Single event upset

Known as: Single event upsets, SEU, Single-event upset 
A single event upset (SEU) is a change of state caused by one single ionizing particle (ions, electrons, photons...) striking a sensitive node in a… (More)
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Papers overview

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Highly Cited
2008
Highly Cited
2008
Experimental results are presented on proton induced single-event-upsets (SEU) on a 65 nm silicon-on-insulator (SOI) SRAM. The… (More)
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Review
2008
Review
2008
With the continuous downscaling of CMOS technologies, the reliability has become a major bottleneck in the evolution of the next… (More)
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Highly Cited
2007
Highly Cited
2007
SRAM based reprogrammable FPGAs are sensitive to radiation-induced single event upsets (SEU), not only in their user flip-flops… (More)
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Highly Cited
2004
Highly Cited
2004
We present a design technique for hardening combinational circuits mapped onto Xilinx Virtex FPGAs against single-event upsets… (More)
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Highly Cited
2004
Highly Cited
2004
Radiation-induced single event upsets (SEUs) pose a major challenge for the design of memories and logic circuits in high… (More)
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1998
1998
Single-event upset is investigated for optocouplers using heavy ions. The threshold LET for optocouplers with internal high-gain… (More)
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1997
1997
Although hardened memories continue to be available for space applications, the need for large amounts of memory, lower cost, and… (More)
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Highly Cited
1996
Highly Cited
1996
Ground level upsets have been observed in computer systems containing large amounts of random access memory (RAM). Atmospheric… (More)
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1984
1984
Two bipolar devices, the AMD 2901B microprocessor and the AMD 27LS00 256-bit RAM, have been tested for single event upset using… (More)
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1983
1983
This paper examines a number of concepts that are connected, directly or indirectly, with the problem of assigning a single event… (More)
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