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Single event upset

Known as: Single event upsets, SEU, Single-event upset 
A single event upset (SEU) is a change of state caused by one single ionizing particle (ions, electrons, photons...) striking a sensitive node in a… 
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Related topics

Related topics

30 relations
Beetle (ASIC)Borophosphosilicate glassDynamic random-access memoryECC memory

Broader (1)

Digital electronics

Papers overview

Semantic Scholar uses AI to extract papers important to this topic.
2010
2010
Single Event Upset and Multiple Cell Upset Modeling in Commercial Bulk 65-nm CMOS SRAMs and Flip-Flops
A proprietary Monte-Carlo simulation code dedicated to heavy ion cross-section prediction has been developed. The code is based… 
Highly Cited
2009
Highly Cited
2009
Single event upset and multiple cell upset modeling in commercial bulk 65 nm CMOS SRAMs and flip-flops
A new proprietary Monte-Carlo simulation code dedicated to the heavy-ion cross-section prediction has been developed. The code is… 
2008
2008
Modeling single event upsets in Floating Gate memory cells
We model soft errors in Floating Gate (FG) memory cells due to charge loss after single radiation particle strikes. In contrast… 
2007
2007
Single Event Upset Detection and Correction
This paper proposes a low cost solution to detect and correct a transient faults in registers of a design. The proposed method… 
Highly Cited
2005
Highly Cited
2005
IBM z990 soft error detection and recovery
Soft errors in logic are becoming more significant in the design of computer systems due to increased sensitivities of latches… 
Highly Cited
2005
Highly Cited
2005
An analytical approach for soft error rate estimation in digital circuits
Soft errors due to cosmic rays cause reliability problems during lifetime operation of digital systems, which increase… 
1987
1987
Single Event Upset in SOS Integrated Circuits
Single event upset (SEU) by argon and krypton ions has been observed in 1.25 micron CMOS-SOS integrated circuits. Mixed-mode… 
1984
1984
Single Event Upset Testing with Relativistic Heavy Ions
Two bipolar devices, the AMD 2901B microprocessor and the AMD 27LS00 256-bit RAM, have been tested for single event upset using… 
Highly Cited
1984
Highly Cited
1984
Neutron Generated Single-Event Upsets in the Atmosphere
Heavy cosmic ray nuclei are mostly attenuated with a shielding of 50 g/cm2 atmospheric gas. However, the shielding acts as a… 
1983
1983
Single Event Upset Measurements of Gaas E-JFET RAMS
This paper reports the first single event upset measurements on a GaAs RAM. These measurements on fully operational 256-bit GaAs… 
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