Hsiao-Ping Lin

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Embedded memory test and diagnosis is becoming an important issue in system-on-chip (SOC) development. Direct access of the memory cores from the limited number of I/O pins is usually not feasible. Built-in self-diagnosis (BISD), which include built-in self-test (BIST), is rapidly becoming the most acceptable solution. We propose a BISD design and a fault(More)
System-on-chip (SOC) design methodology is becomingthe trend in the IC industry. Integrating reusable coresfrom multiple sources is essential in SOC design, and differentdesign-for-testability methodologies are usually requiredfor testing different cores. Another issue is test integration.The purpose of this paper is to present a hierarchicaltest scheme for(More)
A lane departure warning system is one of the emerging systems for reducing traffic accidents. LDWS is a system designed to warn a driver when the vehicle begins to move out of its lane boundaries on roads. Different techniques to implement LDWS have been surveyed. Implementation of LDWS on different platforms is studied. Refer ences
In this study, hydrogen sulfide (H(2)S) was removed from coal gas by red soil under high temperature in a fixed-bed reactor. Red soil powders were collected from the northern, center and southern of Taiwan. They were characterized by XRPD, porosity analysis and DCB chemical analysis. Results show that the greater sulfur content of LP red soils is attributed(More)
0272-1732/02/$17.00  2002 IEEE The advent of the core-based system-on-a-chip (SOC) and reuse methodologies enables integration of cores from different sources into a single chip. Compared with the traditional multichip system on a board, SOCs offer benefits including higher performance, lower power consumption, smaller size, and so on. Different types of(More)
In this paper we propose a novel built-in self-test (BIST) design for embedded SRAM cores. Our contribution includes a compact and efficient BIST circuit with diagnosis support and an automatic diagnostic system. The diagnosis module of our BIST circuit can capture the error syndromes as well as fault locations for the purposes of repair and fault/failure(More)
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