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Transmission line measurement

Known as: TLM 
Transmission line measurement or Transfer Length Measurement is a technique used in semiconductor physics and engineering to determine the contact… 
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Papers overview

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2015
2015
Along with the miniaturization of mobile terminals, antenna miniaturization is the trend of the development, because of its small… 
2014
2014
Metal-semiconductor contact resistances are important for many semiconductor devices. They are often determined with the… 
2012
2012
We have synthesized ferrite-polymer nanocomposite struc- tures and theoretically and experimentally investigated electromag… 
2010
2010
Reflective (thick) and semi-transparent (thin) Ni/Ag/Ni contacts were prepared on GaInN-based light-emitting diodes (LEDs) and p… 
2009
2009
In this paper, we analyzed electrical characteristics of amorphous indium-gallium-zinc-oxide (a-IGZO) thin-film transistor (TFT… 
2007
2007
The shielding effectiveness of aperture arrays with different shapes is calculated and analyzed. The influence of the spaces… 
2007
2007
We propose a novel method for extracting the electromagnetic parameters (complex permittivity and permeability) of magnetic thin… 
2006
2006
GaN nanowire field-effect transistors were fabricated using single-crystalline GaN nanowires synthesized by thermal evaporation… 
Highly Cited
2006
Highly Cited
2006
A transmission line method is proposed to compute the far-field radiation patterns of arbitrarily directed Hertzian dipoles that… 
2006
2006
We studied phase composition and parameters of the ohmic Au-TiB x-Al-Ti-n-GaN and barrier Au-TiBx-n-GaN contacts, both before and…