Skip to search form
Skip to main content
Skip to account menu
Semantic Scholar
Semantic Scholar's Logo
Search 218,266,909 papers from all fields of science
Search
Sign In
Create Free Account
Vendor serial number:ID:Pt:Subarachnoid drain:Nom
Known as:
Rivenditore, numero di serie:ID:Pt:Drenaggio subaracnoideo:Nom
, Vendor serial number:Identifier:Point in time:Subarachnoid drain:Nominal
, número de serie del distribuidor:intradérmico:punto en el tiempo:drenaje subaracnoideo:Nominal:
Expand
National Institutes of Health
Create Alert
Alert
Related topics
Related topics
4 relations
Drain device
Identifier
Nom
Numbers
Papers overview
Semantic Scholar uses AI to extract papers important to this topic.
2017
2017
Subperiosteal Drainage versus Subdural Drainage in the management of Chronic Subdural Hematoma (A Comparative Study).
A. Chih
,
Albert Wong Sii Hieng
,
N. A. A. Rahman
,
J. Abdullah
Malaysian Journal of Medical Sciences
2017
Corpus ID: 24281163
INTRODUCTION Symptomatic chronic subdural hematomas (CSDH) remain one of the most frequent diagnoses in current neurosurgical…
Expand
2015
2015
Leak or Fistula After Sleeve Gastrectomy: Treatment with Pigtail Drain by the Rendezvous Technique
J. Soufron
Obesity Surgery
2015
Corpus ID: 45888004
After a sleeve gastrectomy, a leak or fistula is a serious complication. Laparoscopic drainage, drainage under US or CT scan…
Expand
2014
2014
Performance Enhancement of Flip-Chip Packaged AlGaN/GaN HEMTs Using Active-Region Bumps-Induced Piezoelectric Effect
Szu-Ping Tsai
,
H. Hsu
,
+6 authors
E. Chang
IEEE Electron Device Letters
2014
Corpus ID: 20726769
We experimentally investigated the impact of different bump patterns on the output electrical characteristics of flip-chip (FC…
Expand
2014
2014
InGaAs MOSFETs with InP drain
Jiongjiong Mo
,
E. Lind
,
L. Wernersson
Device Research Conference
2014
Corpus ID: 45896251
InGaAs MOSFETs may find usage in both digital and analogue applications. While most efforts so far have focused on digital…
Expand
Highly Cited
2012
Highly Cited
2012
Time- and Field-Dependent Trapping in GaN-Based Enhancement-Mode Transistors With p-Gate
M. Meneghini
,
C. de Santi
,
+4 authors
G. Meneghesso
IEEE Electron Device Letters
2012
Corpus ID: 29671634
This letter describes an extensive analysis of the time- and field-dependent trapping processes that occur in GaN-based gate…
Expand
Highly Cited
2012
Highly Cited
2012
Assessment of Ambipolar Behavior of a Tunnel FET and Influence of Structural Modifications
R. Narang
,
M. Saxena
,
R. Gupta
,
Mridula Gupta
2012
Corpus ID: 55354860
In the present work, comprehensive investigation of the ambipolar characteristics of two silicon (Si) tunnel field-effect…
Expand
2010
2010
Schottky-Ohmic Drain AlGaN/GaN Normally Off HEMT With Reverse Drain Blocking Capability
Chunhua Zhou
,
W. Chen
,
E. Piner
,
K. J. Chen
IEEE Electron Device Letters
2010
Corpus ID: 29281615
In this letter, we propose an AlGaN/GaN normally off high-electron mobility transistor (HEMT) with reverse drain blocking…
Expand
1987
1987
An analytic I—V model for lightly doped drain (LDD) MOSFET devices
Gwo-Sheng Huang
,
Ching-Yuan Wu
IEEE Transactions on Electron Devices
1987
Corpus ID: 29098325
An analytic I-V model for lightly doped drain (LDD) MOSFET devices is presented. In this model, the n-region is considered to be…
Expand
1985
1985
An analytical one-dimensional model for lightly doped drain (LDD) MOSFET devices
Fang-Shi J. Lai
,
J. Sun
IEEE Transactions on Electron Devices
1985
Corpus ID: 43533966
An analytic one-dimensional model for lightly doped drain (LDD) MOSFET devices is presented. This model decomposes the LDD device…
Expand
Highly Cited
1980
Highly Cited
1980
Design and characteristics of the lightly doped drain-source (LDD) insulated gate field-effect transistor
S. Ogura
,
Paul J. Tsang
,
W. W. Walker
,
D. Critchlow
,
J. F. Shepard
IEEE Transactions on Electron Devices
1980
Corpus ID: 27514197
The LDD structure, where narrow, self-aligned n-regions are introduced between the channel and the n+source-drain diffusions of…
Expand
By clicking accept or continuing to use the site, you agree to the terms outlined in our
Privacy Policy
(opens in a new tab)
,
Terms of Service
(opens in a new tab)
, and
Dataset License
(opens in a new tab)
ACCEPT & CONTINUE