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Laser voltage prober

Known as: LVP 
The laser voltage probe (LVP) is a laser-based voltage and timing waveform acquisition system which is used to perform failure analysis on flip-chip… 
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Related topics

Related topics

4 relations
Failure analysisFlip chipWafer (electronics)

Broader (1)

Reliability engineering

Papers overview

Semantic Scholar uses AI to extract papers important to this topic.
Highly Cited
2019
Highly Cited
2019
Resource Allocation for Low-Latency Vehicular Communications: An Effective Capacity Perspective
Vehicular communications face a tremendous challenge in guaranteeing low latency for safety-critical information exchange due to… 
2017
2017
Smart infrastructure: an emerging frontier for multidisciplinary research
The irreversible marriage between digital technology and physical urban infrastructure has given rise to the concept of smart… 
Highly Cited
2017
Highly Cited
2017
Local derivative radial patterns: A new texture descriptor for content-based image retrieval
2014
2014
Revisiting Li3V2(PO4)3 as an anode – an outstanding negative electrode for high power energy storage devices
Monoclinic Li3V2(PO4)3 (LVP) has long been considered primarily as a cathode material for lithium-ion batteries (LIBs). However… 
2012
2012
From EBT to LVP, from 130nm to 28nm node, Internal Timing Characterization Evolution
Highly Cited
2011
Highly Cited
2011
Li3V2(PO4)3/C composite as an intercalation-type anode material for lithium-ion batteries
2010
2010
Ensemble Kalman Filter Data Assimilation in a 1D Numerical Model Used for Fog Forecasting
Because poor visibility conditions have a considerable influence on airport traffic, a need exists for accurate and updated fog… 
Highly Cited
2007
Highly Cited
2007
‘Large Igneous Provinces (LIPs)’: Definition, recommended terminology, and a hierarchical classification
2003
2003
CULTURAL TECHNIQUE INFLUENCES ON POST-HARVEST QUALITY OF ROCKET (ERUCA SATIVA MILL.)
Soilless culture system is a good technique of plant growth offering guarantees of quality to the current rocket (Eruca sativa… 
2000
2000
Time-resolved optical characterization of electrical activity in integrated circuits
If the rate of improvement in the performance of advanced silicon integrated circuits is to be sustained, new techniques for the… 
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