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Nanoprobing

Nanoprobing is method of extracting device electrical parameters through the use of nanoscale tungsten wires, used primarily in the semiconductor… 
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Related topics

Related topics

8 relations
Bit cellCMOSCurrent–voltage characteristicDie shrink

Broader (1)

Electronic engineering

Papers overview

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2017
2017
Application of Scanning Capacitance Microscopy on SOI device with wafer edge low yield pattern
2016
2016
Current imaging, EBIC/EBAC, and electrical probing combined for fast and reliable in situ electrical fault isolation
2016
2016
Applications of the pulsed current-voltage (I-V) and capacitance-voltage (C-V) techniques for high-resistive gates in MOSFETs
2015
2015
On-wafer probe station for microwave metrology at the nanoscale
A new generation of instrumentation is developed to address the challenge of on-wafer measurement of nanodevices in the microwave… 
2011
2011
Profiling $\hbox{p}^{+}/\hbox{n}$-Well Junction by Nanoprobing and Secondary Electron Potential Contrast
This letter investigates the use of secondary electron potential contrast (SEPC) with an in situ dynamic nanoprobing trigger to… 
2008
2008
In-Depth Electrical Analysis to Reveal the Failure Mechanisms With Nanoprobing
This paper highlights the use of a localized probing technique, nanoprobing, to reveal some of the subtle defects affecting the… 
2007
2007
Measuring Static Noise Margin of 65nm Node SRAMS using a 7-Positioner SEM Nanoprobing Technique
Non-visual fails have become an ever present complication in the IC industry. Nano probing SRAM bit cells at the inverter level… 
2007
2007
Use of Nanoprobing as the Diagnostic Tool for Nanoscaled Devices
Nanoprobing plays a crucial role for failure analysis (FA) in the nanometer-region generation nodes by having the capability to… 
2007
2007
Advance static random access memory soft fail analysis using nanoprobing and junction delineation transmission electron microscopy
Nanoprobing was used to analyze the soft cell failure of submicron static random access memory (SRAM) at cell level by means of a… 
2006
2006
Failure analyses for debug and ramp-up of modern IC's
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