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Nanoprobing

Nanoprobing is method of extracting device electrical parameters through the use of nanoscale tungsten wires, used primarily in the semiconductor… Expand
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8 relations
Bit cellCMOSCurrent–voltage characteristicDie shrink
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Broader (1)

Electronic engineering

Papers overview

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2016
2016
Nanoprobing on the SRAM static noise margin (SNM) soft fail analysis
As the semiconductor technology continues to scale, the stability and performance of embedded SRAM are growing concerns during… Expand
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2015
2015
The BORG: Nanoprobing Binaries for Buffer Overreads
Automated program testing tools typically try to explore, and cover, as much of a tested program as possible, while attempting to… Expand
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2014
2014
On-chip device and circuit diagnostics on advanced technology nodes by nanoprobing
It is becoming increasingly challenging for conventional failure analysis methods to identify the failure mechanism at circuit… Expand
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2011
2011
Profiling $\hbox{p}^{+}/\hbox{n}$-Well Junction by Nanoprobing and Secondary Electron Potential Contrast
This letter investigates the use of secondary electron potential contrast (SEPC) with an in situ dynamic nanoprobing trigger to… Expand
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2009
2009
Nanoprobing SRAM Bit Cells with High-Speed Pulses
For a number of years, in-die SRAM transistors have been successfully probed using direct current (dc) nanoprobing to reveal… Expand
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2009
2009
Using nanoprobing and SEM doping contrast techniques for failure analysis of current leakage in CMOS HV technology
The method of substrate isolation in a typical CMOS HV technology with the addition of a deep nwell (DNW) is commonly applied in… Expand
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2008
2008
In-Depth Electrical Analysis to Reveal the Failure Mechanisms With Nanoprobing
This paper highlights the use of a localized probing technique, nanoprobing, to reveal some of the subtle defects affecting the… Expand
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2007
2007
Use of Nanoprobing as the Diagnostic Tool for Nanoscaled Devices
Nanoprobing plays a crucial role for failure analysis (FA) in the nanometer-region generation nodes by having the capability to… Expand
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2007
2007
Advance static random access memory soft fail analysis using nanoprobing and junction delineation transmission electron microscopy
Nanoprobing was used to analyze the soft cell failure of submicron static random access memory (SRAM) at cell level by means of a… Expand
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2004
2004
Nanoprobing of semiconductor heterointerfaces: quantum dots, alloys and diffusion
Interfaces play a key role in the performance of electronic, optoelectronic and photovoltaic devices. Within epitaxial… Expand
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