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Reliability (semiconductor)

Known as: Reliability, Reliability (semiconductor 
Reliability of semiconductor devices can be summarized as follows: 1. * Semiconductor devices are very sensitive to impurities and particles… 
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Related topics

Related topics

19 relations
Burn-inCleanroomDO-160Electromigration

Broader (1)

Semiconductor device fabrication

Papers overview

Semantic Scholar uses AI to extract papers important to this topic.
2015
2015
Synchronising the Speed of Innovation and Reliability
Audi’s semiconductor strategy – the Progressive SemiConductor Program (PSCP) – focuses in the area of “Robust Semiconductors” on… 
2014
2014
Reliability of different levels of cascaded H-Bridge inverter: An investigation and comparison
This paper presents the comparative analysis of reliability of different levels of cascaded H-Bridge inverter topologies. Failure… 
2014
2014
Improving Semiconductor Reliability with Advanced Engineering Methods in Test Program Development
Advancing semiconductor technology in combination with new assembly and packaging technologies are unfolding a new level of… 
2014
2014
Life estimation of analog IC based on accelerated degradation testing
For high reliability semiconductor analog ICs, it is difficult to estimate their lifetime by using traditional reliability… 
2013
2013
Chip-side-healing as a basis for robust bare-chip assemblies
  • M. SteiertJ. Wilde
  • IEEE 63rd Electronic Components and Technology…
  • 2013
  • Corpus ID: 39523467
During their life cycles, semiconductor devices are exposed to different mechanical loads as a result of assembly and packaging… 
Review
2010
Review
2010
Untersuchung neuartiger Konzepte zur geregelten Ansteuerung von IGBTs
The use of fast switching IGBTs in low voltage and medium voltage applications as well as energy transmission systems has to meet… 
2010
2010
Low Power Consumption Lasers for Next Generation Miniature Optical Spectrometers for Major Constituent and Trace Gas Analysis
The air quality of any manned spacecraft needs to be continuously monitored in order to safeguard the health of the crew. Air… 
2010
2010
Using SAT techniques in dynamic burn-in vector generation
Dynamic burn-in testing is an integral component of any test plan that seeks to produce reliable integrated circuits. Despite its… 
1986
1986
High-Reliability Semiconductor Lasers for Optical Communications
InGaAsP/InP buried heterostructure (BH) lasers emitting at 1.3 μm have continued to operate stably for more than 3.3 \times 10^{4… 
Review
1986
Review
1986
Invited Paper: Selection Procedures for High Reliability Semiconductor Lasers
This paper reviews the procedures we developed to select lasers for deployment in high reliability systems. The problem of… 
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