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Nanoprobing

Nanoprobing is method of extracting device electrical parameters through the use of nanoscale tungsten wires, used primarily in the semiconductor… Expand
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Papers overview

Semantic Scholar uses AI to extract papers important to this topic.
2016
2016
  • C. Chen, P. T. Ng, +5 authors Z. Mai
  • IEEE 23rd International Symposium on the Physical…
  • 2016
  • Corpus ID: 11579617
As the semiconductor technology continues to scale, the stability and performance of embedded SRAM are growing concerns during… Expand
2015
2015
Automated program testing tools typically try to explore, and cover, as much of a tested program as possible, while attempting to… Expand
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2013
2013
This paper presents a microassembled robot called the Articulated Four Axes Microrobot (AFAM). Target application areas include… Expand
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2009
2009
For a number of years, in-die SRAM transistors have been successfully probed using direct current (dc) nanoprobing to reveal… Expand
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2008
2008
The thermal interaction between actively operated integrated circuits and applied characterization tools is one of the most… Expand
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2008
2008
This paper highlights the use of a localized probing technique, nanoprobing, to reveal some of the subtle defects affecting the… Expand
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2007
2007
Non-visual fails have become an ever present complication in the IC industry. Nano probing SRAM bit cells at the inverter level… Expand
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2007
2007
  • S. Toh, Z. Mai, +9 authors L. Hsia
  • 14th International Symposium on the Physical and…
  • 2007
  • Corpus ID: 15046150
Nanoprobing plays a crucial role for failure analysis (FA) in the nanometer-region generation nodes by having the capability to… Expand
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2006
2006
Quick and successful failure analysis is a key component for in-time realization and ramp-up of new products. The structure of… Expand
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2004
2004
Interfaces play a key role in the performance of electronic, optoelectronic and photovoltaic devices. Within epitaxial… Expand
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