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Device under test

Known as: Unit under test, Uut (disambiguation), Equipment under test 
Device under test (DUT), also known as equipment under test (EUT) and unit under test (UUT), is a term used to refer to a manufactured product… 
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Related topics

Related topics

23 relations
Bead probe technologyBit error rateCurrent injection techniqueDUT board

Broader (2)

Electronic engineeringSemiconductor device fabrication

Papers overview

Semantic Scholar uses AI to extract papers important to this topic.
2010
2010
Efficiency-Improved High-Voltage Analog Power Amplifier for Driving Piezoelectric Actuators
A novel high-voltage analog power amplifier derived from a well-known complementary class B amplifier is presented in this paper… 
2009
2009
A Physical De-embedding Method for Silicon-based Device Applications
In the recent years, de-embedding method of \open-short", and \open-thru" with dummy DUTs are mostly used for on-wafer devices… 
2008
2008
Ring oscillator circuit structures for measurement of isolated NBTI/PBTI effects
Simple ring-oscillator circuit has been used to estimate the degradation in circuit performance due to negative bias temperature… 
2007
2007
Obtaining TLP-like information from an HBM simulator
Obtaining TLP-type data from properly instrumented HBM systems is demonstrated. Parameters similar to those extracted by TLP are… 
2006
2006
Development of hyperspectral image projectors
We present design concepts for calibrated hyperspectral image projectors (HIP) and related sources intended for system-level… 
2006
2006
Spectral Prediction for Specification-Based Loopback Test of Embedded Mixed-Signal Circuits
A traditional specification-based core-level test method is no longer attractive in testing deeply embedded analog and mixed… 
2005
2005
Unification of double-delay and SOC electromagnetic deembedding
Double-delay and short open calibration (SOC) deembedding are both useful for deembedding the results of a gap voltage source… 
1991
1991
Comparison of controller designs for an experimental flexible structure
Control system design and hardware testing are addressed for an experimental structure displaying the characteristics of a… 
Highly Cited
1986
Highly Cited
1986
The FIS Electronics Troubleshooting System
n recent years, escalating maintenance costs for electronic equipment and the increasing power of artificial intelligence methods… 
1986
1986
Accumulator Compression Testing
A new test data reduction technique called accumulator compression testng (ACT) is proposed. ACT is an extension of syndrome… 
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