Skip to search formSkip to main contentSkip to account menu

Memory tester

Known as: Memory test, Memory test software 
Memory testers are specialized test equipment used to test and verify memory modules typically in SIMM or DIMM configurations. It detects functional… 
Wikipedia (opens in a new tab)

Related topics

Related topics

14 relations
CD-ROMComputer hardwareDIMMFloppy disk

Broader (1)

Computer memory

Papers overview

Semantic Scholar uses AI to extract papers important to this topic.
Review
2012
Review
2012
Relevance processes in multiple document comprehension
We introduce the MD-TRACE model (for Multiple-Document Task-based Relevance Assessment and Content Extraction), a descriptive… 
Highly Cited
2009
Highly Cited
2009
High-Density Through Silicon Vias for 3-D LSIs
High density through silicon via (TSV) is a key in fabricating three-dimensional (3-D) large-scale integration (LSI). We have… 
Highly Cited
2006
Highly Cited
2006
Three-Dimensional Integration Technology Based on Wafer Bonding With Vertical Buried Interconnections
A three-dimensional (3-D) integration technology has been developed for the fabrication of a new 3-D shared-memory test chip… 
Review
2003
Review
2003
Firm Level Innovation and Productivity - is There a Common Story Across Countries?
Recent studies have documented extensive heterogeneity in firm performance within countries, and innovation has been found as an… 
Highly Cited
1999
Highly Cited
1999
On programmable memory built-in self test architectures
The design and architectures of a microcode-based memory BIST and programmable FSM-based memory BIST unit are presented. The… 
Highly Cited
1999
Highly Cited
1999
The influence of musical distraction of varying complexity on the cognitive performance of extroverts and introverts
This study examined the effects of complexity in background music on the performance of four cognitive tasks by extroverts and… 
Highly Cited
1999
Highly Cited
1999
The Rivermead Behavioural Memory Test - Extended Version
Review
1990
Review
1990
An overview of deterministic functional RAM chip testing
This paper presents an overview of deterministic functional RAM chip testing. Instead of the traditional ad-hoc approach toward… 
Review
1986
Review
1986
Digital logic testing and simulation
Highly Cited
1980
Highly Cited
1980
A memory test for longitudinal measurement of mild to moderate deficits.
By clicking accept or continuing to use the site, you agree to the terms outlined in our Privacy Policy (opens in a new tab), Terms of Service (opens in a new tab), and Dataset License (opens in a new tab)