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Single event upset

Known as: Single event upsets, SEU, Single-event upset 
A single event upset (SEU) is a change of state caused by one single ionizing particle (ions, electrons, photons...) striking a sensitive node in a… 
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Related topics

Related topics

30 relations
Beetle (ASIC)Borophosphosilicate glassDynamic random-access memoryECC memory

Broader (1)

Digital electronics

Papers overview

Semantic Scholar uses AI to extract papers important to this topic.
2015
2015
Mitigating Single-Event Upsets
www.xilinx.com 1 © Copyright 2012 Xilinx, Inc. Xilinx, the Xilinx logo, Artix, ISE, Kintex, Spartan, Virtex, Zynq, and other… 
Highly Cited
2009
Highly Cited
2009
Single event upset and multiple cell upset modeling in commercial bulk 65 nm CMOS SRAMs and flip-flops
A new proprietary Monte-Carlo simulation code dedicated to the heavy-ion cross-section prediction has been developed. The code is… 
2008
2008
Single event upset modeling with nuclear reactions in nanoscale electronics
In modern nano-scale technologies, circuits are increasingly sensitive to various kinds of perturbations. Soft errors, a concern… 
2007
2007
Single Event Upset Detection and Correction
This paper proposes a low cost solution to detect and correct a transient faults in registers of a design. The proposed method… 
Highly Cited
2007
Highly Cited
2007
Multiple-Bit Upset Analysis in 90 nm SRAMs: Heavy Ions Testing and 3D Simulations
SEU and MBU cross-sections are measured with heavy ions for commercial 90 nm single port and dual port SRAMs. SEU and MBU rates… 
Highly Cited
2005
Highly Cited
2005
Fault tolerant solid state mass memory for space applications
In this paper, an innovative fault tolerant solid state mass memory (FTSSMM) architecture is described. Solid state mass memories… 
Highly Cited
2004
Highly Cited
2004
A pulsão romântica e as ciências humanas no ocidente
A cultura ocidental moderna articula-se em torno da tensao entre um universalismo primordial e o seu constante contraponto rom… 
1984
1984
Single Event Upset Testing with Relativistic Heavy Ions
Two bipolar devices, the AMD 2901B microprocessor and the AMD 27LS00 256-bit RAM, have been tested for single event upset using… 
Highly Cited
1984
Highly Cited
1984
Neutron Generated Single-Event Upsets in the Atmosphere
Heavy cosmic ray nuclei are mostly attenuated with a shielding of 50 g/cm2 atmospheric gas. However, the shielding acts as a… 
1981
1981
Single Event Upsets in NMOS Microprocessors
Three advanced 16-bit NMOS microprocessors have been observed to suffer single event upset at a rate varying between one upset… 
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