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Nanoprobing
Nanoprobing is method of extracting device electrical parameters through the use of nanoscale tungsten wires, used primarily in the semiconductor…Â
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Wikipedia
Topic mentions per year
Topic mentions per year
1996-2016
0
5
10
1996
2016
Related topics
Related topics
8 relations
Bit cell
CMOS
Current–voltage characteristic
Die shrink
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Broader (1)
Electronic engineering
Related mentions per year
Related mentions per year
1936-2018
1960
1980
2000
2020
Nanoprobing
CMOS
Integrated circuit
Failure analysis
Electronic engineering
Static random-access memory
Papers overview
Semantic Scholar uses AI to extract papers important to this topic.
2015
2015
The BORG: Nanoprobing Binaries for Buffer Overreads
Matthias Neugschwandtner
,
Paolo Milani Comparetti
,
István Haller
,
Herbert Bos
CODASPY
2015
Automated program testing tools typically try to explore, and cover, as much of a tested program as possible, while attempting to…Â
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2013
2013
Automated nanoprobing under scanning electron microscopy
Zheng Gong
,
Brandon K. Chen
,
Jun Liu
,
Yu Sun
2013 IEEE International Conference on Robotics…
2013
Nanomanipulation inside electron microscopes enables a multitude of precision applications. The semiconductor industry employs…Â
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2012
2012
Characteristics Variability Evaluation of Actual LSI Transistors with Nanoprobing
Munetoshi Fukui
,
Yasuhiko Nara
,
Junichi Fuse
2012 IEEE 21st Asian Test Symposium
2012
In this paper, we propose an evaluation method of characteristics variability of MOS transistors in an actual circuit with…Â
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2011
2011
Profiling <formula formulatype="inline"><tex Notation="TeX">$\hbox{p}^{+}/\hbox{n}$</tex></formula>-Well Junction by Nanoprobing and Secondary Electron Potential Contrast
Po-Tsun Liu
,
Jeng-Han Lee
IEEE Electron Device Letters
2011
This letter investigates the use of secondary electron potential contrast (SEPC) with an in situ dynamic nanoprobing trigger to…Â
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2009
2009
Nanoprobing SRAM Bit Cells with High-Speed Pulses
Richard E. Stallcup
,
Kanzan Inoue
2009
For a number of years, in-die SRAM transistors have been successfully probed using direct current (dc) nanoprobing to reveal…Â
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2009
2009
Using nanoprobing and SEM doping contrast techniques for failure analysis of current leakage in CMOS HV technology
Hung Sung Lin
,
Randy Wang
2009 16th IEEE International Symposium on the…
2009
The method of substrate isolation in a typical CMOS HV technology with the addition of a deep nwell (DNW) is commonly applied in…Â
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2008
2008
In-Depth Electrical Analysis to Reveal the Failure Mechanisms With Nanoprobing
S. L. Toh
,
P. K. Tan
,
+8 authors
Z. H. Mai
IEEE Transactions on Device and Materials…
2008
This paper highlights the use of a localized probing technique, nanoprobing, to reveal some of the subtle defects affecting the…Â
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2008
2008
Investigation of soft fail issue in sub-nanometer devices using nanoprobing technique
Erwin Hendarto
,
H. B. Lin
,
+4 authors
J. Lam
2008 15th International Symposium on the Physical…
2008
With the miniaturization of electronic devices, identifying the root cause of soft failures using physical failure analysis (PFA…Â
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2007
2007
Use of Nanoprobing as the Diagnostic Tool for Nanoscaled Devices
S. L. Toh
,
Z. H. Mai
,
+9 authors
L. C. Hsia
2007 14th International Symposium on the Physical…
2007
Nanoprobing plays a crucial role for failure analysis (FA) in the nanometer-region generation nodes by having the capability to…Â
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2006
2006
90nm technology SRAM soft fail analysis using nanoprobing and junction stain TEM
Gunnar Zimmermann
,
Stefan Müller
2006
This article describes a 90nm technology SRAM soft fail analysis. The bitmaps of affected wafers show a large number of wafer…Â
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