SPARTAN: a spectral and information theoretic approach to partial-scan

@article{Khan2007SPARTANAS,
  title={SPARTAN: a spectral and information theoretic approach to partial-scan},
  author={Omar I. Khan and Michael L. Bushnell and Suresh Kumar Devanathan and Vishwani D. Agrawal},
  journal={2007 IEEE International Test Conference},
  year={2007},
  pages={1-10}
}
We propose a new partial-scan algorithm, the first to use toggling rates of the flip-flops (analyzed using DSP methods) and Shannon entropy measures of flip-flops to select flip-flops for scan. This improves the testability of the circuit-under-test (CUT). Entropy is maximized throughout the circuit to maximize the information flow (the principle of maximum entropy), which improves testability. We propose using partial-scan for testing, to maximize fault coverage (FC), reduce test volume (TV… CONTINUE READING

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