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Test point

Known as: Testpoint 
A test point is a location within an electronic circuit that is used to either monitor the state of the circuitry or to inject test signals. Test… 
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Related topics

Related topics

5 relations
Functional testing (manufacturing)Main distribution frameReference designatorSurface-mount technology

Papers overview

Semantic Scholar uses AI to extract papers important to this topic.
2015
2015
Sound absorption measurement of road surface with in situ technology
2004
2004
A new probing technique for high-speed/high-density printed circuit boards
  • K. Parker
  • International Conferce on Test
  • 2004
  • Corpus ID: 15681853
Bullock in 1987 [Bull87] provided design-for-test (DFT) rules for probing printed circuit boards for in-circuit testing. Many of… 
Highly Cited
2003
Highly Cited
2003
Point inversion and projection for NURBS curve and surface: Control polygon approach
Highly Cited
1999
Highly Cited
1999
Logic BIST for large industrial designs: real issues and case studies
This paper discusses practical issues involved in applying logic built-in self-test (BIST) to four large industrial designs… 
Highly Cited
1998
Highly Cited
1998
Improved methods for multivariate optimization of field development scheduling and well placement design
Optimization of reservoir development requires many evaluations of the possible combinations of the decision variables, such as… 
Highly Cited
1997
Highly Cited
1997
Using BIST control for pattern generation
A deterministic BIST scheme is presented which requires less hardware overhead than pseudo-random BIST but obtains better or even… 
Highly Cited
1996
Highly Cited
1996
Test point insertion based on path tracing
This paper presents an innovative method for inserting test points in the circuit-under-test to obtain complete fault coverage… 
Highly Cited
1995
Highly Cited
1995
Timing-driven test point insertion for full-scan and partial-scan BIST
We propose timing-driven test point insertion methods for a full-scan based BIST scheme and for a partial-scan based BIST scheme… 
1974
1974
Schematic classification problems and their solution
Highly Cited
1973
Highly Cited
1973
Enhancing Testability of Large-Scale Integrated Circuits via Test Points and Additional Logic
With the increasing complexity of logic that can be fabricated on a single large-scale integrated (LSI) circuit chip, there is a… 
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