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Device under test
Known as:
Unit under test
, Uut (disambiguation)
, Equipment under test
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Device under test (DUT), also known as equipment under test (EUT) and unit under test (UUT), is a term used to refer to a manufactured product…
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Related topics
Related topics
23 relations
Bead probe technology
Bit error rate
Current injection technique
DUT board
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Broader (2)
Electronic engineering
Semiconductor device fabrication
Papers overview
Semantic Scholar uses AI to extract papers important to this topic.
2011
2011
A General Model for Start-Up Demonstration Tests
A. Gera
IEEE Transactions on Reliability
2011
Corpus ID: 33771592
The commonly known consecutive successes total failures (CSTF) start-up demonstration test procedure is generalized to a total…
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2009
2009
A Physical De-embedding Method for Silicon-based Device Applications
Hsiao-Tsung Yen
,
Tzu-Jin Yeh
,
Sally Liu
2009
Corpus ID: 59498788
In the recent years, de-embedding method of \open-short", and \open-thru" with dummy DUTs are mostly used for on-wafer devices…
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2009
2009
FPGA-in-the-loop-simulations for dynamically reconfigurable applications
C. Paiz
,
C. Pohl
,
R. Radkowski
,
J. Hagemeyer
,
Mario Porrmann
,
U. Ruckert
International Conference on Field-Programmable…
2009
Corpus ID: 31165205
This contribution presents a hardware-in-the-loop (HiL) design environment for FPGA-based systems. The presented tool-flow…
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2008
2008
Increasing Test Granularity by Aggregating Unit Tests
M. Jorde
,
S. Elbaum
,
Matthew B. Dwyer
23rd IEEE/ACM International Conference on…
2008
Corpus ID: 17613261
Unit tests are focused, efficient, and there are many techniques to support their automatic generation. Coarser granularity tests…
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2008
2008
Ring oscillator circuit structures for measurement of isolated NBTI/PBTI effects
Jae-Joon Kim
,
R. Rao
,
S. Mukhopadhyay
,
C. Chuang
IEEE International Conference on Integrated…
2008
Corpus ID: 18462663
Simple ring-oscillator circuit has been used to estimate the degradation in circuit performance due to negative bias temperature…
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Review
2007
Review
2007
Improved Static Testing of A/D Converters for DC Measurements
A. Di Nisio
,
N. Giaquinto
,
L. Fabbiano
,
G. Cavone
,
M. Savino
IEEE Transactions on Instrumentation and…
2007
Corpus ID: 5738714
A new method is presented for the calibration and the linearity testing of analog-to-digital converters (ADCs) and dc digital…
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2007
2007
Internet-Enabled Calibration: An Analysis of Different Topologies and a Comparison of Two Different Approaches
Å. Sand
,
M. Stevens
,
G. Parkin
IEEE Transactions on Instrumentation and…
2007
Corpus ID: 13483119
This paper discusses different network topologies used in Internet-enabled metrology and calibration and explores and compares…
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2004
2004
RF Testing on a Mixed Signal Tester
Dana Brown
,
J. Ferrario
,
R. Wolf
,
Jing Li
,
Jayendra Bhagat
International Conferce on Test
2004
Corpus ID: 7445275
In this paper, testing of radio frequency (RF) devices with mixed-signal testers is discussed. General purpose automatic test…
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1996
1996
FINAL RESULTS OF THE EU JOULE PROJECTS ~DYNAMIC INFLOW~
J. Schepers
,
H. Snel
1996
Corpus ID: 73585163
Within the European Union JOULE 1 and JOULE 2 programs, two joint research projects were carried out concerning dynamic inflow…
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Highly Cited
1986
Highly Cited
1986
The FIS Electronics Troubleshooting System
F. Pipitone
Computer
1986
Corpus ID: 8090845
n recent years, escalating maintenance costs for electronic equipment and the increasing power of artificial intelligence methods…
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