Skip to search formSkip to main contentSkip to account menu

Device under test

Known as: Unit under test, Uut (disambiguation), Equipment under test 
Device under test (DUT), also known as equipment under test (EUT) and unit under test (UUT), is a term used to refer to a manufactured product… 
Wikipedia (opens in a new tab)

Related topics

Related topics

23 relations
Bead probe technologyBit error rateCurrent injection techniqueDUT board

Broader (2)

Electronic engineeringSemiconductor device fabrication

Papers overview

Semantic Scholar uses AI to extract papers important to this topic.
2011
2011
A General Model for Start-Up Demonstration Tests
The commonly known consecutive successes total failures (CSTF) start-up demonstration test procedure is generalized to a total… 
2011
2011
Offline track reconstruction and DUT analysis software
The final EUDET beam test telescope was equipped with Mimosa-26 sensors. the large pixel number per sensor along with higher… 
2010
2010
A New Start-Up Demonstration Test
The commonly known consecutive successes total failures (CSTF) start-up demonstration test procedure is improved to a total… 
2009
2009
Design of the Switching Controller for the High-Capacity Non-Blocking Internet Router
The sequential greedy scheduling (SGS) algorithm is a scalable maximal matching algorithm. This algorithm was conceptually… 
2009
2009
A Physical De-embedding Method for Silicon-based Device Applications
In the recent years, de-embedding method of \open-short", and \open-thru" with dummy DUTs are mostly used for on-wafer devices… 
2008
2008
Ring oscillator circuit structures for measurement of isolated NBTI/PBTI effects
Simple ring-oscillator circuit has been used to estimate the degradation in circuit performance due to negative bias temperature… 
Review
2007
Review
2007
Improved Static Testing of A/D Converters for DC Measurements
A new method is presented for the calibration and the linearity testing of analog-to-digital converters (ADCs) and dc digital… 
2004
2004
RF Testing on a Mixed Signal Tester
In this paper, testing of radio frequency (RF) devices with mixed-signal testers is discussed. General purpose automatic test… 
1986
1986
Accumulator Compression Testing
A new test data reduction technique called accumulator compression testng (ACT) is proposed. ACT is an extension of syndrome… 
Highly Cited
1986
Highly Cited
1986
The FIS Electronics Troubleshooting System
n recent years, escalating maintenance costs for electronic equipment and the increasing power of artificial intelligence methods… 
By clicking accept or continuing to use the site, you agree to the terms outlined in our Privacy Policy (opens in a new tab), Terms of Service (opens in a new tab), and Dataset License (opens in a new tab)