Tungsten disilicide
Papers overview
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2015
2015
- 2015 IEEE Regional Symposium on Micro and…
- 2015
This paper aims to study the effect of process parameter variation on a nano-scaled planar p-type MOSFET (metal-oxide… (More)
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Highly Cited
2013
Highly Cited
2013
- 2013
1 Single-photon detectors1 at near-infrared wavelengths with 2 high system detection efficiency (>90%), low dark count rate 3 (<1… (More)
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2013
2013
- CLEO: 2013
- 2013
We have developed 12-pixel arrays of fiber-coupled tungsten silicide superconducting nanowire single photon detectors and… (More)
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2013
2013
- 2013 Conference on Lasers & Electro-Optics Europe…
- 2013
There is increasing interest in using superconducting optical photon detectors in a variety of applications. These applications… (More)
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2005
2005
Tunable work function in fully nickel-silicided polysilicon gates for metal gate MOSFET applications
- IEEE Electron Device Letters
- 2005
The work function of fully nickel-silicided polysilicon was investigated. The midgap work function (4.7 eV) was obtained for… (More)
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2005
2005
- IEEE Transactions on Electron Devices
- 2005
A technology is described for fabricating SiGe heterojunction bipolar transistors (HBTs) on wafer-bonded silicon-on-insulator… (More)
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1998
1998
- European Workshop Materials for Advanced…
- 1998
Transition metal disilicides are of great interest due to their potential applications in microelectronic devices. Especially… (More)
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1997
1997
- European Workshop Materials for Advanced…
- 1997
Transition metal disilicides are of great interest due to their potential applications in microelectronic devices. Especially… (More)
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Highly Cited
1985
Highly Cited
1985
- IEEE Transactions on Electron Devices
- 1985
The propagation delay of interconnection lines is a major factor in determining the performance Of VLSI circuits because the RC… (More)
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Highly Cited
1982
Highly Cited
1982
- IEEE Transactions on Electron Devices
- 1982
Effect of scaling of dimensions, i.e., increase in chip size and decrease in minimum feature size, on the RC time delay… (More)
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