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Nanoprobing

Nanoprobing is method of extracting device electrical parameters through the use of nanoscale tungsten wires, used primarily in the semiconductor… Expand
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Related topics

Related topics

8 relations
Bit cellCMOSCurrent–voltage characteristicDie shrink
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Broader (1)

Electronic engineering

Papers overview

Semantic Scholar uses AI to extract papers important to this topic.
2016
2016
Nanoprobing on the SRAM static noise margin (SNM) soft fail analysis
  • C. Chen, P. T. Ng, +5 authors Z. Mai
  • IEEE 23rd International Symposium on the Physical…
  • 2016
    • Corpus ID: 11579617
As the semiconductor technology continues to scale, the stability and performance of embedded SRAM are growing concerns during… Expand
2015
2015
The BORG: Nanoprobing Binaries for Buffer Overreads
Automated program testing tools typically try to explore, and cover, as much of a tested program as possible, while attempting to… Expand
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2013
2013
AFAM: An Articulated Four Axes Microrobot for Nanoscale Applications
This paper presents a microassembled robot called the Articulated Four Axes Microrobot (AFAM). Target application areas include… Expand
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2009
2009
Nanoprobing SRAM Bit Cells with High-Speed Pulses
For a number of years, in-die SRAM transistors have been successfully probed using direct current (dc) nanoprobing to reveal… Expand
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2008
2008
Advanced thermal failure analysis and reliability investigations - Industrial demands and related limitations
The thermal interaction between actively operated integrated circuits and applied characterization tools is one of the most… Expand
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2008
2008
In-Depth Electrical Analysis to Reveal the Failure Mechanisms With Nanoprobing
This paper highlights the use of a localized probing technique, nanoprobing, to reveal some of the subtle defects affecting the… Expand
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2007
2007
Measuring Static Noise Margin of 65nm Node SRAMS using a 7-Positioner SEM Nanoprobing Technique
Non-visual fails have become an ever present complication in the IC industry. Nano probing SRAM bit cells at the inverter level… Expand
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2007
2007
Use of Nanoprobing as the Diagnostic Tool for Nanoscaled Devices
  • S. Toh, Z. Mai, +9 authors L. Hsia
  • 14th International Symposium on the Physical and…
  • 2007
    • Corpus ID: 15046150
Nanoprobing plays a crucial role for failure analysis (FA) in the nanometer-region generation nodes by having the capability to… Expand
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2006
2006
Failure analyses for debug and ramp-up of modern IC's
Quick and successful failure analysis is a key component for in-time realization and ramp-up of new products. The structure of… Expand
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2004
2004
Nanoprobing of semiconductor heterointerfaces: quantum dots, alloys and diffusion
Interfaces play a key role in the performance of electronic, optoelectronic and photovoltaic devices. Within epitaxial… Expand
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