Nanoprobing

Nanoprobing is method of extracting device electrical parameters through the use of nanoscale tungsten wires, used primarily in the semiconductor… (More)
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Topic mentions per year

Topic mentions per year

1996-2016
051019962016

Papers overview

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2015
2015
Automated program testing tools typically try to explore, and cover, as much of a tested program as possible, while attempting to… (More)
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2013
2013
Nanomanipulation inside electron microscopes enables a multitude of precision applications. The semiconductor industry employs… (More)
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2012
2012
In this paper, we propose an evaluation method of characteristics variability of MOS transistors in an actual circuit with… (More)
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2011
2011
This letter investigates the use of secondary electron potential contrast (SEPC) with an in situ dynamic nanoprobing trigger to… (More)
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2009
2009
For a number of years, in-die SRAM transistors have been successfully probed using direct current (dc) nanoprobing to reveal… (More)
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2009
2009
The method of substrate isolation in a typical CMOS HV technology with the addition of a deep nwell (DNW) is commonly applied in… (More)
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2008
2008
This paper highlights the use of a localized probing technique, nanoprobing, to reveal some of the subtle defects affecting the… (More)
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2008
2008
With the miniaturization of electronic devices, identifying the root cause of soft failures using physical failure analysis (PFA… (More)
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2007
2007
Nanoprobing plays a crucial role for failure analysis (FA) in the nanometer-region generation nodes by having the capability to… (More)
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2006
2006
This article describes a 90nm technology SRAM soft fail analysis. The bitmaps of affected wafers show a large number of wafer… (More)
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