Skip to search formSkip to main contentSkip to account menu

Software testability

Software testability is the degree to which a software artifact (i.e. a software system, software module, requirements- or design document) supports… 
Wikipedia (opens in a new tab)

Related topics

Related topics

10 relations
Finite-state machineMatthew HennessyNon-functional requirementPortability testing

Papers overview

Semantic Scholar uses AI to extract papers important to this topic.
Highly Cited
2016
Highly Cited
2016
A Markov Chain-Based Testability Growth Model With a Cost-Benefit Function
In this paper, we propose a Markov chain-based testability growth model (TGM) for the just in-time fix program. This model can… 
Highly Cited
2006
Highly Cited
2006
Design for Testability
Highly Cited
1999
Highly Cited
1999
A Programmable BIST Core for Embedded DRAM
The programmable BIST design presented here supports various test modes using a simple controller. With the March C algorithm… 
Highly Cited
1995
Highly Cited
1995
The Time-Triggered Approach to Real-Time System Design
In this paper the basic assumptions that govern the design of timetriggered(TT) real-time systems are examined and the… 
Highly Cited
1994
Highly Cited
1994
Microarchitectural Synthesis of VLSI Designs with High Test Concurrency
The testability of a VLSI design is strongly affected by its register-transfer level (RTL) structure. Since the high-level… 
1994
1994
Retiming sequential circuits to enhance testability
This paper presents a technique to enhance the testability of sequential circuits by repositioning registers. A novel retiming… 
Highly Cited
1990
Highly Cited
1990
An optimization based approach to the partial scan design problem
The problem of selecting flip-flops for inclusion into a partial scan path is formulated as an optimization problem. Scan flip… 
Highly Cited
1989
Highly Cited
1989
A synthesis and optimization procedure for fully and easily testable sequential machines
The authors outline a synthesis procedure which beginning from a state transition graph (STG) description of a sequential machine… 
Highly Cited
1987
Highly Cited
1987
Designing CMOS Circuits for Switch-Level Testability
Conventional testing techniques often fail to be effective for CMOS combinational circuits, since most of their switch-level… 
Highly Cited
1981
Highly Cited
1981
Node-fault diagnosis and a design of testability
A concept of k-node-fault testability is introduced. A sufficient and almost necessary condition for testability as well as the… 
By clicking accept or continuing to use the site, you agree to the terms outlined in our Privacy Policy (opens in a new tab), Terms of Service (opens in a new tab), and Dataset License (opens in a new tab)