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Transmission line measurement

Known as: TLM 
Transmission line measurement or Transfer Length Measurement is a technique used in semiconductor physics and engineering to determine the contact… Expand
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Papers overview

Semantic Scholar uses AI to extract papers important to this topic.
2017
2017
This paper reports on the analysis and comparison of mechanical and laser patterning in the fabrication of perovskite thin-film… Expand
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2014
2014
We describe the design, fabrication and results of passivated contacts to n-type silicon utilizing thin SiO<sub>2</sub> and… Expand
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2012
2012
We have synthesized ferrite-polymer nanocomposite struc- tures and theoretically and experimentally investigated electromag… Expand
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2012
2012
Electromagnetic compatibility-oriented study is performed for accurately characterizing through silicon single-walled carbon… Expand
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Highly Cited
2010
Highly Cited
2010
A procedure for the optimal design of thin wideband radar absorbers is presented. The resulting absorbers are implemented by… Expand
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2007
2007
This paper analyzes the high-temperature long-term stability of ohmic contacts on p-type gallium nitride (p-GaN). The… Expand
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Highly Cited
2006
Highly Cited
2006
The dielectric parameters of the tissue simulating liquids to assess the exposure from mobile phones were determined in a… Expand
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2006
2006
GaN nanowire field-effect transistors were fabricated using single-crystalline GaN nanowires synthesized by thermal evaporation… Expand
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Highly Cited
2006
Highly Cited
2006
A transmission line method is proposed to compute the far-field radiation patterns of arbitrarily directed Hertzian dipoles that… Expand
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Highly Cited
2005
Highly Cited
2005
The problem of homogenization, i.e. substantial reduction of the electrical size of the average lattice constant, of… Expand
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