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Bead probe technology

Bead probe technology (BPT) is technique used to provide electrical access (called “nodal access”) to printed circuit board (PCB) circuitry for… 
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Ball grid arrayBoundary scanDevice under testIn-circuit test

Papers overview

Semantic Scholar uses AI to extract papers important to this topic.
2013
2013
Implementing Robust Bead Probe Test Processes into Standard Pb-Free Assembly
Increasing system integration and component densities continue to significantly reduce the opportunity to access nets using… 
2008
2008
Solder Bead on High Density Interconnect Printed Circuit Board
  • Brandon Chu
  • IEEE International Test Conference
  • 2008
  • Corpus ID: 42922586
Solder bead probing is a test technology primarily targeting high-speed/high-density printed circuit boards (PCBs). High Density… 
2007
2007
Implementing bead probe technology for in-circuit test: A case study
A major OEM implements bead probe technology on a new design to gain test access and coverage of high-speed circuits… 
2007
2007
A bead probe CAD strategy for in-circuit test
Bead Probe Technology has been developed as alternative In-Circuit Test (ICT) contact points replacing conventional test pads… 
2005
2005
Bead probes in practice
  • K. Parker
  • IEEE International Conference on Test, .
  • 2005
  • Corpus ID: 13550186
Bead probes, a technology for in-circuit test probing of high-speed and/or high-density printed circuit boards was introduced at… 
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