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Soft error

Known as: Critical charge, Soft Error Rate, Ser 
In electronics and computing, a soft error is a type of error where a signal or datum is wrong. Errors may be caused by a defect, usually understood… 
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Related topics

Related topics

35 relations
1T-SRAMBorophosphosilicate glassCombinational logicCrash (computing)

Broader (3)

Computer memoryData qualityDigital electronics

Papers overview

Semantic Scholar uses AI to extract papers important to this topic.
2011
2011
RAFT: A router architecture with frequency tuning for on-chip networks
2011
2011
Heliumlike and lithiumlike ionic sequences: Critical charges
In nonrelativistic quantum mechanics we study the Coulomb systems of infinitely massive center of charge Z and two-three… 
2011
2011
The Effects of Neutron Energy and High-Z Materials on Single Event Upsets and Multiple Cell Upsets
Neutron-induced charge collection data and computer simulations presented here show that the presence of high-Z materials, like… 
2007
2007
Critical charge dynamics of superconducting LSCO thin films probed by complex microwave spectroscopy: Anomalous changes of the universality class by hole doping
We study the critical charge dynamics of the superconducting to the normal-state transition for LSCO thin films with a wide range… 
2005
2005
Neutron and proton-induced single event upsets in advanced commercial fully depleted SOI SRAMs
The SEU sensitivity of 0.2 /spl mu/m fully depleted silicon on ensulator (FD-SOI) devices to proton and neutron irradiations is… 
1986
1986
An Improved Single Event Resistive-Hardening Technique for CMOS Static RAMS
A technique that will improve RAM cell performance while maintaining single event upset immunity has been identified. The… 
Highly Cited
1984
Highly Cited
1984
Neutron Generated Single-Event Upsets in the Atmosphere
Heavy cosmic ray nuclei are mostly attenuated with a shielding of 50 g/cm2 atmospheric gas. However, the shielding acts as a… 
Highly Cited
1979
Highly Cited
1979
Soft Errors Induced by Energetic Protons
Two types of 4K dynamic RAM devices have been shown to exhibit soft errors when exposed to energetic protons. Considerable… 
1974
1974
Precise Values for Critical Fields in Quantum Electrodynamics
A careful investigation of different corrections to binding energies of electrons in almost critical fields is performed. We… 
1968
1968
Plains Pricklypear: Relation to Grazing Intensity and Blue Grama Yield on Central Great Plains.
Although the food items, common dandelion, goatsbeard, and prickly lettuce (Lactuca serriola), are introduced weeds, all the… 
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