Burn-in

Known as: Burn in, Burn in mode 
Burn-in is the process by which components of a system are exercised prior to being placed in service (and often, prior to the system being… (More)
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Topic mentions per year

Topic mentions per year

1981-2018
051019812018

Papers overview

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2013
2013
Three-dimensional (3D) integration based on through-silicon-vias (TSVs) is rapidly gaining traction for industry adoption… (More)
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2012
2012
Bayesian inference provides a unifying framework for learning, reasoning, and decision making. Unfortunately, exact Bayesian… (More)
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2012
2012
The impact of Bias Temperature Instability stress and poststress high temperature anneal (bake) effects on the performance of… (More)
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2007
2007
Warranty is an important factor of marketing products; however, warranty always involves additional costs to the seller and these… (More)
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2007
2007
Product burn-in stresses are commonly performed on SRAM array to accelerate transistor failure mechanism and screen out weak SRAM… (More)
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2007
2007
Testing plays an important role in controlling and ensuring required quality and reliability of manufactured integrated circuits… (More)
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2006
2006
Yield and reliability are two key factors affecting costs and profits in the semiconductor industry. Stress testing is a… (More)
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2005
2005
A burn-in reduction screen is presented based on a subset of measurements from the wafer sort data. The subset of wafer sort data… (More)
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2004
2004
We consider Gibbs and block Gibbs samplers for a Bayesian hierarchical version of the one-way random effects model. Drift and… (More)
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Highly Cited
2002
Highly Cited
2002
In sub-micron CMOS processes, it has become increasingly difficult to identify and separate outliers from the intrinsic… (More)
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