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Wafer testing

Known as: Wafer prober, Wafer sort 
Wafer testing is a step performed during semiconductor device fabrication. During this step, performed before a wafer is sent to die preparation, all… 
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Related topics

Related topics

15 relations
Back end of lineBond characterizationCPU cacheChip-scale package

Papers overview

Semantic Scholar uses AI to extract papers important to this topic.
2013
2013
Reactivation of Spares for Off-Chip Memory Repair After Die Stacking in a 3-D IC With TSVs
Memory, especially DRAM, is one of the candidates to be considered in three-dimensional integrated circuit (3-D IC), and in… 
2012
2012
Testing of Copper Pillar Bumps for Wafer Sort
Using a copper pillar interconnect in flip chip packaging provides a lead-free solution that is more reliable, and also scalable… 
2012
2012
Exploring a solar photovoltaic-based energy solution for green manufacturing industry
A large amount of electricity is required to support the operation of large manufacturing facilities. Integrating renewable… 
2012
2012
Gain Measurement of Embedded On-Chip Antennas in mmW/THz Range
A method for gain measurement of embedded on-chip antennas in mmW/THz range is presented. In this method, the radiation pattern… 
2009
2009
High precision on-wafer backend capacitor mismatch measurements using a benchtop semiconductor characterization system
This paper discusses a sophisticated backend capacitor mismatch characterization technique based on direct capacitance… 
2006
2006
A non-volatile embedded memory for high temperature automotive and high-retention applications
A highly reliable and scalable non-volatile embedded memory cell and technology is described. This embedded technology operates… 
2004
2004
The challenge of testing RFID integrated circuits
  • D. Murfett
  • Proceedings. DELTA . Second IEEE International…
  • 2004
  • Corpus ID: 35250566
RFID integrated circuits often involve many of the most leading edge production technologies available today. The complexities… 
2002
2002
Defect printability analysis study using virtual stepper system in a production environment
In this paper the simulation of wafer images for Attenuated Phase Shift Masks (ATTPSM) and repaired binary masks are performed by… 
1998
1998
Double-fused 1.5 µm vertical cavity lasers with record high To of 132 K at room temperature
The authors report record high temperature performance of a novel long wavelength vertical cavity laser using an electron barrier… 
1992
1992
A 12-36 GHz MMIC 3dB Coplanar Waveguide Directional Coupler
For the first time, a multilayer coplanar waveguide (CPW) coupled-line 3dB directional coupler has been realised, by using two… 
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