Skip to search form
Skip to main content
Skip to account menu
Semantic Scholar
Semantic Scholar's Logo
Search 236,451,149 papers from all fields of science
Search
Sign In
Create Free Account
Bead probe technology
Bead probe technology (BPT) is technique used to provide electrical access (called “nodal access”) to printed circuit board (PCB) circuitry for…
Expand
Wikipedia
(opens in a new tab)
Create Alert
Alert
Related topics
Related topics
11 relations
Ball grid array
Boundary scan
Device under test
In-circuit test
Expand
Papers overview
Semantic Scholar uses AI to extract papers important to this topic.
2008
2008
Solder Bead on High Density Interconnect Printed Circuit Board
Brandon Chu
IEEE International Test Conference
2008
Corpus ID: 42922586
Solder bead probing is a test technology primarily targeting high-speed/high-density printed circuit boards (PCBs). High Density…
Expand
2007
2007
Implementing bead probe technology for in-circuit test: A case study
M. Farrell
,
Glen Leinbach
IEEE International Test Conference
2007
Corpus ID: 1185821
A major OEM implements bead probe technology on a new design to gain test access and coverage of high-speed circuits…
Expand