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Wafer-scale integration
Known as:
WSI
, Wafer scale integration
Wafer-scale integration, WSI for short, is a rarely used system of building very-large integrated circuit networks that use an entire silicon wafer…
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Related topics
Related topics
11 relations
Elxsi
Integrated circuit
List of integrated circuit packaging types
Microprocessor
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Broader (1)
Semiconductor device fabrication
Papers overview
Semantic Scholar uses AI to extract papers important to this topic.
2015
2015
A 60 GHz single-chip 256-element wafer-scale phased array with EIRP of 45 dBm using sub-reticle stitching
S. Zihir
,
O. Gurbuz
,
A. Karroy
,
S. Raman
,
Gabriel M. Rebeiz
Radio Frequency Integrated Circuits Symposium
2015
Corpus ID: 15740096
This paper presents a 60 GHz wafer-scale transmit phased-array with 256-elements spaced λ/2 apart in the x and y directions, and…
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Highly Cited
2005
Highly Cited
2005
Processing Window Queries in Wireless Sensor Networks
Yingqi Xu
,
Wang-Chien Lee
,
Jianliang Xu
,
Gail Mitchell
2005
Corpus ID: 6989601
The existing query processing techniques for sensor networks rely on a network infrastructure for query propagation and data…
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1989
1989
A wafer scale integration neural network utilizing completely digital circuits
M. Yasunaga
,
N. Masuda
,
M. Asai
,
M. Yamada
,
A. Masaki
,
Y. Hirai
International Joint Conference on Neural…
1989
Corpus ID: 17037431
A wafer scale integration (WSI) neural network utilizing completely digital circuits is reported. Three new technologies are used…
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Highly Cited
1989
Highly Cited
1989
Modeling Defect Spatial Distribution
F. Meyer
,
D. Pradhan
IEEE Trans. Computers
1989
Corpus ID: 29822797
The center-satellite model for describing the distribution of defects on wafers is discussed. This model assigns each defect to a…
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1989
1989
Reconfiguration of VLSI/WSI Mesh Array Processors with Two-Level Redundancy
Mingshien Wang
,
M. Cutler
,
S. Su
IEEE Trans. Computers
1989
Corpus ID: 46270798
Reconfiguration schemes for replacing faulty cells (processing elements) with spare cells are introduced for massive parallel…
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Highly Cited
1988
Highly Cited
1988
Approaches for the repair of VLSI/WSI RRAMs by row/column deletion
F. Lombardi
,
Wei-Kang Huang
[] The Eighteenth International Symposium on…
1988
Corpus ID: 586804
The authors present two approaches for the repair of large random access memory (RAM) in which redundant rows and columns have…
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Highly Cited
1986
Highly Cited
1986
Yield and performance enhancement through redundancy in VLSI and WSI multiprocessor systems
I. Koren
,
D. Pradhan
Proceedings of the IEEE
1986
Corpus ID: 18436473
New challenges have been brought to fault-tolerant computing and processor architecture research because of developments in IC…
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Highly Cited
1985
Highly Cited
1985
A Wafer-Scale Digital Integrator Using Restructurable VSLI
J. Raffel
,
A. Anderson
,
+4 authors
P. Wyatt
IEEE Journal of Solid-State Circuits
1985
Corpus ID: 44974558
Wafer-scale integration has been demonstrated by fabricating a digital integrator on a monolithic 20-cm/sup 2/ silicon chip, the…
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1979
1979
Adaptive Wafer Scale Integration
Y. Hsia
,
G. Chang
,
F. Erwin
1979
Corpus ID: 62991433
Based on an in-situ electrical alterable nonvolatile semiconductor memory, the MNOS transistor, an adaptive interconnect is…
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Highly Cited
1978
Highly Cited
1978
Wafer-scale integration-a fault-tolerant procedure
R. Aubusson
,
I. Catt
IEEE Journal of Solid-State Circuits
1978
Corpus ID: 36425907
Considers a new approach to full-slice technology in relation to existing procedures for achieving this goal. Under external…
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