Single Event Upset Detection and Correction

@article{Singh2007SingleEU,
  title={Single Event Upset Detection and Correction},
  author={Jawar Singh and Jimson Mathew and Mohammad Hosseinabady and Dhiraj K. Pradhan},
  journal={10th International Conference on Information Technology (ICIT 2007)},
  year={2007},
  pages={13-18}
}
This paper proposes a low cost solution to detect and correct a transient faults in registers of a design. The proposed method realizes a single-event upset detection and correction (SEU-DC) technique. The detection and correction of SEU in registers of a design is difficult and requires some efficient approaches without significant area overhead and timing penalty. Furthermore, the proposed method is based on the traditional parity codes to detect and correct a single-bit error without… CONTINUE READING
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References

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Showing 1-10 of 11 references

Testing of SEU mitigation methods for the Virtex FPGA

  • C. Carmichael, E. Fuler, J. Fabula, J. Lima
  • Proc. Military and Aerospace Applications of…
  • 2001
1 Excerpt

VHDL-based totally selfchecking Finite state machine and datapath description

  • C. Bolchini, R. Mantandan, F. Solice, D.Scito
  • IEEE Transactions On Very Large Scale Integration…
  • 2000
2 Excerpts

Design and Analysis of Fault-Tolerant Digital Systems

  • B. W. Johnson
  • Addison- Wesley Publishing Co,
  • 1989
1 Excerpt

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