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Polycide

Polycide is a silicide formed over polysilicon. Widely used in DRAMs. In a polycide MOSFET transistor process, the silicide is formed only over the… Expand
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Papers overview

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2014
2014
The use of a Pt-silicide-based contact interface has greatly reduced impact-induced energy loss in comb-driven resonant… Expand
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2008
2008
Code voting provides an appropriate technology to address the secure platform problem of remote Internet voting, but it is not… Expand
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2002
2002
Abstract An abnormal gate oxide failure was found in DRAM using deep submicron technology. Contrary to the general dielectric… Expand
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1997
1997
ABSTRACT Direct simulation Monte Carlo was used to study ion and neutral transport and reaction in a low-gas-pressure highplasma… Expand
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1997
1997
A new process for tungsten gate metal oxide semiconductor (MOS) capacitors has been developed using chemical vapor deposition… Expand
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1992
1992
Formation of low resistance p+ contact was the most difficult problem for Dual(n+/p+) Polycide Interconnect by which both n… Expand
1991
1991
The device degradation of dual-polycide-gate N/sup +//P/sup +/ CMOS polycide transistors due to the lateral diffusion of dopants… Expand
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1991
1991
The increase of the effective gate oxide thickness for W-polycide processes is studied. The samples with as-deposited and… Expand
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1989
1989
  • D. Amm, D. Levy, +4 authors G. Goltz
  • ESSDERC '89: 19th European Solid State Device…
  • 1989
  • Corpus ID: 36421257
The lateral diffusion of dopants in a TiSi2 salicide process was studied for various BPSG reflow RTP anneals. Lateral diffusion… Expand
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Highly Cited
1983
Highly Cited
1983
Low-pressure chemical vapor deposition of tungsten silicide has been done and the properties of the deposited films have been… Expand
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