Test point

Known as: Testpoint 
A test point is a location within an electronic circuit that is used to either monitor the state of the circuitry or to inject test signals. Test… (More)
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Papers overview

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2002
2002
Efficient production testing is frequently hampered because current digital circuits require test sets which are too large. These… (More)
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Highly Cited
2001
Highly Cited
2001
Suppose you are given some data set drawn from an underlying probability distribution P and you want to estimate a simple subset… (More)
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Highly Cited
2000
Highly Cited
2000
We consider active data selection and test point rejection strategies for Gaussian process regression based on the variance of… (More)
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2000
2000
Efficient productiontestingis frequentlyhamper ed because(coresin) currentcomplex digital circuit designsrequiretoolargetestsets… (More)
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Highly Cited
1996
Highly Cited
1996
The set of test patterns applied to a circuit during built-in self-test (BIST) may not provide sufficiently high fault coverage… (More)
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Highly Cited
1996
Highly Cited
1996
This paper presents a novel test point insertion technique which, unlike the previous ones, is based on a constructive… (More)
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Highly Cited
1990
Highly Cited
1990
3. Design for testability § Basic principles § Ad hoc solution, including test point insertion. § Scan techniques, theory and… (More)
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Highly Cited
1976
Highly Cited
1976
Given a subdivision of the plane induced by a planar graph with n vertices, in this paper we consider the problem of identifying… (More)
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1974
1974
The problem of selecting test points to reduce the number of tests for fault detection in combinational logic networks is… (More)
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Highly Cited
1973
Highly Cited
1973
With the increasing complexity of logic that can be fabricated on a single large-scale integrated (LSI) circuit chip, there is a… (More)
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