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Transmission line measurement

Known as: TLM 
Transmission line measurement or Transfer Length Measurement is a technique used in semiconductor physics and engineering to determine the contact… Expand
Wikipedia

Papers overview

Semantic Scholar uses AI to extract papers important to this topic.
2017
2017
This paper reports on the analysis and comparison of mechanical and laser patterning in the fabrication of perovskite thin-film… Expand
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2017
2017
A broadband absorber in the infrared wavelength range from 1 μm up to 5 μm is designed and demonstrated with stacked double… Expand
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Highly Cited
2016
Highly Cited
2016
Abstract Low-voltage organic thin-film transistors (TFTs) based on four different small-molecule semiconductors (pentacene, DNTT… Expand
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2014
2014
We describe the design, fabrication and results of passivated contacts to n-type silicon utilizing thin SiO<sub>2</sub> and… Expand
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2012
2012
We have synthesized ferrite-polymer nanocomposite struc- tures and theoretically and experimentally investigated electromag… Expand
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2007
2007
This paper analyzes the high-temperature long-term stability of ohmic contacts on p-type gallium nitride (p-GaN). The… Expand
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2007
2007
The shielding effectiveness of aperture arrays with different shapes is calculated and analyzed. The influence of the spaces… Expand
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2007
2007
A new method to improve the gain of monopole and patch antenna with one dimension and two dimension metamaterial structures is… Expand
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Highly Cited
2006
Highly Cited
2006
The dielectric parameters of the tissue simulating liquids to assess the exposure from mobile phones were determined in a… Expand
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2006
2006
GaN nanowire field-effect transistors were fabricated using single-crystalline GaN nanowires synthesized by thermal evaporation… Expand
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