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Chemical-mechanical planarization
Known as:
CMP
, Chemical mechanical planarisation
, Chemical mechanical polish
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Chemical mechanical polishing/planarization is a process of smoothing surfaces with the combination of chemical and mechanical forces. It can be…
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Related topics
Related topics
16 relations
Back end of line
Copper interconnect
Etching (microfabrication)
Front end of line
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Papers overview
Semantic Scholar uses AI to extract papers important to this topic.
2006
2006
Treatment of Chemical-Mechanical Planarization Wastes by Electrocoagulation/Electro-
K. Kin
,
Hongli Tang
,
Shu-Fei Chan
,
S. Raghavan
,
S. Martínez
2006
Corpus ID: 97484980
A method for the treatment of chemical-mechanical planaarization wastewater that utilizes the principles of electroco- agulation…
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2005
2005
Preparation of silica nanospheres : Effect of silicon alkoxide and alcohol on silica nanospheres
D. Yun
,
Hyunjung Kim
,
J. Yoo
2005
Corpus ID: 94491176
Special attention has recently been paid to methods for controlling the nanospheres' size and distribution, because they exhibit…
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2005
2005
Flat, cheap, and under control [electrochemical mechanical planarization]
A.S. Brown
IEEE spectrum
2005
Corpus ID: 10796352
This paper describes Applied Material's wafer polishing technology, called electrochemical mechanical planarization (ECMP). ECMP…
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2005
2005
Modeling of dielectric erosion and copper dishing in copper chemical-mechanical polishing
K. Noh
2005
Corpus ID: 136711443
2003
2003
Axiomatic system design : chemical mechanical polishing machine case study
J. Melvin
2003
Corpus ID: 106436890
Axiomatic design is investigated as a design methodology for large or complex system design. Particular considerations of system…
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2002
2002
Modeling of chemical mechanical polishing for shallow trench isolation
Brian Lee
2002
Corpus ID: 37849869
Chemical mechanical polishing (CMP) is a key process enabling shallow trench isolation (STI), which is used in current integrated…
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2001
2001
MODELING OF PATTERN DEPENDENCIES FOR MULTI-LEVEL COPPER CHEMICAL-MECHANICAL POLISHING PROCESSES
T. Tugbawa
,
T. Park
,
Brian Lee
,
D. Boning
2001
Corpus ID: 15338078
We propose an integrated contact mechanics and density-step-height model of pattern dependencies for the chemical-mechanical…
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2000
2000
USING SMART DUMMY FILL AND SELECTIVE REVERSE ETCHBACK FOR PATTERN DENSITY EQUALIZATION
Brian Lee
,
D. Boning
,
D. Hetherington
,
D. Stein
2000
Corpus ID: 10673553
The techniques of dummy fill and reverse etchback are often used prior to a chemical mechanical polishing (CMP) process to…
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2000
2000
Mechanical interactions at the interface of chemical mechanical polishing
Lei Shan
2000
Corpus ID: 133625498
1994
1994
Planarisation of spatial light modulator silicon backplanes using chemical-mechanical polishing
A. O'hara
,
I. Underwood
,
D. Vass
1994
Corpus ID: 136360882