Wafer testing

Known as: Wafer prober, Wafer sort 
Wafer testing is a step performed during semiconductor device fabrication. During this step, performed before a wafer is sent to die preparation, all… (More)
Wikipedia

Papers overview

Semantic Scholar uses AI to extract papers important to this topic.
2012
2012
Using a copper pillar interconnect in flip chip packaging provides a lead-free solution that is more reliable, and also scalable… (More)
  • figure 1
  • figure 3
  • figure 2
  • figure 4
  • figure 5
Is this relevant?
2011
2011
Gigascale integration (GSI) chips with high bandwidth, integrated optoelectronics (OE), and photonic components are an emerging… (More)
  • figure 1
  • figure 2
  • figure 3
  • figure 4
  • figure 5
Is this relevant?
Highly Cited
2009
Highly Cited
2009
Three-dimensional integrated circuit technology with through-silicon vias offers many advantages, including improved form factor… (More)
  • figure 1
  • figure 2
  • table I
  • table II
  • figure 4
Is this relevant?
2008
2008
Wafers, wafer cassettes, and probe cards are critical assets for wafer testing houses. Any mistake will cause tremendous damage… (More)
Is this relevant?
2007
2007
When testing IC chips using a wafer probe card, maintaining a low and stable contact resistance is essential. However, the… (More)
Is this relevant?
Review
2001
Review
2001
This paper surveys the state of RFIC wafer testing as performed on production floors today, and the trends and expectations for… (More)
  • figure 1
  • figure 2
  • figure 3
  • figure 4
  • table 1
Is this relevant?
1998
1998
A probabilistic diagnosis algorithm is presented for constant degree structures. The performance of the algorithm is analyzed… (More)
  • figure 1
  • figure 2
  • figure 3
  • table I
  • table II
Is this relevant?
1991
1991
The panel session had a theme "On-wafer Testing Issues f o r the 90's and Beyond." member on what they feel are some of the most… (More)
Is this relevant?
1990
1990
The MIMIC Phase I program2 has funded the development of test software that has been designed for automated testing of a broad… (More)
  • figure 2
  • figure 4
  • figure 7
  • figure 9
  • figure 10
Is this relevant?
1982
1982
An x-ray source has been developed for total-dose irradiation testing of semiconductor electronic devices at the wafer stage of… (More)
  • figure 1
  • figure 2
  • figure 3
  • figure 4
  • figure 5
Is this relevant?