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Nanoprobing

Nanoprobing is method of extracting device electrical parameters through the use of nanoscale tungsten wires, used primarily in the semiconductor… 
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Related topics

Related topics

8 relations
Bit cellCMOSCurrent–voltage characteristicDie shrink

Broader (1)

Electronic engineering

Papers overview

Semantic Scholar uses AI to extract papers important to this topic.
2017
2017
Application of Scanning Capacitance Microscopy on SOI device with wafer edge low yield pattern
2016
2016
Current imaging, EBIC/EBAC, and electrical probing combined for fast and reliable in situ electrical fault isolation
2015
2015
The BORG: Nanoprobing Binaries for Buffer Overreads
Automated program testing tools typically try to explore, and cover, as much of a tested program as possible, while attempting to… 
2013
2013
AFAM: An Articulated Four Axes Microrobot for Nanoscale Applications
This paper presents a microassembled robot called the Articulated Four Axes Microrobot (AFAM). Target application areas include… 
2010
2010
Automated four-point probe measurement of nanowires inside a scanning electron microscope
Nanomanipulation inside a scanning electron microscope (SEM) has been employed to maneuver and characterize nanomaterials… 
2008
2008
In-Depth Electrical Analysis to Reveal the Failure Mechanisms With Nanoprobing
This paper highlights the use of a localized probing technique, nanoprobing, to reveal some of the subtle defects affecting the… 
2008
2008
Advanced thermal failure analysis and reliability investigations - Industrial demands and related limitations
2007
2007
Measuring Static Noise Margin of 65nm Node SRAMS using a 7-Positioner SEM Nanoprobing Technique
Non-visual fails have become an ever present complication in the IC industry. Nano probing SRAM bit cells at the inverter level… 
2007
2007
Use of Nanoprobing as the Diagnostic Tool for Nanoscaled Devices
  • S. Toh, Z. Mai, L. Hsia
  • 14th International Symposium on the Physical and…
  • 2007
  • Corpus ID: 15046150
Nanoprobing plays a crucial role for failure analysis (FA) in the nanometer-region generation nodes by having the capability to… 
2006
2006
Failure analyses for debug and ramp-up of modern IC's
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