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Device under test
Known as:
Unit under test
, Uut (disambiguation)
, Equipment under test
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Device under test (DUT), also known as equipment under test (EUT) and unit under test (UUT), is a term used to refer to a manufactured product…
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Related topics
Related topics
23 relations
Bead probe technology
Bit error rate
Current injection technique
DUT board
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Broader (2)
Electronic engineering
Semiconductor device fabrication
Papers overview
Semantic Scholar uses AI to extract papers important to this topic.
2010
2010
A New Start-Up Demonstration Test
A. Gera
IEEE Transactions on Reliability
2010
Corpus ID: 1613707
The commonly known consecutive successes total failures (CSTF) start-up demonstration test procedure is improved to a total…
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2008
2008
Ring oscillator circuit structures for measurement of isolated NBTI/PBTI effects
Jae-Joon Kim
,
R. Rao
,
S. Mukhopadhyay
,
C. Chuang
IEEE International Conference on Integrated…
2008
Corpus ID: 18462663
Simple ring-oscillator circuit has been used to estimate the degradation in circuit performance due to negative bias temperature…
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2007
2007
Obtaining TLP-like information from an HBM simulator
E. Grand
,
M. Hernandez
Electrical Overstress/Electrostatic Discharge…
2007
Corpus ID: 29206933
Obtaining TLP-type data from properly instrumented HBM systems is demonstrated. Parameters similar to those extracted by TLP are…
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2006
2006
Development of hyperspectral image projectors
J. Rice
,
S. Brown
,
J. Neira
SPIE Optics + Photonics
2006
Corpus ID: 121641235
We present design concepts for calibrated hyperspectral image projectors (HIP) and related sources intended for system-level…
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Review
2002
Review
2002
New paradigm for signal paths in ATE pin electronics are needed for serialcom device testing
Masashi Shimanouchi
Proceedings. International Test Conference
2002
Corpus ID: 42081870
Signal paths in ATE pin electronics need a fresh examination in order to address the challenges of serial data communication…
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1991
1991
Comparison of controller designs for an experimental flexible structure
K. B. Lim
,
P. Maghami
,
S. M. Joshi
IEEE Control Systems
1991
Corpus ID: 47572556
Control system design and hardware testing are addressed for an experimental structure displaying the characteristics of a…
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1991
1991
A Comparison of Controller Designs for an Experimental Flexible Structure
K. B. Lim
,
P. Maghami
,
S. M. Joshi
American Control Conference
1991
Corpus ID: 25025679
This paper addresses control systems design and hardware testing for an experimental structure that displays the characteristics…
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Highly Cited
1987
Highly Cited
1987
A Unified View of Test Compression Methods
John P. Robinson
,
N. Saxena
IEEE transactions on computers
1987
Corpus ID: 5137854
A unified treatment of the various techniques to reduce the output data from a unit under test is given. The characteristics of…
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Highly Cited
1986
Highly Cited
1986
The FIS Electronics Troubleshooting System
F. Pipitone
Computer
1986
Corpus ID: 8090845
n recent years, escalating maintenance costs for electronic equipment and the increasing power of artificial intelligence methods…
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1979
1979
Automatic Visual Inspection Of Printed Circuit Boards
R. Chin
,
C. Harlow
,
Samuel J. Dwyer III
Optics & Photonics
1979
Corpus ID: 109897436
A description of research work on the automatic visual inspection of printed circuit boards is presented as an example of a…
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