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Single event upset
Known as:
Single event upsets
, SEU
, Single-event upset
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A single event upset (SEU) is a change of state caused by one single ionizing particle (ions, electrons, photons...) striking a sensitive node in a…
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Related topics
Related topics
30 relations
Beetle (ASIC)
Borophosphosilicate glass
Dynamic random-access memory
ECC memory
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Broader (1)
Digital electronics
Papers overview
Semantic Scholar uses AI to extract papers important to this topic.
2015
2015
Mitigating Single-Event Upsets
Jameel Hussein
,
G. Swift
2015
Corpus ID: 10618597
www.xilinx.com 1 © Copyright 2012 Xilinx, Inc. Xilinx, the Xilinx logo, Artix, ISE, Kintex, Spartan, Virtex, Zynq, and other…
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2010
2010
Acciones judiciales: estrategia de la industria farmacéutica para introducción de nuevos medicamentos
Ana Luiza Chieffi
,
R. Barata
2010
Corpus ID: 208196291
OBJETIVO: Analisar a concentracao na distribuicao dos processos judiciais segundo medicamento (fabricante), medico prescritor e…
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2007
2007
Produção de Serapilheira na Caatinga da Floresta Nacional do Açú-RN
Caio César de Medeiros Costa
,
I. M. Dantas
,
Ramiro Gustavo Valera Camacho
,
A. M. Souza
,
N. Silva
2007
Corpus ID: 83536757
A serapilheira compreende a camada mais superficial em ambientes florestais, sendo formada por folhas, ramos, órgãos reprodutivos…
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Highly Cited
2005
Highly Cited
2005
Fault tolerant solid state mass memory for space applications
G. Cardarilli
,
M. Ottavi
,
S. Pontarelli
,
M. Re
,
A. Salsano
IEEE Transactions on Aerospace and Electronic…
2005
Corpus ID: 10967208
In this paper, an innovative fault tolerant solid state mass memory (FTSSMM) architecture is described. Solid state mass memories…
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Review
2005
Review
2005
How to cope with SEU/SET at system level?
M. Pignol
11th IEEE International On-Line Testing Symposium
2005
Corpus ID: 1696217
When using electronic commercial components for developing embedded computers dedicated to hard real-time applications…
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2003
2003
A tool for injecting SEU-like faults into the configuration control mechanism of Xilinx Virtex FPGAs
M. Alderighi
,
F. Casini
,
+4 authors
G. Sechi
Proceedings 18th IEEE Symposium on Defect and…
2003
Corpus ID: 39786561
A fault injection tool for Virtex FPGAs based on the fault emulation technique is presented. It allows injection of faults in the…
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1999
1999
Probabilistic Estimates of Upset Caused by Single Event Transients
Joel Hass
1999
Corpus ID: 16011225
Abstract – Single event transients occur when cosmic particles strike nodes in a logic network. Transients may propagate to a…
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1994
1994
Single event effects in analog-to-digital converters: device performance and system impact
T. Turflinger
,
M. Davey
,
B. Mappes
1994
Corpus ID: 109487955
Monolithic analog-to-digital converters (ADCs) exhibit a large error rate in the single event effects (SEE) environment. Analysis…
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1988
1988
Empirical Modeling Of Single-Event Upset
J. Zoutendyk
,
L. S. Smith
,
G. Soli
,
P. Thieberger
,
Stephen L. Smith
,
G. Atwood
1988
Corpus ID: 60294964
Experimental study presents examples of empirical modeling of single-event upset in negatively-doped-source/drain metal-oxide…
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1981
1981
Bibliorum Sacrorum latinae versiones antiquae, seu vetus italica, et caeterae quaecunque in codicibus mass. & antiquorum libris reperiri potuerunt : quae cum Vulgata latina, & cum textu graeco…
Petri Sabatier
1981
Corpus ID: 107114521