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Memory tester

Known as: Memory test, Memory test software 
Memory testers are specialized test equipment used to test and verify memory modules typically in SIMM or DIMM configurations. It detects functional… 
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Related topics

Related topics

14 relations
CD-ROMComputer hardwareDIMMFloppy disk

Broader (1)

Computer memory

Papers overview

Semantic Scholar uses AI to extract papers important to this topic.
2012
2012
Electrospun shape memory film with reversible fibrous structure
A shape memory polymer film with a stable micro/nano-fibrous structure is prepared via electrospinning of a triethoxysilane end… 
Highly Cited
2012
Highly Cited
2012
Performance on the WMT, MSVT, and NV-MSVT in Children with Developmental Disabilities and in Adults with Mild Traumatic Brain Injury
In this chapter we will apply profile analysis to data from the Word Memory Test (WMT, Green, 2005 Green, Allen, & Astner, 1996… 
2003
2003
A transparent online memory test for simultaneous detection of functional faults and soft errors in memories
The Transparent Online Memory Test (TOMT) introduced here has been specifically developed for online testing of word-oriented… 
Highly Cited
2002
Highly Cited
2002
Embedded memory test and repair: infrastructure IP for SOC yield
  • Y. Zorian
  • Proceedings. International Test Conference
  • 2002
  • Corpus ID: 25951499
Today's system-on-chip typically embeds memory IP cores with very large aggregate bit count per SoC. This trend requires using… 
Highly Cited
2002
Highly Cited
2002
Personality and Memory in Old Age
We examined the impact of personality on episodic memory performance in a sample of 287 healthy adults aged 68-95 years… 
2002
2002
A current-sensed high-speed and low-power first-in-first-out memory using a wordline/bitline-swapped dual-port SRAM cell
First-in-first-out (FIFO) data storages are in great demand for telecommunication LSIs. This paper presents high-speed and low… 
2002
2002
Fault simulation and test algorithm generation for random accessmemories
The size and density of semiconductor memories is rapidly growing, making them increasingly harder to test. New fault models and… 
Highly Cited
2000
Highly Cited
2000
A built-in self-test and self-diagnosis scheme for embedded SRAM
Embedded memory test and diagnosis is becoming an important issue in system-on-chip (SOC) development. Direct access of the… 
Review
1990
Review
1990
An overview of deterministic functional RAM chip testing
This paper presents an overview of deterministic functional RAM chip testing. Instead of the traditional ad-hoc approach toward… 
1986
1986
A New Parallel Test Approach for Large Memories
Memory test times¿and thus test costs¿are increasing rapidly as the size of the memories grows each year. Testability techniques… 
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