FAQ

Nanoprobing

Nanoprobing is method of extracting device electrical parameters through the use of nanoscale tungsten wires, used primarily in the semiconductor… (More)
Wikipedia

Topic mentions per year

Topic mentions per year

1996-2016
051019962016

Related topics

Related topics

8 relations
Bit cellCMOSCurrent–voltage characteristicDie shrink
(More)

Broader (1)

Electronic engineering

Related mentions per year

Related mentions per year

1936-2018
1960198020002020
Nanoprobing
CMOS
Integrated circuit
Failure analysis
Electronic engineering
Static random-access memory

Papers overview

Semantic Scholar uses AI to extract papers important to this topic.
2015
2015
The BORG: Nanoprobing Binaries for Buffer Overreads
Automated program testing tools typically try to explore, and cover, as much of a tested program as possible, while attempting to… (More)
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2013
2013
Automated nanoprobing under scanning electron microscopy
Nanomanipulation inside electron microscopes enables a multitude of precision applications. The semiconductor industry employs… (More)
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2012
2012
Characteristics Variability Evaluation of Actual LSI Transistors with Nanoprobing
In this paper, we propose an evaluation method of characteristics variability of MOS transistors in an actual circuit with… (More)
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2011
2011
Profiling <formula formulatype="inline"><tex Notation="TeX">$\hbox{p}^{+}/\hbox{n}$</tex></formula>-Well Junction by Nanoprobing and Secondary Electron Potential Contrast
This letter investigates the use of secondary electron potential contrast (SEPC) with an in situ dynamic nanoprobing trigger to… (More)
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2009
2009
Nanoprobing SRAM Bit Cells with High-Speed Pulses
For a number of years, in-die SRAM transistors have been successfully probed using direct current (dc) nanoprobing to reveal… (More)
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2009
2009
Using nanoprobing and SEM doping contrast techniques for failure analysis of current leakage in CMOS HV technology
The method of substrate isolation in a typical CMOS HV technology with the addition of a deep nwell (DNW) is commonly applied in… (More)
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2008
2008
In-Depth Electrical Analysis to Reveal the Failure Mechanisms With Nanoprobing
This paper highlights the use of a localized probing technique, nanoprobing, to reveal some of the subtle defects affecting the… (More)
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2008
2008
Investigation of soft fail issue in sub-nanometer devices using nanoprobing technique
With the miniaturization of electronic devices, identifying the root cause of soft failures using physical failure analysis (PFA… (More)
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2007
2007
Use of Nanoprobing as the Diagnostic Tool for Nanoscaled Devices
Nanoprobing plays a crucial role for failure analysis (FA) in the nanometer-region generation nodes by having the capability to… (More)
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2006
2006
90nm technology SRAM soft fail analysis using nanoprobing and junction stain TEM
This article describes a 90nm technology SRAM soft fail analysis. The bitmaps of affected wafers show a large number of wafer… (More)
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