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Burn-in
Known as:
Burn (disambiguation)
, Burn in
, Burn in mode
Burn-in is the process by which components of a system are exercised prior to being placed in service (and often, prior to the system being…
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Related topics
Related topics
13 relations
Bathtub curve
Burn-in oven
Computational phylogenetics
Electronic component
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Papers overview
Semantic Scholar uses AI to extract papers important to this topic.
Highly Cited
2016
Highly Cited
2016
Critical light instability in CB/DIO processed PBDTTT-EFT:PC71BM organic photovoltaic devices
Andrew J Pearson
,
Paul E. Hopkinson
,
E. Couderc
,
Konrad Domanski
,
M. Abdi‐Jalebi
,
N. Greenham
2016
Corpus ID: 55554947
Highly Cited
2008
Highly Cited
2008
Design and Operation of Power Converter for Microturbine Powered Distributed Generator with Capacity Expansion Capability
F. Pai
,
Shyh-Jier Huang
IEEE transactions on energy conversion
2008
Corpus ID: 34935950
In this paper, a novel approach for the design of power converter for a microturbine is proposed. In the method, a unified…
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2006
2006
A novel design of line-interactive uninterruptible power supplies without load current sensors
Fu-Sheng Pai
,
Shyh-Jier Huang
IEEE transactions on power electronics
2006
Corpus ID: 20569371
In this paper, a new approach for the design of line interactive uninterruptible power supplies (UPS) without load current…
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2004
2004
Study of aluminum nitride formation by superfine aluminum powder combustion in air
A. Gromov
,
V. Vereshchagin
2004
Corpus ID: 102331009
2001
2001
Thermoelectrical degradation processes in NTC thermistors for in-rush current protection of electronic circuits
O. Mrooz
,
A. Kovalski
,
+4 authors
J. Maciak
Microelectronics and reliability
2001
Corpus ID: 25172181
2001
2001
Current-Based Testing for Deep-Submicron VLSIs
M. Sachdev
IEEE Design & Test of Computers
2001
Corpus ID: 206449624
Current-based testing for deep-submicron VLSIs is important because of transistor sensitivity to defects as technology scales…
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Review
2000
Review
2000
Intrinsic leakage in deep submicron CMOS ICs-measurement-based test solutions
A. Keshavarzi
,
K. Roy
,
C. Hawkins
IEEE Transactions on Very Large Scale Integration…
2000
Corpus ID: 5270902
The high leakage current in deep submicron, short-channel transistors can increase the stand-by power dissipation of future IC…
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1996
1996
Identifying defects in deep-submicron CMOS ICs
J. Soden
,
C. Hawkins
,
A. Miller
IEEE spectrum
1996
Corpus ID: 12762133
With safety margins for reliability, test, failure analysis, and design verification shrinking, it would be a shame to give up…
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Highly Cited
1981
Highly Cited
1981
ENHANCED IGNITION FOR I.C. ENGINES WITH PREMIXED CHARGE
J. Dale
,
A. K. Oppenheim
1981
Corpus ID: 59371933
LBL-11880 Submitted for presentation at the Society of Automotive Engineers Annual Congress, Detroit, MI, February 1981 ENHANCED…
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1978
1978
New Concerns About Integrated Circuit Reliability
D. Peck
IEEE International Reliability Physics Symposium
1978
Corpus ID: 25443017
In order to make sure we have the infant-mortality problem in perspective, let us take a look at Fig. 9. This shows the typical…
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