 1. Introduction 4 • health inequalities were 'discovered' in the 19th century • unexpected… Expand
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Highly Cited
2002
Highly Cited
2002
A model describing the maximum clock frequency (FMAX) distribution of a microprocessor is derived and compared with wafer sort… Expand
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2001
2001
Previous studies have demonstrated both theoretically and empirically that defect density at wafer sort is an effective predictor… Expand
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1998
1998
The authors report record high temperature performance of a novel long wavelength vertical cavity laser using an electron barrier… Expand
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Highly Cited
1982
Highly Cited
1982
An x-ray source has been developed for total-dose irradiation testing of semiconductor electronic devices at the wafer stage of… Expand
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