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Wafer (electronics)

Known as: Wafer (semiconductor), Semiconductor wafer, Thick film 
A wafer, also called a slice or substrate, is a thin slice of semiconductor material, such as a crystalline silicon, used in electronics for the… 
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Related topics

Related topics

50 relations
ARM architectureAirgap (microelectronics)Bow and warp of semiconductor wafers and substratesChemical vapor deposition

Papers overview

Semantic Scholar uses AI to extract papers important to this topic.
2014
2014
Electrical and Microstructural Analysis of Contact Formation on Lightly Doped Phosphorus Emitters Using Thick-Film Ag Screen Printing Pastes
Screen printing of the metallization of phosphorus diffused emitters is a well-established process for industrial silicon wafer… 
2010
2010
Hybrid Silicon Lasers: The Final Frontier to Integrated Computing
Silicon photonics may revolutionize the 21st century by bringing together two technological areas that transformed the 20th… 
2008
2008
Exploring the Silicon Design Limits of Thin Wafer IGBT Technology: The Controlled Punch Through (CPT) IGBT
The paper introduces a new controlled punch through (CPT) IGBT buffer for next generation devices, which utilise thin wafers… 
2006
2006
Polymer Optical Interconnects—A Scalable Large-Area Panel Processing Approach
A flexible approach to producing optical interconnects on 609.6$ast ,$609.6 mm large-area panels is demonstrated. Stepwise… 
Highly Cited
1999
Highly Cited
1999
Electron mobility in extremely thin single-gate silicon-on-insulator inversion layers
Inversion-layer mobility has been investigated in extremely thin silicon-on-insulator metal–oxide–semiconductor field-effect… 
1999
1999
Boron-related minority-carrier trapping centers in p-type silicon
Photoconductivity-based measurements of recombination lifetimes in multicrystalline silicon are often hampered by carrier… 
Highly Cited
1994
Highly Cited
1994
A Vector Corrected High Power On-Wafer Measurement System with a Frequency Range for the Higher Harmomcs up to 40 GHz
A high power on-wafer measurement system based on the new microwave transition analyzer (MTA) HP 71500A has been developed for… 
Highly Cited
1991
Highly Cited
1991
Low surface resistance in YBa2Cu3Ox melt-processed thick films
A LOWsurface resistance,Rs, is the key to successful development of radio-frequency and microwave applications of high… 
1989
1989
Research and development of miniaturized electrets
A description is given of the realization of small electrets, using techniques generally applied in the fabrication of integrated… 
Highly Cited
1980
Highly Cited
1980
Acoustic Microscopy Applied to SAW Dispersion and Film Thickness Measurement
Abstruct-The reflection acoustic microscope has been used for the first time to measure the dispersion of surface acoustic waves…