# Test point

## Papers overview

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2002

2002

- ITC
- 2002

Efficient production testing is frequently hampered because current digital circuits require test sets which are too large. Theseâ€¦Â (More)

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2001

Highly Cited

2001

- Neural Computation
- 2001

Suppose you are given some data set drawn from an underlying probability distribution P and you want to estimate a simple subsetâ€¦Â (More)

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Highly Cited

2000

Highly Cited

2000

- DAGM-Symposium
- 2000

We consider active data selection and test point rejection strategies for Gaussian process regression based on the variance ofâ€¦Â (More)

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2000

2000

- ITC
- 2000

Efficient productiontestingis frequentlyhamper ed because(coresin) currentcomplex digital circuit designsrequiretoolargetestsetsâ€¦Â (More)

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Highly Cited

1996

Highly Cited

1996

- VTS
- 1996

The set of test patterns applied to a circuit during built-in self-test (BIST) may not provide sufficiently high fault coverageâ€¦Â (More)

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1996

Highly Cited

1996

- ITC
- 1996

This paper presents a novel test point insertion technique which, unlike the previous ones, is based on a constructiveâ€¦Â (More)

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Highly Cited

1990

Highly Cited

1990

- 1990

3. Design for testability Â§ Basic principles Â§ Ad hoc solution, including test point insertion. Â§ Scan techniques, theory andâ€¦Â (More)

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1976

Highly Cited

1976

- STOC
- 1976

Given a subdivision of the plane induced by a planar graph with n vertices, in this paper we consider the problem of identifyingâ€¦Â (More)

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1974

1974

- IEEE Transactions on Computers
- 1974

The problem of selecting test points to reduce the number of tests for fault detection in combinational logic networks isâ€¦Â (More)

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1973

Highly Cited

1973

- IEEE Transactions on Computers
- 1973

With the increasing complexity of logic that can be fabricated on a single large-scale integrated (LSI) circuit chip, there is aâ€¦Â (More)

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