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Test point

Known as: Testpoint 
A test point is a location within an electronic circuit that is used to either monitor the state of the circuitry or to inject test signals. Test… 
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Related topics

Related topics

5 relations
Functional testing (manufacturing)Main distribution frameReference designatorSurface-mount technology

Papers overview

Semantic Scholar uses AI to extract papers important to this topic.
Highly Cited
2012
Highly Cited
2012
An affinity-based new local distance function and similarity measure for kNN algorithm
2012
2012
Augmented Data Transmission for the ATSC terrestrial DTV system
In this paper, we propose an Augmented Data Transmission (ADT) system which can transmit an additional data stream in the ATSC… 
2011
2011
Developing Quality Learning Materials for Effective Teaching and Learning in an ODL environment: Making the jump from print modules to online modules
This paper highlights the need to develop quality learning materials for effective teaching and learning in an online and… 
2007
2007
SPARTAN: a spectral and information theoretic approach to partial-scan
We propose a new partial-scan algorithm, the first to use toggling rates of the flip-flops (analyzed using DSP methods) and… 
2005
2005
Feasibility Assessment in Preliminary Design Using Pareto Sets
In this paper, we present the development and application of a Technical Feasibility Model (TFM) used in preliminary design to… 
2004
2004
A new probing technique for high-speed/high-density printed circuit boards
  • K. Parker
  • International Conferce on Test
  • 2004
  • Corpus ID: 15681853
Bullock in 1987 [Bull87] provided design-for-test (DFT) rules for probing printed circuit boards for in-circuit testing. Many of… 
Review
2003
Review
2003
Determining the Causes of Top-Down Cracks in Bituminous Pavements
Top down cracks (TDC) are longitudinal or transverse cracks that initiate at the pavement surface and propagate downward and… 
1999
1999
A systematic DFT procedure for library cells
We present an automated procedure for improving the testability of a product by improving the testability of cells in the cell… 
1991
1991
ATPG based on a novel grid-addressable latch element
The Crosscheck grid of sense and probe lines provides a convenient mechanism for addressing a large number of nodes in the… 
1977
1977
The acquisition of word meaning: An investigation of some current concepts
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