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Software testability
Software testability is the degree to which a software artifact (i.e. a software system, software module, requirements- or design document) supports…
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Related topics
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10 relations
Finite-state machine
Matthew Hennessy
Non-functional requirement
Portability testing
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Papers overview
Semantic Scholar uses AI to extract papers important to this topic.
Highly Cited
2006
Highly Cited
2006
Design for Testability
Laung-Terng Wang
,
X. Wen
,
Khader S. Abdel-Hafez
2006
Corpus ID: 60079306
Highly Cited
1999
Highly Cited
1999
POWERTEST: a tool for energy conscious weighted random pattern testing
Xiaodong Zhang
,
K. Roy
,
S. Bhawmik
Proceedings Twelfth International Conference on…
1999
Corpus ID: 33487046
Due to the increasing use of portable computing and wireless communications systems, energy consumption is of major concern in…
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Highly Cited
1995
Highly Cited
1995
The Time-Triggered Approach to Real-Time System Design
H. Kopetz
1995
Corpus ID: 60928373
In this paper the basic assumptions that govern the design of timetriggered(TT) real-time systems are examined and the…
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1994
1994
Behavioral synthesis for hierarchical testability of controller/data path circuits with conditional branches
S. Bhatia
,
N. Jha
Proceedings IEEE International Conference on…
1994
Corpus ID: 5556229
Most existing behavioral synthesis systems put emphasis on optimizing area and performance. Only recently has some research been…
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1994
1994
Retiming sequential circuits to enhance testability
S. Dey
,
S. Chakradhar
Proceedings of the ... IEEE VLSI Test Symposium
1994
Corpus ID: 7181041
This paper presents a technique to enhance the testability of sequential circuits by repositioning registers. A novel retiming…
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Highly Cited
1994
Highly Cited
1994
Microarchitectural Synthesis of VLSI Designs with High Test Concurrency
I. Harris
,
A. Orailoglu
Design Automation Conference
1994
Corpus ID: 5969484
The testability of a VLSI design is strongly affected by its register-transfer level (RTL) structure. Since the high-level…
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Highly Cited
1990
Highly Cited
1990
An optimization based approach to the partial scan design problem
V. Chickermane
,
J. Patel
Proceedings. International Test Conference
1990
Corpus ID: 206676543
The problem of selecting flip-flops for inclusion into a partial scan path is formulated as an optimization problem. Scan flip…
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Highly Cited
1989
Highly Cited
1989
A synthesis and optimization procedure for fully and easily testable sequential machines
S. Devadas
,
Hi-Keung Tony Ma
,
A. Newton
,
A. Sangiovanni-Vincentelli
IEEE Trans. Comput. Aided Des. Integr. Circuits…
1989
Corpus ID: 8016006
The authors outline a synthesis procedure which beginning from a state transition graph (STG) description of a sequential machine…
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Highly Cited
1987
Highly Cited
1987
Designing CMOS Circuits for Switch-Level Testability
Dick L. Liu
,
E. McCluskey
IEEE Design & Test of Computers
1987
Corpus ID: 16747660
Conventional testing techniques often fail to be effective for CMOS combinational circuits, since most of their switch-level…
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Highly Cited
1981
Highly Cited
1981
Node-fault diagnosis and a design of testability
Huang Zheng
,
Raymond Liu
,
Chi-Cheng Steve Lin
20th IEEE Conference on Decision and Control…
1981
Corpus ID: 21169002
A concept of k-node-fault testability is introduced. A sufficient and almost necessary condition for testability as well as the…
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