Device under test

Known as: Unit under test, Uut (disambiguation), Equipment under test 
Device under test (DUT), also known as equipment under test (EUT) and unit under test (UUT), is a term used to refer to a manufactured product… (More)
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Topic mentions per year

Topic mentions per year

1967-2017
010020019672017

Papers overview

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2010
2010
Despite their small size, analog/mixed-signal circuits start with an extensive set of parameters to test for. During production… (More)
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Highly Cited
2007
Highly Cited
2007
There are mainly two factors responsible for rapidly escalating production test costs of today's RF and high-speed analog… (More)
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2007
2007
The challenge of verifying a modern microprocessor design is an overwhelming one: Increasingly complex microarchitectures… (More)
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Highly Cited
2006
Highly Cited
2006
Unit test cases are focused and efficient. System tests are effective at exercising complex usage patterns. Differential unit… (More)
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Highly Cited
2006
Highly Cited
2006
Unit testing, a common step in software development, presents a challenge. When produced manually, unit test suites are often… (More)
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2004
2004
Semiconductor devices typically are tested a number of times during the manufacturing process. Temperature control of the devices… (More)
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Highly Cited
2002
Highly Cited
2002
Production test costs for today's RF circuits arerapidly escalating. Two factors are responsible for thiscost escalation: (a) the… (More)
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Highly Cited
2000
Highly Cited
2000
We present Ketchum, a tool that was developed to improve the productivity of simulation-based functional verification by… (More)
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Highly Cited
1998
Highly Cited
1998
Power and ground planes should exhibit low impedance over a wide range of frequencies. Parallel ground and power planes in… (More)
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Highly Cited
1996
Highly Cited
1996
This document discusses and defines a number of tests that may be used to describe the performance characteristics of a network… (More)
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