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Soft error
Known as:
Critical charge
, Soft Error Rate
, Ser
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In electronics and computing, a soft error is a type of error where a signal or datum is wrong. Errors may be caused by a defect, usually understood…
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Related topics
Related topics
35 relations
1T-SRAM
Borophosphosilicate glass
Combinational logic
Crash (computing)
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Broader (3)
Computer memory
Data quality
Digital electronics
Papers overview
Semantic Scholar uses AI to extract papers important to this topic.
2016
2016
Crecimiento psicológico y motivaciones sociales
Oswaldo Romero García
2016
Corpus ID: 151938276
Articulo publicado en octubre de 1994. Se presenta un modelo de crecimiento psicologico y una nueva conceptualizacion de las…
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2010
2010
Effect of topology on the critical charge in graphene
Baishali Chakraborty
,
K. S. Gupta
,
S. Sen
2010
Corpus ID: 119612556
Trinity College, Dublin, Ireland(Dated: November 19, 2010)We show that the critical charge for the Dirac excitations in gapless…
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2007
2007
Soft Error Rates in 65nm SRAMs--Analysis of new Phenomena
Franz X. Ruckerbauer
,
G. Georgakos
IEEE International Symposium on On-Line Testing…
2007
Corpus ID: 27445189
Soft error rates measured on embedded SRAMs in a 65 nm CMOS technology show a significant increase of the error rate induced by…
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2007
2007
Critical charge dynamics of superconducting LSCO thin films probed by complex microwave spectroscopy: Anomalous changes of the universality class by hole doping
T. Ohashi
,
H. Kitano
,
Ichiro Tsukada
,
A. Maeda
2007
Corpus ID: 118550615
We study the critical charge dynamics of the superconducting to the normal-state transition for LSCO thin films with a wide range…
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2001
2001
Stallaert, Christiane. Etnogénesis y etnicidad en España: Una aproximación histórico-antropológica al casticismo, Barcelona: Proyecto A Ediciones, 1998
Miguel Alfredo Carid Naveira
2001
Corpus ID: 180755696
O livro, cujo assunto central é bem resumido em seu titulo, aborda problemáticas que, se nos parecem gozar na atualidade de uma…
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1999
1999
Single Event Effects in Static and Dynamic Registers in a 0 . 25 μ m CMOS Technology
F. Faccio
,
K. Kloukinas
,
+4 authors
R. Velazco
1999
Corpus ID: 11007172
We have studied Single Event Effects in static and dynamic registers designed in a quarter micron CMOS process. In our design, we…
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1999
1999
A comparative simulation study of four multilevel DRAMs
G. Birk
,
D. Elliott
,
B. Cockburn
Records of the IEEE International Workshop on…
1999
Corpus ID: 18165056
Multilevel DRAM (MLDRAM) attempts to increase storage density by recording more than one bit per cell. Several different two-bit…
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1998
1998
Design for soft-error robustness to rescue deep submicron scaling
M. Nicolaidis
Proceedings International Test Conference (IEEE…
1998
Corpus ID: 39730954
Error detecting and correcting code based memory design, self-checking design, VLSI-level retry architectures, perturbation…
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1987
1987
Influences on soft error rates in static RAMs
P. M. Carter
,
B. R. Wilkins
1987
Corpus ID: 62671908
Alpha-particle-induced soft error rates (SERs) in RAMs were measured by exposing commercial chips, with lid and protective…
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1968
1968
Plains Pricklypear: Relation to Grazing Intensity and Blue Grama Yield on Central Great Plains.
R. E. Bement
1968
Corpus ID: 88747983
Although the food items, common dandelion, goatsbeard, and prickly lettuce (Lactuca serriola), are introduced weeds, all the…
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