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Profiling (information science)

Known as: Population profiling, Profiling, Profiling practices 
In information science, profiling refers to the process of construction and application of profiles generated by computerized data analysis. This… 
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Related topics

Related topics

17 relations
Adaptive hypermediaAmbient intelligenceAutonomic computingCustomer relationship management

Broader (2)

Data miningIdentity management

Papers overview

Semantic Scholar uses AI to extract papers important to this topic.
Review
2019
Review
2019
Profiling tax and financial behaviour with big data under the GDPR
Highly Cited
2016
Highly Cited
2016
An evidential fusion approach for gender profiling
Highly Cited
2015
Highly Cited
2015
Connecting Events in Time to Identify a Hidden Population: Birth Mothers and Their Children in Recurrent Care Proceedings in England
Thereisinternationalconcernaboutthepopulationofbirthmotherswhoexperiencerepeat court-orderedremovalofchildren… 
Highly Cited
2012
Highly Cited
2012
Don't kill my ads!: balancing privacy in an ad-supported mobile application market
Application markets have revolutionized the software download model of mobile phones: third-party application developers offer… 
Review
2012
Review
2012
Invited review Quick and dirty but still pretty good: a review of new descriptive methods in food science
Summary For food scientists and industrials, descriptive profiling is an essential tool that involves the evaluation of both the… 
2007
2007
Enhancing UML Extensions with Operational Semantics
The objective of the ongoing OMG standard about a foundational UML subset semantics (fUML) is twofold: providing operational… 
Review
2000
Review
2000
Historical Foundations and Current Applications of Criminal Profiling in Violent Crime Investigations
In many countries, such as Canada, police have been increasinglyrelying upon some form of criminal profiling to aid in their… 
Highly Cited
1996
Highly Cited
1996
Capacitive effects on quantitative dopant profiling with scanned electrostatic force microscopes
A force‐based scanning Kelvin probe microscope has been applied to the problem of dopant profiling in silicon. Initial data… 
Highly Cited
1992
Highly Cited
1992
Optimally profiling and tracing programs
This paper presents algorithms for inserting monitoring code to profile and trace programs. These algorithms greatly reduce the… 
Highly Cited
1979
Highly Cited
1979
The depth resolution of sputter profiling
It is shown that the bulk radiation damage accompanying sputtering events sets ultimate limits to the depth resolution attainable… 
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