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Test point

Known as: Testpoint 
A test point is a location within an electronic circuit that is used to either monitor the state of the circuitry or to inject test signals. Test… 
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Related topics

Related topics

5 relations
Functional testing (manufacturing)Main distribution frameReference designatorSurface-mount technology

Papers overview

Semantic Scholar uses AI to extract papers important to this topic.
2015
2015
Design of remotely located and multi-loop vibration controllers using a sequential loop closing approach
2014
2014
Development of parallel direct simulation Monte Carlo method using a cut-cell Cartesian grid on a single graphics processor
2014
2014
INL systematic reduced-test technique for Pipeline ADCs
This paper presents a procedure to implement a high efficient test of the Integral Non-linearity (INL) of Pipeline ADCs using an… 
2011
2011
Developing Quality Learning Materials for Effective Teaching and Learning in an ODL environment: Making the jump from print modules to online modules
This paper highlights the need to develop quality learning materials for effective teaching and learning in an online and… 
2008
2008
An Efficient Decision Tree Classification Method Based on Extended Hash Table for Data Streams Mining
This paper focuses on continuous attributes handling for mining data stream with concept drift. Data stream is an incremental… 
2007
2007
SPARTAN: a spectral and information theoretic approach to partial-scan
We propose a new partial-scan algorithm, the first to use toggling rates of the flip-flops (analyzed using DSP methods) and… 
2004
2004
A new probing technique for high-speed/high-density printed circuit boards
  • K. Parker
  • International Conferce on Test
  • 2004
  • Corpus ID: 15681853
Bullock in 1987 [Bull87] provided design-for-test (DFT) rules for probing printed circuit boards for in-circuit testing. Many of… 
2001
2001
RTL Design Validation, DFT and Test Pattern Generation for High Defects Coverage
The purpose of this paper is to present a RTL design and test methodology allowing the identification of design errors and… 
1999
1999
A systematic DFT procedure for library cells
We present an automated procedure for improving the testability of a product by improving the testability of cells in the cell… 
1991
1991
ATPG based on a novel grid-addressable latch element
The Crosscheck grid of sense and probe lines provides a convenient mechanism for addressing a large number of nodes in the… 
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